AOS Semiconductor
Product Reliability Report
AON6414AL,
rev B
Plastic Encapsulated Device
ALPHA & OMEGA Semiconductor, Inc
www.aosmd.com
This AOS product reliability report summarizes the qualification result for AON6414AL.
Accelerated environmental tests are performed on a specific sample size, and then followed
by electrical test at end point. Review of final electrical test result confirms that AON6414AL
passes AOS quality and reliability requirements. The released product will be categorized by
the process family and be monitored on a quarterly basis for continuously improving the
product quality.
Table of Contents:
I.
II.
III.
IV.
Product Description
Package and Die information
Environmental Stress Test Summary and Result
Reliability Evaluation
I. Product Description:
The AON6414AL uses advanced trench technology to provide excellent R
DS(ON)
, low gate
charge. This device is suitable for use as a high side switch in SMPS and general purpose
applications.
-RoHS Compliant
-Halogen Free
Detailed information refers to datasheet.
II. Die / Package Information:
AON6414AL
Process
Standard sub-micron
Low voltage N channel
Package Type
DFN 5x6
Lead Frame
Cu
Die Attach
Ag epoxy
Bonding Wire
Cu wire
Mold Material
Epoxy resin with silica filler
MSL (moisture sensitive level)
Level 1 based on J-STD-020
Note *
based on information provided by assembler and mold compound supplier
III. Result of Reliability Stress for AON6414AL
Test Item
Test Condition
Time
Point
-
Lot
Attribution
11 lots
Total
Sample
size
1815pcs
Number
of
Failures
0
Standard
MSL
Precondition
HTGB
168hr 85°
c
/85%RH +3 cycle
reflow@260°
c
Temp = 150
°
c,
Vgs=100% of
Vgsmax
Temp = 150
°
c,
Vds=80% of
Vdsmax
130 +/- 2°c,
°
85%RH, 33.3 psi,
Vgs = 100% of
Vgs max
121°c, 29.7psi,
°
RH=100%
-65°c to 150°c,
°
°
air to air
JESD22-
A113
168hrs
500 hrs
1000 hrs
2 lots
1 lot
1 lot
308pcs
0
JESD22-
A108
HTRB
168hrs
500 hrs
1000 hrs
2 lots
1 lot
1 lot
77pcs / lot
308pcs
0
JESD22-
A108
HAST
100 hrs
11 lots
77pcs / lot
605pcs
0
JESD22-
A110
Pressure Pot
96 hrs
(Note A*)
11 lots
55pcs / lot
605pcs
0
JESD22-
A102
Temperature
Cycle
250 / 500
cycles
(Note A*)
11 lots
55pcs / lot
605pcs
0
JESD22-
A104
(Note A*)
55pcs / lot
Note A:
The reliability data presents total of available generic data up to the published date.
IV. Reliability Evaluation
FIT rate (per billion): 13
MTTF = 9101 years
The presentation of FIT rate for the individual product reliability is restricted by the actual
burn-in sample size of the selected product (AON6414AL). Failure Rate Determination is
based on JEDEC Standard JESD 85. FIT means one failure per billion hours.
Failure Rate
= Chi x 10
/
[2
(N) (H) (Af)]
9
= 1.83 x 10
/
[2x
(4x77x168+2x77x500+2x77x1000) x258]
=
13
9
7
MTTF =
10 / FIT = 7.97 x 10 hrs = 9101 years
Chi²
= Chi Squared Distribution, determined by the number of failures and confidence interval
N
= Total Number of units from HTRB and HTGB tests
H
= Duration of HTRB/HTGB testing
Af
= Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C)
Acceleration Factor [Af] =
Exp
[Ea /
k
(1/Tj u – 1/Tj s)]
Acceleration Factor ratio list:
55 deg C
70 deg C
85 deg C
100 deg C
115 deg C
130 deg C
150 deg C
2
9
Af
258
87
32
13
5.64
2.59
1
Tj s
= Stressed junction temperature in degree (Kelvin), K = C+273.16
Tj u
= The use junction temperature in degree (Kelvin), K = C+273.16
-5
K
=
Boltzmann’s constant, 8.617164 X 10 eV / K
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