BUZ 31 L
SIPMOS
®
Power Transistor
• N channel
• Enhancement mode
• Avalanche-rated
• Logic Level
Pin 1
G
Type
BUZ 31 L
Pin 2
D
Pin 3
S
V
DS
200 V
I
D
13.5 A
R
DS(on)
0.2
Ω
Package
TO-220 AB
Ordering Code
C67078-S1322-A2
Maximum Ratings
Parameter
Continuous drain current
Symbol
Values
13.5
Unit
A
I
D
I
Dpuls
54
T
C
= 28 °C
Pulsed drain current
T
C
= 25 °C
Avalanche current,limited by
T
jmax
Avalanche energy,periodic limited by
T
jmax
Avalanche energy, single pulse
I
AR
E
AR
E
AS
13.5
9
mJ
I
D
= 13.5 A,
V
DD
= 50 V,
R
GS
= 25
Ω
L
= 1.65 mH,
T
j
= 25 °C
Gate source voltage
Gate-source peak voltage,aperiodic
Power dissipation
200
V
GS
V
gs
P
tot
±
14
±
20
V
W
T
C
= 25 °C
Operating temperature
Storage temperature
Thermal resistance, chip case
Thermal resistance, chip to ambient
DIN humidity category, DIN 40 040
IEC climatic category, DIN IEC 68-1
75
T
j
T
stg
R
thJC
R
thJA
-55 ... + 150
-55 ... + 150
≤
1.67
75
E
55 / 150 / 56
°C
K/W
Semiconductor Group
1
07/96
BUZ 31 L
Electrical Characteristics,
at
T
j
= 25°C, unless otherwise specified
Parameter
Symbol
min.
Static Characteristics
Drain- source breakdown voltage
Values
typ.
max.
Unit
V
(BR)DSS
200
-
1.6
0.1
10
10
0.16
-
2
V
V
GS
= 0 V,
I
D
= 0.25 mA,
T
j
= 25 °C
Gate threshold voltage
V
GS(th)
1.2
V
GS=
V
DS,
I
D
= 1 mA
Zero gate voltage drain current
I
DSS
-
-
1
100
µA
V
DS
= 200 V,
V
GS
= 0 V,
T
j
= 25 °C
V
DS
= 200 V,
V
GS
= 0 V,
T
j
= 125 °C
Gate-source leakage current
I
GSS
-
100
nA
Ω
-
0.2
V
GS
= 20 V,
V
DS
= 0 V
Drain-Source on-resistance
R
DS(on)
V
GS
= 5 V,
I
D
= 7 A
Semiconductor Group
2
07/96
BUZ 31 L
Electrical Characteristics,
at
T
j
= 25°C, unless otherwise specified
Parameter
Symbol
min.
Dynamic Characteristics
Transconductance
Values
typ.
max.
Unit
g
fs
5
12
1200
200
100
-
S
pF
-
1600
300
150
ns
-
25
40
V
DS
≥
2
*
I
D *
R
DS(on)max,
I
D
= 7 A
Input capacitance
C
iss
C
oss
-
V
GS
= 0 V,
V
DS
= 25 V,
f
= 1 MHz
Output capacitance
V
GS
= 0 V,
V
DS
= 25 V,
f
= 1 MHz
Reverse transfer capacitance
C
rss
-
V
GS
= 0 V,
V
DS
= 25 V,
f
= 1 MHz
Turn-on delay time
t
d(on)
V
DD
= 30 V,
V
GS
= 5 V,
I
D
= 3 A
R
GS
= 50
Ω
Rise time
t
r
-
80
120
V
DD
= 30 V,
V
GS
= 5 V,
I
D
= 3 A
R
GS
= 50
Ω
Turn-off delay time
t
d(off)
-
210
270
V
DD
= 30 V,
V
GS
= 5 V,
I
D
= 3 A
R
GS
= 50
Ω
Fall time
t
f
-
65
85
V
DD
= 30 V,
V
GS
= 5 V,
I
D
= 3 A
R
GS
= 50
Ω
Semiconductor Group
3
07/96
BUZ 31 L
Electrical Characteristics,
at
T
j
= 25°C, unless otherwise specified
Parameter
Symbol
min.
Reverse Diode
Inverse diode continuous forward current
I
S
T
C
= 25 °C
Inverse diode direct current,pulsed
A
-
-
-
-
1.2
180
1.2
13.5
54
V
-
1.6
ns
-
-
µC
-
-
Values
typ.
max.
Unit
I
SM
V
SD
t
rr
Q
rr
T
C
= 25 °C
Inverse diode forward voltage
V
GS
= 0 V,
I
F
= 27 A
Reverse recovery time
V
R
= 100 V,
I
F=
l
S,
di
F
/dt = 100 A/µs
Reverse recovery charge
V
R
= 100 V,
I
F=
l
S,
di
F
/dt = 100 A/µs
Semiconductor Group
4
07/96
BUZ 31 L
Power dissipation
P
tot
=
ƒ
(T
C
)
Drain current
I
D
=
ƒ
(T
C
)
parameter:
V
GS
≥
5 V
14
A
80
W
12
P
tot
60
I
D
11
10
50
9
8
40
7
6
30
5
4
20
3
10
0
0
2
1
0
20
40
60
80
100
120
°C
160
0
20
40
60
80
100
120
°C
160
T
C
T
C
Safe operating area
I
D
=
ƒ
(V
DS
)
parameter:
D
= 0.01,
T
C
= 25°C
10
2
t
= 3.1µs
p
Transient thermal impedance
Z
th JC
=
ƒ
(t
p
)
parameter:
D = t
p
/
T
10
1
K/W
D
A
I
D
DS
/I
10 µs
Z
thJC
100 µs
=V
10
0
R
10
1
DS
(o
n)
1 ms
10
-1
D = 0.50
0.20
10
0
10 ms
0.10
10
-2
0.05
0.02
DC
single pulse
0.01
10
-1
0
10
10
1
10
2
V
10
-3
-7
10
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
0
V
DS
t
p
Semiconductor Group
5
07/96
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