QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
PO74G126A
02/07/07
74 Series GHz Logic
FEATURES:
. Patented technology
. Operating frequency up to 1.125GHz with 2pf load
. Operating frequency up to 700MHz with 5pf load
. Operating frequency up to 400MHz with 15pf load
. VCC Operates from 1.65V to 3.6V
. Propagation delay < 1.5ns max with 15pf load
. Low input capacitance: 4pf typical
. Available in 14pin 150mil wide SOIC package
DESCRIPTION:
Potato Semiconductor’s PO74G126A is designed for
world top performance using submicron CMOS
technology to achieve 1.125GHz TTL /CMOS output
frequency with less than 1.5ns propagation delay.
This quadruple bus buffer gate is designed for 1.65-V
to 3.6-V V
CC
operation.
The
PO74G126A
featuresindependent
linedriverswith3-stateoutputs. Eachoutput isdisabled-
whenthe associatedoutput-enable(OE)input islow.
Inputs can be driven from either 3.3V or 5V devices.
This feature allows the use of these devices as
translators in a mixed 3.3V/5V system environment.
Pin Configuration
1OE
1A
1Y
2OE
2A
2Y
GND
Logic Block Diagram
V
CC
4OE
4A
4Y
2OE
4
5
6
1OE
1A
1
2
3
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1Y
3OE
3A
3Y
3OE
10
9
8
2A
2Y
Pin Description
INPUTS
OE
H
H
L
A
H
L
X
OUTPUT
Y
H
L
Z
3A
3Y
4OE
4A
13
12
11
4Y
1
Copyright
© Potato Semiconductor Corporation
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
PO74G126A
02/07/07
74 Series GHz Logic
Maximum Ratings
Description
Storage Temperature
Operation Temperature
Operation Voltage
Input Voltage
Output Voltage
Max
-65 to 150
-40 to 85
-0.5 to +4.6
-0.5 to +5.5
-0.5 to Vcc+0.5
Unit
°C
°C
V
V
V
Note:
stresses greater than listed under
Maximum
Ratings
may
cause
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
DC Electrical Characteristics
Symbol
Description
Output High voltage
Output Low voltage
Input High voltage
Input Low voltage
Input High current
Input Low current
Clamp diode voltage
Test Conditions
Vcc=3V Vin=V
IH
or V
IL
, I
OH
= -12mA
Vcc=3V Vin=V
IH
or V
IL
, I
OH
=12mA
Guaranteed Logic HIGH Level (Input Pin)
Guaranteed Logic LOW Level (Input Pin)
Vcc = 3.6V and Vin = 5.5V
Vcc = 3.6V and Vin = 0V
Vcc = Min. And
I
IN
= -18mA
Min
Typ
Max
Unit
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
V
IK
Notes:
1.
2.
3.
4.
5.
2.4
-
2
-0.5
-
-
-
3
0.3
-
-
-
-
-0.7
-
0.5
5.5
0.8
1
-1
-1.2
V
V
V
V
uA
uA
V
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at Vcc = 3.3V, 25
°C
ambient.
This parameter is guaranteed but not tested.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
VoH = Vcc – 0.6V at rated current
2
Copyright
© Potato Semiconductor Corporation
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
PO74G126A
02/07/07
74 Series GHz Logic
Power Supply Characteristics
Symbol
Description
Quiescent Power Supply Current
Power Supply Current per Input High
Test Conditions (1)
Vcc=Max, Vin=Vcc or GND
Vcc=Max, Vin= Vcc-0.6V
Min
Typ
Max
Unit
Icc
Q
∆Icc
Notes:
1.
2.
3.
4.
5.
-
-
0.1
50
30
300
uA
uA
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at Vcc = 3.3V, 25°C ambient.
This parameter is guaranteed but not tested.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
VoH = Vcc – 0.6V at rated current
Capacitance
Parameters (1)
Description
Input Capacitance
Output Capacitance
Test Conditions
Vin = 0V
Vout = 0V
Typ
Unit
Cin
Cout
Notes:
4
6
pF
pF
1 This parameter is determined by device characterization but not production tested.
Switching Characteristics
Symbol
Description
Propagation Delay A to Y
Propagation Delay A to Y
Output Enable Time
Output Disable Time
Rise/Fall Time
Input Frequency
Input Frequency
Input Frequency
Test Conditions (1)
CL = 15pF
CL = 15pF
CL = 15pF
CL = 15pF
0.8V – 2.0V
CL =15pF
CL = 5pF
CL = 2pF
M ax
Unit
t
PLH
t
PHL
t
PZH or
t
PZL
t
PHZ or
t
PLZ
tr/tf
fmax
fmax
fmax
Notes:
1.5
1.5
2.5
2.5
0.8
400
750
1125
ns
ns
ns
ns
ns
MHz
MHz
MHz
1. See test circuits and waveforms.
2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested.
3. Airflow of 1m/s is recommended for frequencies above 133MHz
3
Copyright
© 2005-2006, Potato Semiconductor Corporation
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
PO74G126A
02/07/07
74 Series GHz Logic
Test Waveforms
Test Circuit
500
Ω
50
Ω
15pF
to
2pF
50
Ω
500
Ω
4
Copyright
© Potato Semiconductor Corporation
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
PO74G126A
02/07/07
74 Series GHz Logic
Packaging Mechanical Drawing: 14 pin 150mil SOIC
0.244 6.20
0.228 5.80
0.010
0.007
0.25
0.17
0.050 1.27
0.016 0.40
X.XX
Denotes dimensions in inches
X.XX
X.XX
Denotes dimensions in millimenters
X.XX
5
Copyright
© Potato Semiconductor Corporation
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