5962-8687514XX datasheet, PDF - EEWORLD Datasheet

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5962-8687514XX: DescriptionMulti-Port SRAM, 1KX8, 70ns, CMOS, CDIP48, CERAMIC, DIP-48; Categorystorage storage; File Size230KB，31 Pages; ManufacturerAtmel (Microchip)

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5962-8687514XX Overview

Multi-Port SRAM, 1KX8, 70ns, CMOS, CDIP48, CERAMIC, DIP-48

5962-8687514XX Parametric

Parameter Name	Attribute value
Objectid	2084334270
package instruction	CERAMIC, DIP-48
Reach Compliance Code	unknown
Maximum access time	70 ns
Other features	INTERRUPT FLAG; AUTOMATIC POWER-DOWN
I/O type	COMMON
JESD-30 code	R-CDIP-T48
length	60.96 mm
memory density	8192 bit
Memory IC Type	MULTI-PORT SRAM
memory width	8
Number of functions	1
Number of ports	2
Number of terminals	48
word count	1024 words
character code	1000
Operating mode	ASYNCHRONOUS
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
organize	1KX8
Output characteristics	3-STATE
Package body material	CERAMIC, METAL-SEALED COFIRED
encapsulated code	DIP
Encapsulate equivalent code	DIP48,.6
Package shape	RECTANGULAR
Package form	IN-LINE
Parallel/Serial	PARALLEL
power supply	5 V
Certification status	Not Qualified
Filter level	MIL-STD-883
Maximum seat height	4.826 mm
Maximum standby current	0.004 A
Minimum standby current	2 V
Maximum slew rate	0.18 mA
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	NO
technology	CMOS
Temperature level	MILITARY
Terminal form	THROUGH-HOLE
Terminal pitch	2.54 mm
Terminal location	DUAL
width	15.24 mm

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REVISIONS

LTR

DESCRIPTION

Redrawn with changes. Added device types 19 through 22. Added

vendor CAGE 65786 for device types 19 and 20.. Added vendor CAGE

61772 for devices 21 and 22. Corrected errors to Table I. Added pin 1

reference to case outline U. Editorial changes throughout.

DATE

(YR-MO-DA)

93-04-28

APPROVED

M. A. Frye

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

REV

SHEET

PREPARED BY

James E. Jamison

CHECKED BY

Charles Reusing

PMIC N/A

DEFENSE ELECTRONICS SUPPLY CENTER

DAYTON, OHIO 45444

STANDARDIZED

MILITARY

DRAWING

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

APPROVED BY

Michael A. Frye

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1K X 8

DUAL PORT STATIC RANDOM ACCESS MEMORY

(SRAM), MONOLITHIC SILICON

DRAWING APPROVAL DATE

93-06-03

REVISION LEVEL

SIZE

CAGE CODE

AMSC N/A

SHEET

67268

5962-86875

DESC FORM 193

JUL 91

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

5962-E118-93

3.2.4 Block diagram. The block diagram shall be as specified on figure 4.

3.2.5 Die overcoat. Polyimide and silicone coatings are allowable as an overcoat on the die for alpha particle protection only.

Each coated microcircuit inspection lot (see inspection lot as defined in MIL-M-38510) shall be subjected to and pass the internal

moisture content test at 5000 ppm (see method 1018 of MIL-STD-883). The frequency of the internal water vapor testing shall not

be decreased unless approved by the preparing activity. Samples may be pulled any time after seal.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

specified in table I and apply over the full case operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests

for each subgroup are described in table I.

3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the part number

listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-BUL-103 (see 6.6 herein).

3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an

approved source of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-EC prior to listing as

an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-STD-883 (see 3.1 herein)

and the requirements herein.

3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with

each lot of microcircuits delivered to this drawing.

3.8 Notification of change. Notification of change to DESC-EC shall be required in accordance with MIL-STD-883 (see 3.1

herein).

3.9 Verification and review. DESC, DESC's agent, and the acquiring activity retain the option to review the manufacturer's facility

and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer.

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the

extent specified in MIL-STD-883 (see 3.1 herein).

4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices

prior to quality conformance inspection. The following additional criteria shall apply:

Burn-in test, method 1015 of MIL-STD-883.

(1)

Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,

outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of

MIL-STD-883.

= +125

C, minimum.

(2)

Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests

prior to burn-in are optional at the discretion of the manufacturer.

4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883

including groups A, B, C, and D inspections. The following additional criteria shall apply.

SIZE

STANDARDIZED

MILITARY DRAWING

DEFENSE ELECTRONICS SUPPLY CENTER

DAYTON, OHIO 45444

DESC FORM 193A

JUL 91

REVISION LEVEL

5962-86875

SHEET

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