Changes to Table 6.......................................................................... 17
Changes to Figure 27...................................................................... 18
Change to Figure 31 ....................................................................... 19
Change to Battery Measurement Input Section ......................... 19
Changes to Table 7.......................................................................... 21
Changes to Equations in Fan Speed Measurement Section...... 26
Change to Chassis Intrusion Input Section ................................ 27
Changes to Reset Input and Outputs Section ............................. 31
Changes to Software Reset Function Section ............................. 34
Changes to Ordering Guide .......................................................... 55
5/02—Revision 0: Initial Version
Rev. A | Page 2 of 56
ADM1026
SPECIFICATIONS
1, 2, 3
Table 1. T
A
= T
MIN
to T
MAX
, V
CC
= V
MIN
to V
MAX
, unless otherwise noted.
Parameter
POWER SUPPLY
Supply Voltage, 3.3 V STBY, 3.3 V MAIN
Supply Current, I
CC
TEMPERATURE-TO-DIGITAL CONVERTER
Internal Sensor Accuracy
Resolution
External Diode Sensor Accuracy
Resolution
Remote Sensor Source Current
ANALOG-TO-DIGITAL CONVERTER (including MUX and attenuators)
Total Unadjusted Error (TUE)
4
Differential Nonlinearity (DNL)
Power Supply Sensitivity
Conversion Time (Analog Input or Internal Temperature)
5
Conversion Time (External Temperature)
5
Input Resistance (+5 V
IN
, V
CCP
, A
IN0
− A
IN5
)
Input Resistance of +12 V
IN
pin
Input Resistance of −12 V
IN
pin
Input Resistance (A
IN6
− A
IN9
)
Input Resistance of V
BAT
pin
4
V
BAT
Current Drain (when measured)
V
BAT
Current Drain (when not measured)
ANALOG OUTPUT (DAC)
Output Voltage Range
Total Unadjusted Error (TUE)
Zero Error
Differential Nonlinearity (DNL)
Integral Nonlinearity
Output Source Current
Output Sink Current
REFERENCE OUTPUT
Output Voltage
Output Voltage
Load Regulation (I
SINK
= 2 mA)
Load Regulation (I
SOURCE
= 2 mA)
Short Circuit Current
Output Current Source
Output Current Sink
FAN RPM-TO-DIGITAL CONVERTER
6
Accuracy
Full-Scale Count
FAN0 to FAN7 Nominal Input RPM
5
Min
3.0
Typ
3.3
2.5
Max
5.5
4.0
±3
±1
±3
±1
90
5.5
±2
±1
±0.1
11.38
34.13
100
100
10
100
80
6
0–2.5
±5
1
±1
±0.5
2
1
1.8
2.47
1.82
2.50
0.15
0.15
25
2
2
1.84
2.53
Bit 2 of Register 07h = 0
Bit 2 of Register 07h = 1
I
L
= 2 mA
No load
Monotonic by design
12.06
36.18
120
115
12
120
100
0°C < T
D
< 100°C
High level
Low level
Test Conditions/Comments
Unit
V
mA
°C
°C
°C
°C
µA
µA
%
LSB
%/V
ms
ms
kΩ
kΩ
kΩ
MΩ
kΩ
nA
nA
V
%
LSB
LSB
LSB
mA
mA
V
V
%
%
mA
mA
mA
%
Divisor = 1, fan count = 153
Divisor = 2, fan count = 153
Divisor = 4, fan count = 153
Divisor = 8, fan count = 153
25
I
OUT
= 3.0 mA, V
CC
= 3.3 V
RPM
RPM
RPM
RPM
kHz
V
Interface inactive, ADC active
80
70
8
5
80
CR2032 battery life >10 years
V
CC
= 3.3 V
±12
255
8800
4400
2200
1100
22.5
Internal Clock Frequency
OPEN DRAIN O/Ps, PWM, GPIO0 to 16
Output High Voltage, V
OH
20
2.4
Rev. A | Page 3 of 56
ADM1026
Parameter
High Level Output Leakage Current, I
OH
Output Low Voltage, V
OL
PWM Output Frequency
DIGITAL OUTPUTS (INT, RESETMAIN, RESETBY)
Output Low Voltage, V
OL
RESET Pulse Width
OPEN DRAIN SERIAL DATABUS OUTPUT (SDA)
Output Low Voltage, V
OL
High Level Output Leakage Current, I
OH
SERIAL BUS DIGITAL INPUTS (SCL, SDA)
Input High Voltage, V
IH
Input Low Voltage, V
IL
Hysteresis
DIGITAL INPUT LOGIC LEVELS (ADD, CI, FAN 0 to 7, GPIO 0 to 16)
7, 8
Input High Voltage, V
IH
Input Low Voltage, V
IL
Hysteresis (Fan 0 to 7)
RESETMAIN, RESETSTBY
RESETMAIN Threshold
RESETSBY Threshold
RESETMAIN Hysteresis
RESETSTBY Hysteresis
DIGITAL INPUT CURRENT
Input High Current, I
IH
Input Low Current, I
IL
Input Capacitance, C
IN
EEPROM RELIABILITY
Endurance
9
Data Retention
10
SERIAL BUS TIMING
Clock Frequency, f
SCLK
Glitch Immunity, t
SW
Bus Free Time, t
BUF
Start Setup Time, t
SU; STA
Start Hold Time, t
HD; STA
SCL Low Time, t
LOW
SCL High Time, t
HIGH
SCL, SDA Rise Time, t
r
SCL, SDA Fall Time, t
f
Data Setup Time, t
SU; DAT
Data Hold Time, t
HD; DAT
Min
Typ
0.1
75
0.4
240
0.4
1
I
OUT
= −3.0 mA, V
CC
= 3.3 V
Max
1
0.4
Test Conditions/Comments
V
OUT
= V
CC
I
OUT
= −3.0 mA, V
CC
= 3.3 V
Unit
µA
V
Hz
V
ms
V
µA
V
V
mV
V
CC
= 3.3 V
V
CC
= 3.3 V
V
CC
= 3.3 V
2.97
3.10
Falling voltage
Falling voltage
V
V
mV
V
V
mV
mV
µA
µA
pF
kcycles
Years
See Figure 2 for all parameters.
400
50
4.7
4.7
4
4.7
4
1000
300
250
300
kHz
ns
µs
µs
µs
µs
µs
ns
ns
ns
ns
140
180
0.1
2.2
I
OUT
= –3.0 mA, V
CC
= 3.3 V
V
OUT
= V
CC
0.8
500
2.4
0.8
250
2.89
3.01
2.94
3.05
60
70
–1
1
20
100
10
700
V
IN
= V
CC
V
IN
= 0
1
2
All voltages are measured with respect to GND, unless otherwise specified.
Typicals are at T
A
= 25°C and represent the most likely parametric norm. Shutdown current typ is measured with V
CC
= 3.3 V.
3
Timing specifications are tested at logic levels of V
IL
= 0.8 V for a falling edge and V
IH
= 2.1 V for a rising edge.
4
Total unadjusted error (TUE) includes offset, gain, and linearity errors of the ADC, multiplexer, and on-chip input attenuators. V
BAT
is accurate only for V
BAT
voltages
greater than 1.5 V (see Figure 15).
5
Total analog monitoring cycle time is nominally 273 ms, made up of 18 ms × 11.38 ms measurements on analog input and internal temperature channels, and
2 ms × 34.13 ms measurements on external temperature channels.
6
The total fan count is based on two pulses per revolution of the fan tachometer output. The total fan monitoring time depends on the number of fans connected and
the fan speed. See the Fan Speed Measurement section for more details.
7
ADD is a three-state input that may be pulled high, low, or left open-circuit.
8
Logic inputs accept input high voltages up to 5 V even when device is operating at supply voltages below 5 V.
9
Endurance is qualified to 100,000 cycles as per JEDEC Std. 22 method A117, and measured at −40°C, +25°C, and +85°C. Typical endurance at +25°C is 700,000 cycles.
10
Retention lifetime equivalent at junction temperature (T
J
) = 55°C as per JEDEC Std. 22 method A117. Retention lifetime based on an activation energy of 0.6 V
derates with junction temperature as shown in Figure 16.
Rev. A | Page 4 of 56
ADM1026
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Positive Supply Voltage (V
CC
)
Voltage on +12 V V
IN
Pin
Voltage on −12 V V
IN
Pin
Voltage on Analog Pins
Voltage on Open Drain Digital Pins
Input Current at any Pin
Package Input Current
Maximum Junction Temperature (T
J MAX
)
Storage Temperature Range
Lead Temperature, Soldering
Vapor Phase (60 sec)
Infrared (15 sec)
ESD Rating, −12 V
IN
Pin
ESD Rating, All Other Pins
Rating
6.5 V
+20 V
−20 V
−0.3 V to (V
CC
+ 0.3 V)
−0.3 V to +6.5 V
±5 mA
±20 mA
150°C
−65°C to +150°C
215°C
200°C
1000 V
2000 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
•
•
48-Lead LQFP package
θ
JA
= 50°C/W, θ
JC
= 10°C/W
t
LOW
t
R
SCL
t
F
t
HD; STA
t
HD; STA
t
HD; DAT
t
HIGH
t
SU; DAT
t
SU; STA
t
SU; STO
t
BUF
P
S
S
P
Figure 2. Serial Bus Timing Diagram
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
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