EEWORLDEEWORLDEEWORLD

Part Number

Search

EPF6024ATC144-3N

Description
fpga - field programmable gate array fpga - flex 6000 196 labs 117 ios
CategoryProgrammable logic devices    Programmable logic   
File Size378KB,52 Pages
ManufacturerAltera (Intel)
Environmental Compliance
Download Datasheet Parametric View All

EPF6024ATC144-3N Online Shopping

Suppliers Part Number Price MOQ In stock  
EPF6024ATC144-3N - - View Buy Now

EPF6024ATC144-3N Overview

fpga - field programmable gate array fpga - flex 6000 196 labs 117 ios

EPF6024ATC144-3N Parametric

Parameter NameAttribute value
Is it lead-free?Lead free
Is it Rohs certified?conform to
MakerAltera (Intel)
Parts packaging codeQFP
package instructionLFQFP,
Contacts144
Reach Compliance Codecompliant
ECCN code3A991
Other featuresCAN ALSO BE USED 24000 LOGIC GATES
maximum clock frequency133 MHz
JESD-30 codeS-PQFP-G144
JESD-609 codee3
length20 mm
Humidity sensitivity level3
Dedicated input times4
Number of I/O lines117
Number of terminals144
Maximum operating temperature85 °C
Minimum operating temperature
organize4 DEDICATED INPUTS, 117 I/O
Output functionMACROCELL
Package body materialPLASTIC/EPOXY
encapsulated codeLFQFP
Package shapeSQUARE
Package formFLATPACK, LOW PROFILE, FINE PITCH
Peak Reflow Temperature (Celsius)260
Programmable logic typeLOADABLE PLD
Certification statusNot Qualified
Maximum seat height1.6 mm
Maximum supply voltage3.6 V
Minimum supply voltage3 V
Nominal supply voltage3.3 V
surface mountYES
Temperature levelOTHER
Terminal surfaceMATTE TIN (472) OVER COPPER
Terminal formGULL WING
Terminal pitch0.5 mm
Terminal locationQUAD
Maximum time at peak reflow temperature40
width20 mm
Base Number Matches1
FLEX 6000
®
Programmable Logic
Device Family
Data Sheet
March 2001, ver. 4.1
Features...
Provides an ideal low-cost, programmable alternative to high-
volume gate array applications and allows fast design changes
during prototyping or design testing
Product features
Register-rich, look-up table- (LUT-) based architecture
OptiFLEX
®
architecture that increases device area efficiency
Typical gates ranging from 5,000 to 24,000 gates (see
Table 1)
Built-in low-skew clock distribution tree
100% functional testing of all devices; test vectors or scan chains
are not required
System-level features
In-circuit reconfigurability (ICR) via external configuration
device or intelligent controller
5.0-V devices are fully compliant with peripheral component
interconnect Special Interest Group (PCI SIG)
PCI Local Bus
Specification, Revision 2.2
Built-in Joint Test Action Group (JTAG) boundary-scan test
(BST) circuitry compliant with IEEE Std. 1149.1-1990, available
without consuming additional device logic
MultiVolt
TM
I/O interface operation, allowing a device to bridge
between systems operating at different voltages
Low power consumption (typical specification less than 0.5 mA
in standby mode)
3.3-V devices support hot-socketing
Table 1. FLEX 6000 Device Features
Feature
Typical gates
(1)
Logic elements (LEs)
Maximum I/O pins
Supply voltage (V
CCINT
)
Note:
(1)
The embedded IEEE Std. 1149.1 JTAG circuitry adds up to 14,000 gates in addition to the listed typical gates.
EPF6010A
10,000
880
102
3.3 V
EPF6016
16,000
1,320
204
5.0 V
EPF6016A
16,000
1,320
171
3.3 V
EPF6024A
24,000
1,960
218
3.3 V
Altera Corporation
A-DS-F6000-04.1
1

Technical ResourceMore

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 529  888  651  2909  2827  11  18  14  59  57 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号