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FLL21E090IK

Description
RF Power Field-Effect Transistor, 1-Element, L Band, Gallium Arsenide, N-Channel, Junction FET, HERMETIC SEALED, METAL CERAMIC, IK, 2-PIN
CategoryDiscrete semiconductor    The transistor   
File Size329KB,6 Pages
ManufacturerSUMITOMO
Websitehttps://global-sei.com/
Environmental Compliance
Download Datasheet Parametric View All

FLL21E090IK Overview

RF Power Field-Effect Transistor, 1-Element, L Band, Gallium Arsenide, N-Channel, Junction FET, HERMETIC SEALED, METAL CERAMIC, IK, 2-PIN

FLL21E090IK Parametric

Parameter NameAttribute value
Is it lead-free?Lead free
Is it Rohs certified?conform to
MakerSUMITOMO
package instructionFLANGE MOUNT, R-CDFM-F2
Contacts2
Reach Compliance Codeunknown
ECCN codeEAR99
Other featuresHIGH RELIABILITY
Shell connectionSOURCE
ConfigurationSINGLE
Minimum drain-source breakdown voltage28 V
FET technologyJUNCTION
highest frequency bandL BAND
JESD-30 codeR-CDFM-F2
Number of components1
Number of terminals2
Operating modeDEPLETION MODE
Package body materialCERAMIC, METAL-SEALED COFIRED
Package shapeRECTANGULAR
Package formFLANGE MOUNT
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Polarity/channel typeN-CHANNEL
Certification statusNot Qualified
surface mountYES
Terminal formFLAT
Terminal locationDUAL
Maximum time at peak reflow temperatureNOT SPECIFIED
transistor applicationsAMPLIFIER
Transistor component materialsGALLIUM ARSENIDE
FLL21E090IK
FEATURES
High Voltage - High Power GaAs FET
・High
Voltage Operation : VDS=28V
・High
Gain: 15dB(typ.) at Pout=43dBm(Avg.)
・Broad
Frequency Range : 2100 to 2200MHz
・Proven
Reliability
DESCRIPTION
The FLL21E090IK is a high power GaAs FET that offers high efficiency,
ease of matching, greater consistency and broad bandwidth for high
power L-band amplifiers. This device is targeted for high voltage, low
current operation in digitally modulated base station amplifiers. This
product is ideally suited for W-CDMA base station amplifiers while
offering high gain, long term reliability and ease of use.
ABSOLUTE MAXIMUM RATINGS
Item
Symbol
Drain-Source Voltage
Gate-Source Voltage
Total Power Dissipation
Storage Temperature
Channel Temperature
Condition
Rating
Unit
V
V
W
o
C
o
C
V
DS
32
o
C
     
-3
V
GS   
Tc=25
P
t
125
T
stg
-65 to +175
200
T
ch
RECOMMENDED OPERATING CONDITION (Case Temperature Tc=25
o
C)
Item
DC Input Voltage
Forward Gate Current
Reverse Gate Current
Channel Temperature
Symbol
V
DS
I
GF
I
GR
T
ch
Condition
R
G
=2
R
G
=2
Limit
<28
<352
>-31
155
Unit
V
mA
mA
o
C
ELECTRICAL CHARACTERISTICS (Case Temperature Tc=25
o
C)
Item
Symbol Condition
min.
Pinch-Off Voltage
Gate-Source Breakdown Voltage
3rd Order Inter modulation Distortion
Power Gain
Drain Efficiency
Adjacent Channel Leakage Power Ratio
Thermal Resistance
V
p
V
GSO
IM
3
Gp
η
d
ACLR
R
th
V
DS
=5V, I
DS
=150mA
I
GS
=-1.5mA
V
DS
=28V
I
DS(DC)
=700mA
Pout=43dBm(Avg.)
note
Channel to Case
-0.1
-5
-
14.0
-
-
-
Limit
Typ. Max.
-0.2
-35
15.0
26
-36
1.1
-0.5
-30
-
-
-
1.2
Unit
V
V
dBc
dB
%
dBc
o
C /W
Note 1 : IM3 ACLR and Gain test condition as follows:
IM3 & Gain : fo=2.1325GHz, f1=2.1475GHz W-CDMA(3GPP3.4 12-00) BS-1 64ch
non clipping modulation measured over 3.84MHz at fo-15MHz and fI+15MHz.
ACLR : fo=2.1325GHz W-CDMA(3GPP3.4 12-00) BS-1 64ch non clipping modulation,
measured over 3.84MHz at fo+/5MHz.
Edition 1.2
Mar 2004
1
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