EEWORLDEEWORLDEEWORLD

Part Number

Search

07016-029MCCC

Description
Tantalum Capacitor, Polarized, Tantalum (dry/solid), 10V, 20% +Tol, 20% -Tol, 10uF, 1206
CategoryPassive components    capacitor   
File Size910KB,26 Pages
ManufacturerKEMET
Websitehttp://www.kemet.com
Download Datasheet Parametric View All

07016-029MCCC Overview

Tantalum Capacitor, Polarized, Tantalum (dry/solid), 10V, 20% +Tol, 20% -Tol, 10uF, 1206

07016-029MCCC Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
Objectid1326814248
package instruction, 1306
Reach Compliance Codenot_compliant
ECCN codeEAR99
Other featuresESR IS MEASURED AT 100 KHZ
capacitance10 µF
Capacitor typeTANTALUM CAPACITOR
dielectric materialsTANTALUM (DRY/SOLID)
ESR1800 mΩ
high1.6 mm
JESD-609 codee0
leakage current0.001 mA
length3.2 mm
Installation featuresSURFACE MOUNT
negative tolerance20%
Number of terminals2
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
Package formSMT
polarityPOLARIZED
positive tolerance20%
Rated (DC) voltage (URdc)10 V
size code1206
surface mountYES
Delta tangent0.06
Terminal surfaceTin/Lead (Sn/Pb) - hot dipped
Terminal shapeJ BEND
width1.6 mm
Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Overview
The KEMET T493 Series is designed for the Commercial
Off-The-Shelf (COTS) requirements of military and
aerospace applications. This series is a surface mount
product offering various lead-frame plating options,
Weibull grading options, surge current testing, F-Tech (an
improved anode manufacturing process) and Simulated
Breakdown Voltage (SBDV) screening options to improve
long term reliability. Standard, low, and ultra-low ESR
options are available. All lots of this series are conditioned
with MIL–PRF–55365 Group A testing. This series is also
approved for DLA Drawing 07016 (please see part number
list specific to this drawing).
KEMET’s F-Tech eliminates hidden defects in the dielectric
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test.
F-Tech parts see no degradation while standard tantalum's
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for the T493 Series
(select D and X case capacitance values in 25 V and
higher rated voltage). Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET’s patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor without damage to
its dielectric or to the general population of capacitors. This
screening identifies hidden defects in the dielectric, providing
the highest level of dielectric testing. SBDS is based on the
simulation of breakdown voltage (BDV), the ultimate test of
the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provide only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497 Series. Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
Built Into Tomorrow
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2007_T493 • 10/14/2021
1
EEWORLD University ---- ARM (IMX6U) bare metal video tutorial (punctual atom)
ARM (IMX6U) bare metal video tutorial (on-point atom) : https://training.eeworld.com.cn/course/26635Atomic ARM (IMX6U) bare metal video tutorial...
木犯001号 MCU
IAR debugging issues
I am using IAR5.4. After creating a main function, I clicked the "debug without download" button and an error like the one shown in the picture popped up. Please help! Thank you!...
zax0403111 Microcontroller MCU
FPGA core configuration issues
In the FPGA IP core, when configuring, there will be corresponding resource allocation, such as DSP, LUTs, FFs, etc. What do these mean? Is there anything I need to pay attention to when using them? ?...
枫叶知秋 FPGA/CPLD
Description of LCD display module based on SED1565 driver
[b]Description of LCD display module based on SED1565 driver[/b]...
呱呱 MCU
Help! Programming problem of phase difference meter based on mega16~~~~~~~~~~~~~~~~~
The peripheral connections of mega16 are as follows: the phase difference pulse signal is input from the PD6 port, and the phase difference relationship judgment signal is input from the PD7 port (the...
lmjxcg Embedded System

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 1313  1709  964  2449  2920  27  35  20  50  59 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号