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AN3960: DescriptionESD considerations for touch sensing applications; File Size551KB，21 Pages; ManufacturerSTMicroelectronics; Websitehttp://www.st.com/

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ESD considerations for touch sensing applications

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AN3960

Application note

ESD considerations for touch sensing applications

Introduction

Electrostatic discharge (ESD) is not a new phenomenon. It is often used to describe high

voltage that may produce permanent damage. ESD can be destructive and may leave a

sytem in an unknown state from which recovery is impossible. Fortunately, it can be

prevented by several methods. Some of these methods are cheap whilst some modify the

behavior of the equipment. The ideal situation is to balance both of these factors to obtain a

robust application which is not too expensive and which is unlikely to behave erratically.

This document describes ESD, its causes and risks. Several models and standards relating

to ESD simulation are outlined. Typical ESD protection techniques are explained. Test

results are presented for the STM8T142-EVAL evaluation board which was tested against

ESD events using some of the protection methods detailed in this application note.

October 2011

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www.st.com

Contents

AN3960

Contents

What is ESD ? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

1.1

Causes of ESD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Risks of ESD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

2.1

Simulation and testing of electronic devices using models . . . . . . . . . . . . 6

2.1.1

2.1.2

Human body model (HBM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

Machine model (MM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

2.2

Standards overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

2.2.1

2.2.2

2.2.3

2.2.4

2.2.5

2.2.6

JS-001-2010 international standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

SP723 EIAJ IC121 standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

IEC61000-4-2 international standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

MIL-STD-883H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

ESD standard summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Test results of ESD standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Protecting against ESD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

3.1

3.2

3.3

3.4

3.5

3.6

3.7

Dielectric overlays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

Spark gaps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

Ground rings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Adding resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Adding diodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

ESD protection devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15

Firmware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15

STM8T142-EVAL evaluation board: ESD tests . . . . . . . . . . . . . . . . . . . 16

4.1

4.2

Test setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

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Doc ID 022082 Rev 1

AN3960

What is ESD ?

ESD is the sudden and momentary electric current that flows between two objects at

different electrical potentials.

ESD immunity is a category of electromagnetic compatibility (EMC) - the branch of electrical

sciences which studies the unintentional generation, propagation and reception of

electromagnetic energy with reference to its unwanted effects.

EMC describes the ability of a piece of equipment or a system to function satisfactorily in its

electromagnetic environment without introducing intolerable electromagnetic disturbances

to anything in that environment.

1.1

Causes of ESD

One of the causes of ESD events is static electricity. Static electricity is often generated

through the separation of electric charges when two materials are brought into contact and

then separated, for example, rubbing a plastic comb against dry hair, removing some types

of plastic packaging. In these cases, the friction between two materials creates a difference

of electrical potential that can lead to an ESD stress.

Another cause of ESD damage is through electrostatic induction. This occurs when an

electrically charged object is placed near a conductive object isolated from ground. The

presence of the charged object creates an electrostatic field that causes electrical charges

on the surface of the other object to redistribute. Even though the net electrostatic charge of

the object has not changed, it now has regions of excess positive and negative charges. An

ESD stress may occur when the object comes into contact with a conductive path. For

example, charged regions on the surfaces of styrofoam cups or plastic bags can induce

potential on nearby ESD sensitive components via electrostatic induction and an ESD

stress may occur if the component is touched with a metallic tool.

Risks of ESD

ESD is a serious issue in solid state electronics, such as integrated circuits (ICs). ICs are

made from semiconductor materials such as silicon and insulating materials like silicon

dioxide. Either of these materials can suffer permanent damage when subjected to high

voltages.

The damaging effects of ESD poses unacceptable risks in many areas of technology and it

is necessary to control such interference and reduce the risks to acceptable levels through

the:

●

Simulation and testing of electronic devices using models

Definition of standards

Doc ID 022082 Rev 1

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