5962F9672002VXC datasheet, PDF

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5962F9672002VXC: DescriptionACT SERIES, 9-BIT PARITY GENERATOR/CHECKER, TRUE OUTPUT, CDFP14; Categorylogic logic; File Size127KB，23 Pages; ManufacturerIntersil ( Renesas ); Websitehttp://www.intersil.com/cda/home/

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5962F9672002VXC Overview

ACT SERIES, 9-BIT PARITY GENERATOR/CHECKER, TRUE OUTPUT, CDFP14

5962F9672002VXC Parametric

Parameter Name	Attribute value
Is it Rohs certified?	incompatible
Objectid	1536268934
Parts packaging code	DFP
package instruction	DFP, FL14,.3
Contacts	14
Reach Compliance Code	not_compliant
series	ACT
JESD-30 code	R-CDFP-F14
JESD-609 code	e0
Logic integrated circuit type	PARITY GENERATOR/CHECKER
Number of digits	9
Number of functions	1
Number of terminals	14
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Output polarity	TRUE
Package body material	CERAMIC, METAL-SEALED COFIRED
encapsulated code	DFP
Encapsulate equivalent code	FL14,.3
Package shape	RECTANGULAR
Package form	FLATPACK
Peak Reflow Temperature (Celsius)	NOT SPECIFIED
power supply	5 V
propagation delay (tpd)	23 ns
Certification status	Not Qualified
Filter level	MIL-PRF-38535 Class V
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	YES
technology	CMOS
Temperature level	MILITARY
Terminal surface	Tin/Lead (Sn/Pb)
Terminal form	FLAT
Terminal pitch	1.27 mm
Terminal location	DUAL
Maximum time at peak reflow temperature	NOT SPECIFIED
total dose	300k Rad(Si) V

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REVISIONS

LTR

DESCRIPTION

Changes in accordance with NOR 5962-R333-97.

Changes in accordance with NOR 5962-R165-98.

Update boilerplate to MIL-PRF-38535 and updated appendix A. Editorial

changes throughout. - tmh

DATE (YR-MO-DA)

97-10-22

98-09-02

00-07-03

APPROVED

Monica L. Poelking

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

Thanh V. Nguyen

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

CHECKED BY

Thanh V. Nguyen

APPROVED BY

Monica L. Poelking

DRAWING APPROVAL DATE

95-12-28

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216

MICROCIRCUIT, DIGITAL, RADIATION

HARDENED ADVANCED CMOS, 9-BIT ODD/EVEN

PARITY GENERATOR CHECKER, TTL

COMPATIBLE INPUTS, MONOLITHIC SILICON

SIZE

SHEET

CAGE CODE

AMSC N/A

REVISION LEVEL

67268

1 OF

5962-96720

DSCC FORM 2233

APR 97

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

5962-E407-00

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883

MIL-STD-973

MIL-STD-1835

Test Method Standard Microcircuits.

Configuration Management.

Interface Standard For Microcircuit Case Outlines.

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103

MIL-HDBK-780

List of Standard Microcircuit Drawings (SMD's).

Standard Microcircuit Drawings.

(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document

Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this

drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption

has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in

the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in

accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein.

3.1.1 Microcircuit die. For the requirements for microcircuit die, see appendix A to this document.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-

PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Truth table. The truth table shall be as specified on figure 2.

3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.

3.2.5 Switching waveform and test circuit. The switching waveforms and test circuits shall be as specified on figure 4.

3.2.6 Radiation exposure circuit. The radiation test connections shall be as specified in table III herein.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical

performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating

temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for

each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as

listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the

manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still

be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in

accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-

PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed

manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance

shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The

certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the

manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the

requirements of MIL-PRF-38535, appendix A and herein.

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

DSCC FORM 2234

APR 97

SIZE

REVISION LEVEL

5962-96720

SHEET

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in

MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this

drawing.

3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein)

involving devices acquired to this drawing is required for any change as defined in MIL-STD-973.

3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the option to

review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the

option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group

number 39 (see MIL-PRF-38535, appendix A).

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-

38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the

form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-

38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all

devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method

5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,

outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015.

(2) T

= +125°C, minimum.

Interim and final electrical test parameters shall be as specified in table IIA herein.

4.2.2 Additional criteria for device classes Q and V.

The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device

manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document

revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of

MIL-STD-883.

Interim and final electrical test parameters shall be as specified in table IIA herein.

Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance

with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E

inspections (see 4.4.1 through 4.4.4).

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

DSCC FORM 2234

APR 97

SIZE

REVISION LEVEL

5962-96720

SHEET

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