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NUP4114UCW1

Description
Transient Voltage Suppressors
File Size152KB,5 Pages
ManufacturerON Semiconductor
Websitehttp://www.onsemi.cn
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NUP4114UCW1 Overview

Transient Voltage Suppressors

NUP4114UCW1
Transient Voltage
Suppressors
ESD Protection Diodes with Low
Clamping Voltage
The NUP4114UCW1 transient voltage suppressor is designed to
protect high speed data lines from ESD. Ultra−low capacitance and
high level of ESD protection makes this device well suited for use in
USB 2.0 high speed applications.
Features
http://onsemi.com
MARKING
DIAGRAM
1
SC−88
W1 SUFFIX
CASE 419B
1
X4 = Specific Device Code
M = Date Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
6
X4 MG
G
Low Capacitance 1.5 pF
Low Clamping Voltage
Small Body Outline Dimensions:
0.082″ x 0.078″ (2.10 mm x 1.25 mm)
Low Body Height: 0.043″ (1.10 mm)
Stand−off Voltage: 5.5 V
Low Leakage
Response Time is Typically < 1.0 ns
IEC61000−4−2 Level 4 ESD Protection
This is a Pb−Free Device
PIN CONFIGURATION
AND SCHEMATIC
I/O 1
V
N
2
I/O 3
6 I/O
5 V
P
4 I/O
Mechanical Characteristics:
CASE:
Void-free, transfer-molded, thermosetting plastic
Epoxy Meets UL 94 V−0
LEAD FINISH:
100% Matte Sn (Tin)
MOUNTING POSITION:
Any
QUALIFIED MAX REFLOW TEMPERATURE:
260°C
Device Meets MSL 1 Requirements
MAXIMUM RATINGS
(T
J
= 25°C unless otherwise noted)
Rating
Operating Junction Temperature Range
Storage Temperature Range
Lead Solder Temperature
Maximum (10 Seconds)
IEC 61000−4−2 (ESD)
Contact
Air
Symbol
T
J
T
stg
T
L
Value
−40
to +125
−55
to +150
260
±8
±15
Unit
°C
°C
°C
kV
ORDERING INFORMATION
Device
NUP4114UCW1T2G
Package
Shipping
SC−88 3000/Tape & Reel
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
See Application Note AND8308/D for further description of survivability specs.
©
Semiconductor Components Industries, LLC, 2010
January, 2010
Rev. 1
1
Publication Order Number:
NUP4114UCW1/D

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