Data Sheet
FEATURES
Precision Four Degrees of Freedom Sensor
ADIS16305
FUNCTIONAL BLOCK DIAGRAM
AUX_
ADC
TEMPERATURE
SENSOR
MEMS
ANGULAR RATE
SENSOR
SIGNAL
CONDITIONING
AND
CONVERSION
CALIBRATION
AND
DIGITAL
PROCESSING
AUX_
DAC
APPLICATIONS
Medical instrumentation
Robotics
Platform controls
Navigation
GENERAL DESCRIPTION
B
SO
Digital gyroscope with range scaling
±75°/sec, ±150°/sec, ±300°/sec settings
Triaxis digital accelerometer: ±3
g
Wide sensor bandwidth: 330 Hz
Autonomous operation and data collection
No external configuration commands required
Start-up time: 180 ms
Sleep mode recovery time: 4 ms
Factory-calibrated sensitivity, bias, and alignment
Calibration temperature range: −40°C to +85°C
SPI-compatible serial interface
Embedded temperature sensor
Programmable operation and control
Automatic and manual bias correction controls
Bartlett window FIR filter length, number of taps
Digital I/O: data-ready, alarm indicator, general-purpose
Alarms for condition monitoring
Sleep mode for power management
DAC output voltage
Enable external sample clock input: up to 1.2 kHz
Single-command self-test
Single-supply operation: 4.75 V to 5.25 V
2000
g
shock survivability
Operating temperature range: −40°C to +85°C
CS
SCLK
OUTPUT
REGISTERS
AND SPI
INTERFACE
DIN
DOUT
TE
ALARMS
SELF-TEST
DIGITAL
CONTROL
TRIAXIS MEMS
ACCELERATION
SENSOR
POWER
MANAGEMENT
VCC
ADIS16305
GND
09020-001
RST DIO1 DIO2 DIO3 DIO4
LE
Figure 1.
The
iSensor®
ADIS16305
is a complete inertial system that
includes a gyroscope and triaxis accelerometer. Each sensor in
the
ADIS16305
combines industry-leading
iMEMS®
technology
with signal conditioning that optimizes dynamic performance.
The factory calibration characterizes each sensor for sensitivity,
bias, alignment, and linear acceleration (gyro bias). As a result, each
sensor has its own dynamic compensation formulas that provide
accurate sensor measurements over a variety of conditions.
testing and calibration are part of the production process at the
factory, greatly reducing system integration time. Tight orthogonal
alignment simplifies inertial frame alignment in navigation systems.
An improved SPI interface and register structure provide faster data
collection and configuration control. The
ADIS16305
uses a pinout
that is compatible with the
ADIS1635x, ADIS1636x,
and
ADIS1640x
families, when used with an interface flex connector.
This compact module is approximately 23 mm × 31 mm × 8 mm
and provides a standard connector interface, which enables
horizontal or vertical mounting.
The
ADIS16305
provides a simple, cost-effective method for
integrating accurate, multiaxis, inertial sensing into industrial
systems, especially when compared with the complexity and
investment associated with discrete designs. All necessary motion
Rev. A
O
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Trademarks and registered trademarks are the property of their respective owners.
ADIS16305
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Specifications .................................................................. 5
Absolute Maximum Ratings............................................................ 6
ESD Caution .................................................................................. 6
Pin Configuration and Function Descriptions ............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ........................................................................ 9
Basic Operation ............................................................................ 9
Reading Sensor Data .................................................................... 9
Device Configuration .................................................................. 9
Data Sheet
Memory Map .............................................................................. 10
Burst Read Data Collection ...................................................... 11
Output Data Registers ............................................................... 11
Orientation Angles ..................................................................... 12
Calibration................................................................................... 13
Operational Control................................................................... 13
Input/Output Functions ............................................................ 15
Diagnostics .................................................................................. 16
Applications Information .............................................................. 18
Interface Printed Circuit Board (PCB) .................................... 18
Gyroscope Bias Optimization ................................................... 18
Outline Dimensions ....................................................................... 19
Ordering Guide .......................................................................... 19
Product Identification................................................................ 17
REVISION HISTORY
6/14—Rev. 0 to Rev. A
Changes to Figure 6 .......................................................................... 7
7/10—Revision 0: Initial Version
O
Rev. A | Page 2 of 20
B
SO
LE
TE
Data Sheet
SPECIFICATIONS
T
A
= 25°C, VCC = 5.0 V, angular rate = 0°/sec, dynamic range = ±300°/sec ± 1
g,
unless otherwise noted.
Table 1.
Parameter
GYROSCOPE
Dynamic Range
Initial Sensitivity
Test Conditions
Min
±300
0.0495
Typ
±350
0.05
0.025
0.0125
20
±0.1
0.1
±3
0.006
1.85
0.006
0.02
0.32
0.73
0.04
330
14.5
±1400
±3.6
0.6
25
±0.1
±0.5
±0.3
±60
0.037
0.1
0.16
0.3
4.25
6.5
225
340
330
5.5
1100
450
12
±2
±1
±4
±2
0
During acquisition
20
3.3
Max
ADIS16305
Unit
°/sec
°/sec/LSB
°/sec/LSB
°/sec/LSB
ppm/°C
Degrees
% of FS
°/sec
°/sec
°/√hr
°/sec/°C
°/sec/g
°/sec/V
°/sec rms
°/sec/√Hz rms
Hz
kHz
LSB
g
mg/LSB
ppm/°C
Degrees
Degrees
% of FS
mg
mg
m/sec/√hr
m/sec/√hr
mg/°C
mg rms
mg rms
µg/√Hz rms
µg/√Hz rms
Hz
kHz
LSB
LSB
Bits
LSB
LSB
LSB
LSB
V
pF
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Velocity Random Walk
Bias Temperature Coefficient
Output Noise
Noise Density
O
3 dB Bandwidth
Sensor Resonant Frequency
Self-Test Change in Output Response
B
SO
X axis and Y axis
Z axis
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Angular Random Walk
Bias Temperature Coefficient
Linear Acceleration Effect on Bias
Voltage Sensitivity
Output Noise
Rate Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
Self-Test Change in Output Response
ACCELEROMETERS
Dynamic Range
Initial Sensitivity
Sensitivity Temperature Coefficient
Misalignment
±300°/sec range setting
Each axis
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Rev. A | Page 3 of 20
T
A
= 25°C, dynamic range = ±300°/sec
T
A
= 25°C, dynamic range = ±150°/sec
T
A
= 25°C, dynamic range = ±75°/sec
−40°C ≤ T
A
≤ +85°C
Reference to z-axis accelerometer, T
A
= 25°C
Best-fit straight line
T
A
= 25°C, ±1 σ
T
A
= 25°C, 1 σ, SMPL_PRD = 0x01
T
A
= 25°C, 1 σ, SMPL_PRD = 0x01
−40°C ≤ T
A
≤ +85°C
Any axis, 1 σ (MSC_CTRL Bit[7] = 1)
VCC = 4.75 V to 5.25 V
T
A
= 25°C, ±300°/sec range, no filtering
T
A
= 25°C, f = 25 Hz, ±300°/sec, no filtering
0.0505
25°C
−40°C ≤ T
A
≤ +85°C
Axis-to-axis, T
A
= 25°C, Δ = 90° ideal
Axis-to-frame (package), T
A
= 25°C
Best-fit straight line
T
A
= 25°C, ±1 σ
T
A
= 25°C, 1 σ, SMPL_PRD = 0x01
T
A
= 25°C, 1 σ, X axis and Y axis
T
A
= 25°C, 1 σ, Z axis
−40°C ≤ T
A
≤ +85°C
T
A
= 25°C, no filtering, X axis and Y axis
T
A
= 25°C, no filtering, Z axis
T
A
= 25°C, no filtering, X axis and Y axis
T
A
= 25°C, no filtering, Z axis
ADC INPUT
Resolution
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Gain Error
Input Range
Input Capacitance
TE
±696
±2449
±3
0.594
0.606
500
90
1700
860
ADIS16305
Parameter
DAC OUTPUT
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Gain Error
Output Range
Output Impedance
Output Settling Time
LOGIC INPUTS
1
Input High Voltage, V
INH
Input Low Voltage, V
INL
CS Wake-Up Pulse Width
Logic 1 Input Current, I
INH
Logic 0 Input Current, I
INL
All Pins Except RST
RST Pin
Input Capacitance, C
IN
DIGITAL OUTPUTS
1
Output High Voltage, V
OH
Output Low Voltage, V
OL
FLASH MEMORY
Data Retention
3
FUNCTIONAL TIMES
4
Power-On Start-Up Time
Reset Recovery Time
Sleep Mode Recovery Time
Flash Memory Test Time
Automatic Self-Test Time
CONVERSION RATE
Clock Accuracy
Sync Input Clock
POWER SUPPLY
Power Supply Current
Test Conditions
5 kΩ/100 pF to GND
For Code 101 to Code 4095
Min
Typ
12
±4
±1
±5
±0.5
0
2
10
2.0
CS signal to wake up from sleep mode
V
IH
= 3.3 V
V
IL
= 0 V
3.3
Max
Data Sheet
Unit
Bits
LSB
LSB
mV
%
V
Ω
µs
V
V
V
µs
µA
µA
mA
pF
V
V
Cycles
Years
ms
ms
ms
ms
ms
ms
ms
ms
SPS
%
kHz
V
mA
mA
µA
B
SO
SMPL_PRD = 0x01 to 0xFF
Operating voltage range, VCC
Low power mode at 25°C
Normal mode at 25°C
Sleep mode at 25°C
I
SOURCE
= 1.6 mA
I
SINK
= 1.6 mA
Endurance
2
T
J
= 85°C
Time until data is available
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
LE
2.4
10,000
20
0.413
4.75
Rev. A | Page 4 of 20
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
3
The retention lifetime equivalent is at a junction temperature (T
J
) of 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.
4
These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may impact overall accuracy.
1
2
O
TE
20
±0.2
−40
−1
10
±10
−60
0.4
180
250
55
120
4
20
90
12
819.2
±3
1.2
5.25
5.0
18
42
500
0.8
0.55
Data Sheet
TIMING SPECIFICATIONS
T
A
= 25°C, VCC = 5 V, unless otherwise noted.
Table 2.
Normal Mode
(SMPL_PRD ≤ 0x09)
Min
1
Typ
Max
0.01
2.0
9
40
48.8
100
24.4
48.8
5
5
5
5
100
833
24.4
48.8
Low Power Mode
(SMPL_PRD ≥ 0x0A)
Min
1
Typ
Max
0.01
0.3
75
100
48.8
100
24.4
48.8
ADIS16305
Parameter
f
SCLK
t
STALL
t
READRATE
t
CS
t
DAV
t
DSU
t
DHD
t
SCLKR
, t
SCLKF
t
DR
, t
DF
t
SFS
t
1
t
x
t
2
t
3
1
Description
Serial clock
Stall period between data
Read rate
Chip select to clock edge
DOUT valid after SCLK edge
DIN setup time before SCLK rising edge
DIN hold time after SCLK rising edge
SCLK rise/fall times (not shown in figures)
DOUT rise/fall times (not shown in figures)
CS high after SCLK edge
Input sync positive pulse width
Input sync low time
Input sync to data-ready output
Input sync period
Burst Read
Min
Typ Max
0.01
1.0
1/f
SCLK
1
48.8
100
Unit
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
µs
µs
µs
µs
TE
12.5
12.5
5
5
12.5
12.5
5
5
5
100
833
6
15
16
DB10
DB2
DB1
LSB
A2
D2
D1
LSB
5
5
12.5
12.5
Guaranteed by design and characterization, but not tested in production.
Timing Diagrams
CS
t
CS
SCLK
SO
1
2
3
4
5
LE
DB12
DB11
600
600
t
SFS
t
DAV
DOUT
MSB
DB14
DB13
t
DSU
t
DHD
B
DIN
R/W
A6
A5
A4
A3
Figure 2. SPI Timing and Sequence
t
READRATE
t
STALL
O
CS
SCLK
Figure 3. Stall Time and Data Rate
t
3
t
2
t
1
SYNC
CLOCK (DIO4)
DATA
READY
09020-004
t
X
Figure 4. Input Clock Timing Diagram
Rev. A | Page 5 of 20
09020-003
09020-002
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