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EN29LV010-55NC

Description
Flash, 128KX8, 55ns, PBGA34
Categorystorage    storage   
File Size383KB,36 Pages
ManufacturerEon
Websitehttp://www.essi.com.tw/
Download Datasheet Parametric View All

EN29LV010-55NC Overview

Flash, 128KX8, 55ns, PBGA34

EN29LV010-55NC Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
Objectid109398739
package instructionFBGA, BGA34,6X9,20
Reach Compliance Codeunknown
ECCN codeEAR99
Maximum access time55 ns
command user interfaceYES
Data pollingYES
Durability100000 Write/Erase Cycles
JESD-30 codeR-PBGA-B34
memory density1048576 bit
Memory IC TypeFLASH
memory width8
Number of departments/size8
Number of terminals34
word count131072 words
character code128000
Maximum operating temperature70 °C
Minimum operating temperature
organize128KX8
Package body materialPLASTIC/EPOXY
encapsulated codeFBGA
Encapsulate equivalent codeBGA34,6X9,20
Package shapeRECTANGULAR
Package formGRID ARRAY, FINE PITCH
Parallel/SerialPARALLEL
power supply3/3.3 V
Certification statusNot Qualified
Department size16K
Maximum standby current0.000005 A
Maximum slew rate0.03 mA
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal formBALL
Terminal pitch0.5 mm
Terminal locationBOTTOM
switch bitYES
typeNOR TYPE
EN29LV010
EN29LV010
da0.
1 Megabit (128K x 8-bit ) Uniform Sector,
CMOS 3.0 Volt-only Flash Memory
FEATURES
Single power supply operation
- Full voltage range: 2.7-3.6 volt read and write
operations for battery-powered applications.
- Regulated voltage range: 3.0-3.6 volt read
and write operations for high performance
3.3 volt microprocessors.
High performance
- Full voltage range: access times as fast as 55
ns
- Regulated voltage range: access times as fast
as 45ns
Low power consumption (typical values at 5
MHz)
- 7 mA typical active read current
- 15 mA typical program/erase current
- 1
μA
typical standby current (standard access
time to active mode)
-
-
-
-
Flexible Sector Architecture:
Eight 16 Kbyte sectors
Supports full chip erase
Individual sector erase supported
Sector protection and unprotection:
Hardware locking of sectors to prevent
program or erase operations within individual
sectors
High performance program/erase speed
- Byte program time: 8µs typical
- Sector erase time: 500ms typical
JEDEC Standard program and erase
commands
JEDEC standard
DATA
polling and toggle bits
feature
Single Sector and Chip Erase
Embedded Erase and Program Algorithms
Erase Suspend / Resume modes:
Read or program another Sector during
Erase Suspend Mode
triple-metal double-poly triple-well CMOS Flash
Technology
Low Vcc write inhibit < 2.5V
>100K program/erase endurance cycle
Package options
- 4mm x 6mm 34-ball WFBGA
- 8mm x 20mm 32-pin TSOP (Type 1)
- 8mm x 14mm 32-pin TSOP (Type 1)
- 32-pin PLCC
Commercial and industrial Temperature Range
GENERAL DESCRIPTION
The EN29LV010 is a 1-Megabit, electrically erasable, read/write non-volatile flash memory,
organized as 131,072 bytes. Any byte can be programmed typically in 8µs.The EN29LV010
features 3.0V voltage read and write operation, with access times as fast as 45ns to eliminate the
need for WAIT states in high-performance microprocessor systems.
The EN29LV010 has separate Output Enable (
OE
), Chip Enable (
CE
), and Write Enable (WE)
controls, which eliminate bus contention issues. This device is designed to allow either single Sector
or full chip erase operation, where each Sector can be individually protected against program/erase
operations or temporarily unprotected to erase or program. The device can sustain a minimum of
100K program/erase cycles on each Sector.
This Data Sheet may be revised by subsequent versions
1
or modifications due to changes in technical specifications.
©2003 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. C, Issue Date: 2008/04/23

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