(Refer to package thermal de-rating curve on page 25)
Storage Temperature
Junction Temperature
TSOT25
V-DFN3030-6
Parameter
Rating
-0.3 to +60
(65V for 0.5 sec)
+0.3 to -5.0
(measured with respect to V
IN
)
-0.3 to +60
(65V for 0.5 sec)
-0.3 to +6.0
0.65
1
1.8
-55 to +150
150
Unit
V
V
V
V
A
W
°C
°C
These are stress ratings only. Operation outside the absolute maximum ratings may cause device failure.
Operation at the absolute maximum rating for extended periods may reduce device reliability.
ESD Susceptibility
Human Body Model
Charged Device Model
Machine Model
Rating
500
>1000
<100
Unit
V
V
V
Semiconductor devices are ESD sensitive and may be damaged by exposure to ESD events. Suitable ESD precautions should be taken when handling and
transporting these devices.
The human body model is a 100pF capacitor discharge through a 1.5kΩ resistor pin. The machine model is a 200pF capacitor discharged directly into each pin.
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