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GMT04CG120J10XT-10

Description
Ceramic Capacitor, Multilayer, Ceramic, 10V, 5% +Tol, 5% -Tol, C0G, 30ppm/Cel TC, 0.000012uF, Surface Mount, 0402, CHIP
CategoryPassive components    capacitor   
File Size19MB,19 Pages
ManufacturerCal-Chip Electronics
Environmental Compliance
Download Datasheet Parametric View All

GMT04CG120J10XT-10 Overview

Ceramic Capacitor, Multilayer, Ceramic, 10V, 5% +Tol, 5% -Tol, C0G, 30ppm/Cel TC, 0.000012uF, Surface Mount, 0402, CHIP

GMT04CG120J10XT-10 Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
Objectid145058622508
package instruction, 0402
Reach Compliance Codecompliant
ECCN codeEAR99
capacitance0.000012 µF
Capacitor typeCERAMIC CAPACITOR
dielectric materialsCERAMIC
high0.55 mm
JESD-609 codee2
length1 mm
Installation featuresSURFACE MOUNT
multi-layerYes
negative tolerance5%
Number of terminals2
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
Package formSMT
method of packingTR, Paper, 7 Inch
positive tolerance5%
Rated (DC) voltage (URdc)10 V
GuidelineAEC-Q200
size code0402
surface mountYES
Temperature characteristic codeC0G
Temperature Coefficient-/+30ppm/Cel ppm/°C
Terminal surfaceTin/Nickel (Sn/Ni)
Terminal shapeWRAPAROUND
width0.5 mm

GMT04CG120J10XT-10 Preview

G Srs
MT ei
e
•Part Numbering
GMT
Product
Type
AEC0200
Qualified
I
04
Dimensions
04:0402
10:0603
21:0805
31:1206
I
I
I
CG
I
I
I
102
Dielectric
CG NPO/COG
X7R X7R
Capacitance
(pF)
OR5 0.5pF
5R05pF
100 10pF
101 100pF
102 1000pF
103 .01uF
104 .1uF
105 1.0uF
106 10uF
I
I
I
J
Tolerance
A:::t:0.05pF
B:::t:0.1 pF
C:::t:0.25pF
D:::1:0.SpF
F:::1:1%
G:::1:2%
J:::1:5%
K:::1:10%
M:::1:20-%
I
I
qo
Voltage
6R3: 6.3 DC
10: 10 DC
16: 16 DC
25: 25 DC
50: 50 DC
100 100DC
200 200 DC
I
NT
Packaging
Code
I
I
I
4
Reel
Size
I
I
NT Tape & R
eel
XT: SOFT TERM
4• 4K reel
10 1 OK reel
15 15K reel
"See packaging
quantity on page
1 for more info
•standard Electrical Specifications
Dielectric
Size
Capacitance range•
Capacitance tolerance••
Rated voltage (WVDC)
Tan½·
Insulation resistance at Ur
Operating temperature
Capacitance characteristic
Termination
±30ppm/'C
NPO
0402.0603, 0805,
1206
0.5pF to 0.01uF
CapS5pF:
A (±0.05pF ), B (±0.1pF), C (±0.25pF)
5pF<Cap<10pF:B (±0.1pF) ,C (±0.25pF), D (±0.5pF)
Ca½10pF
:
F (±1%),
G
(±2%),
J
(±5%)
10V,
16V,25V,S0V, 100V,200V
C
<30 F:Q½400+20C
½
½
OpF: ½1000
½10GO or RxC½SOOOxF whichever is
less
-55 to +125'C
Ni/Sn (lead-free
termination)
X7R
0402,0603,0805, 1206
100pF to
1µF
J (±5%)
,
K (±10%), M (±20%)
10V,
16V, 25V,SOV
Note
1
I
±15%
• Measured at the condition of 30-70% related humidity.
NPO: Apply 1.0±0.2Vnns, 1.0MHz:1:10% for CapS1000pF and 1.0±0.2Vnns, 1.0kHz:1:10% for Cap>1000pF, 25'C at ambient temperature
Measured at 1.0±0.2Vrms, 1.0kHz:1:10% for Cs1 OµF; 0.5±0.2Vrms, 120Hz±20% for C>10µF, 30-70% related
humidity,
25'C ambient temperature for
X7R.
•• Preconditioning for
Class
II
MLCC: Perform a heat treatment at 150:1:10'C for 1
hour,
then
leave
in
a mbient condition for 24±2
hours
before
measurement.
Note 1: X?R
l"!ated
½ol.
,;;50V
½5V
125V
16V
10V
'5.3V
l).F.:.
:.2.5%
½3.5%
½3.5%
:a,3.5%
:.5%
:,1()%
Exception of D.F.
:.
:.i3o/o
:.5%
tl603.:.o.o47µF; oeo5;,;o.1eµF:12os;;:;o.47µF
0603.:;
1
µF; 0805ie:.1µF;1206;,;4.7µF;
1210<1; 10µF
P805a2.2µF;
1210;;: 1
OµF
peo5.:;
1
µF;
1210;;:;
1oµF
1210,;;4.7µF
S:10%
:;;10%
;5;5%
½70/o
:.5%
S:10%
:;;10%
:.10%
1)402i?;0.10µF;0603ie;0.47µF; 0805ie;2.2µF;1206.,;6.8µF
;
1210ii:.22µF
ll60320.33µF;
12062;4.7µF
1)402ie;0.033µF;
0603ie;0.15µF; 0805ie;0.68µF;1206ie;2.2µF;1210ie; 4.7µF
1)402;,; 0.47uF; oso3;,;o.seµF;oeo5;,;2.2µF;12os;,;4_7µF;
1210;,;22µF
1)402.:0.33µF;0603.: 0.33µF; 0805.:
2.2µF;
1206½
2.2µF;121
O.:
22µF
:.15%
;515%
;,;i20%
1)402.:1µF
l4v
:.15%
-
1)4022:.2.2µF
p402,;,;
1
µF;0603<':
10µF;
08052;4.7µF;
1206<":47µF
:1210;;,
100µF
Calchip Electronics, INC.
Phone: (215) 942-8900
www.calchipelectronics.com
Fax : (215) 942-6400
NGO/COG
DIMENSION (MM)
Rated Voltage
Cap. Range
0.5pF
0.6
0.7
0.8
0.9
1
1.2
1.5
1.8
2.2
2.7
3.3
3.9
4.7
5.6
6.8
8.2
10
12
15
18
22
27
33
39
47
56
68
82
100
120
150
180
220
270
330
390
470
560
680
820
1000
1200
1500
180
2200
2700
3300
3900
4700
5600
6800
8200
0.010 uF
0R5
0R6
0R7
0R8
0R9
1R0
1R2
1R5
1R8
2R2
2R7
3R3
3R9
4R7
5R6
6R8
8R2
100
120
150
180
220
270
330
390
470
560
680
820
101
121
151
181
221
271
331
391
471
561
681
821
102
122
152
182
222
272
332
392
472
562
682
822
103
GMT04 (0402)
10
16
25
50
10
GMT10 (0603)
16
25
50
100
200
10
GMT21 (0805)
16
25
50
100
10
GMT31 (1206)
16
25
50
100
0.55 mm
0.7mm
0.87mm
0.9mm
.95mm
1.05mm
1.35mm
Calchip Electronics, INC.
Phone: (215) 942-8900
www.calchipelectronics.com
Fax : (215) 942-6400
X7R
DIMENSION (MM)
Rated Voltage
Cap. Range
100 pF
120
150
180
220
270
330
390
470
560
680
820
1000
1200
1500
1800
2200
2700
3300
3900
4700
5600
6800
8200
0.010uF
0.012
0.015
0.018
0.022
0.027
0.033
0.039
0.047
0.056
0.068
0.082
0.10
0.12
0.15
0.18
0.22
0.27
0.33
0.39
0.47
0.56
0.68
1.00
2.20
101
121
151
181
221
271
331
391
471
561
681
821
102
122
152
182
222
272
332
392
472
562
682
822
103
123
153
183
223
273
333
393
473
563
683
823
104
124
154
184
224
274
334
394
474
564
684
105
225
GMT04 (0402)
10
16
25
50
GMT10 (0603)
10
16
25
50
GMT21 (0805)
10
16
25
50
10
GMT31 (1206)
16
25
50
100
0.55 mm
0.87mm
0.95mm
0.9mm
1.05mm
1.3mm
1.35mm
1.80mm
Calchip Electronics, INC.
Phone: (215) 942-8900
www.calchipelectronics.com
Fax : (215) 942-6400
•· Reliability Test Conditions and Dimensions
No.
1.
Pre-and
AEC-Q200
Test Item
AEC-Q200 Test Condition
Requirements
2.
High Temperature
MIL-STD-202
Method 108
Electrical Test
Post-Stress
Test temp.: 150:i:3'C
,
Exposure (Storage):· Unpowered.
No remarkable damage.
Cap change : NPO: within ±2.5% or ±0.25pF whichever is
larger.
X7R: within ±10.00%.
v
Test time:
1000+24/-0
hrs.
,Nrg·2a p½½½½F, Q<!,1 000;
Cap<-30pF,
Q<!,4oo+2oc.
Measurement to be made after keeping at ?
r
!
,-
X
-
R:
- -r-----.-----------------------,
-
,room temp. for 24±2 hrs.
:
Rate d
.F.;:;, Exception of D.F.
;:;;
vol. t>
!"
;:;,6% 0603<1;0.047µF; 0805<1;0.18µF; 1206<1;0.47µF
<1;50V ;:;,3% ;:;,10% 1210<1;4.?µF
;:;,5% ;:;,20% 0805<!,2,2µF;1210<1;10µF
;:;;5%
;:;,10% 0805<1;1µF; 1210<1;10µF
35V
25V
;:;,20% 0603,1; 1µF; 0805,1; 1µF;1206<1;4.7µF; 1210,1; 10µF
;:;.14%
0603<1;0.33µF;1206<1;4.7µF
0402<1;0.10µF;0603<1; 0.47µF;0805<1; 2.2µF;1206,1; 6.BµF;
515'¾
0
1210<1;22µF
-
;:;,
10%
0603,1; 0.15µF;0B05,1; 0.68µF;1206,1; 2.2µF;1210.1;4.7µF
5
k)402<1;0.033µF;0603<1;0.68µF;0B05<1;2.2µF;
:16V
;:;. % 515'¾
0
:
-
1205;:;:4,?uF; 1210222uF
___.
'¾ 0402<1;0.33µF; 0603<1;0.33µF;0805<1;2.2µF;
,
515
0 1206<1;2.2µF; 1210<1;22µF
-
;:;,7.5
: 10V
;:;,20%
kl4
02.1;1µF
:
__________
_
_
:-----. ---.
-1
-
o-2_
,1;_
1_.
_ - _
6_0
_ _ _
0
_ _
,
µF;0 3
,1;
1
µF ;
kl4
:
6,3V
;:;,
151/o
;:;;3o
1/o
oao5;:;:4,7uF;1206247uF;1210;:;: 100µF
:
____________ __________________
whichever
is
smaller.
!l-4-,
V-+-;:i;-2_0_%+----1--------'---------,._.._....., _._
__
__
..... ______
-I
! Class II (X7R)
I.R.: <!,10GOor RxC<!,500O-F
! Rate d voltage
Resistance
,
"'" - _ _ _ _ _ __________________--1..;.a.=="'--!
! 1oov: X?R
:50V:0603<!,1µF;0805<!,1µF;1206<!,4,7µF;1210<!,4,7µF
!1-3 V:o ao 5
<!,
2 .2µ_F;12
10
10µ
F
_____
!5 _ _ _ _ _ _ _
________1GOor RxC
_
_ _ _
.1;_
_ _
-
,1;
10 O-F
!
25V:0402<!,1µF;0603<!,2,2µF;0805<!,2,2µF;1206<!,1 0µF;1210<!,10µF
! 16V:0402<!,0,22µF;0603<!,1µF;0805<!,2,2µF;1206<!,10µF;1210<!,47µF
½½½ ½:r½er is
1
! 10V: 0402<!,0.47µF;0603<!,0.47µF;0805<!,2,2µF;
:
1206<!,4,7µF;1210<!,47µF
:6.3V;
4V;
•½-------------------------½
Insulation
3.
Destructive
EIA-469
Physical Analysis
Per EIA-469
.
••
.
!No defects or abnormalities
Calchip Electronics, INC.
Phone: (215) 942-8900
www.calchipelectronics.com
Fax : (215) 942-6400
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