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2SC3324GRTE85LF

Description
transistors bipolar - bjt audio freq low audio freq low
Categorysemiconductor    Discrete semiconductor   
File Size316KB,5 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Environmental Compliance
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transistors bipolar - bjt audio freq low audio freq low

2SC3324GRTE85LF Parametric

Parameter NameAttribute value
ManufactureToshib
Product CategoryTransistors Bipolar - BJT
RoHSYes
ConfiguratiSingle
Transistor PolarityNPN
Collector- Base Voltage VCBO120 V
Collector- Emitter Voltage VCEO Max120 V
Emitter- Base Voltage VEBO5 V
Gain Bandwidth Product fT100 MHz
Mounting StyleSMD/SMT
Package / CaseTO-236 MOD
Continuous Collector Curre100 mA
DC Collector/Base Gain hfe Mi200
DC Current Gain hFE Max700
Maximum Power Dissipati150 mW
PackagingReel
Factory Pack Quantity3000
2SC3324
TOSHIBA Transistor
Silicon NPN Epitaxial Type (PCT process)
2SC3324
Audio Frequency Low Noise Amplifier Applications
High voltage: V
CEO
= 120 V
Excellent h
FE
linearity: h
FE
(I
C
= 0.1 mA)/ h
FE
(I
C
= 2 mA)
= 0.95 (typ.)
High h
FE:
h
FE
= 200 to 700
Low noise: NF (2) = 0.2dB (typ.), 3dB (max)
Complementary to 2SA1312
Small package
Unit: mm
Absolute Maximum Ratings
(Ta
=
25°C)
Characteristics
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Collector power dissipation
Junction temperature
Storage temperature range
Symbol
V
CBO
V
CEO
V
EBO
I
C
I
B
P
C
T
j
T
stg
Rating
120
120
5
100
20
150
125
−55
to 125
Unit
V
V
V
mA
mA
mW
°C
°C
JEDEC
JEITA
TOSHIBA
TO-236MOD
SC-59
2-3F1A
Weight: 0.012 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in temperature, etc.) may cause this product to
decrease in the reliability significantly even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Marking
Start of commercial production
1982-12
1
2014-03-01

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