EEWORLDEEWORLDEEWORLD

Part Number

Search

HN7G05FU

Description
power management switch applications, inverter circuit
CategoryDiscrete semiconductor    The transistor   
File Size430KB,6 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Download Datasheet Parametric View All

HN7G05FU Overview

power management switch applications, inverter circuit

HN7G05FU Parametric

Parameter NameAttribute value
MakerToshiba Semiconductor
package instruction2-2J1E, US6, 6 PIN
Contacts6
Reach Compliance Codeunknow
Other featuresBUILT-IN RESISTOR RATIO 1
Maximum collector current (IC)0.1 A
Collector-emitter maximum voltage50 V
ConfigurationSINGLE WITH BUILT-IN FET AND DIODE
Minimum DC current gain (hFE)30
JESD-30 codeR-PDSO-G6
Number of components1
Number of terminals6
Maximum operating temperature150 °C
Package body materialPLASTIC/EPOXY
Package shapeRECTANGULAR
Package formSMALL OUTLINE
Polarity/channel typePNP
Certification statusNot Qualified
surface mountYES
Terminal formGULL WING
Terminal locationDUAL
Transistor component materialsSILICON
HN7G05FU
TOSHIBA Multichip Discrete Device
HN7G05FU
Power Management Switch Applications, Inverter Circuit
Applications, Driver Circuit Applications and Interface
Circuit Applications
Unit: mm
Q1 (transistor): RN2301 equivalent
Q2 (MOSFET): 2SK1830 equivalent
Q1 (Transistor) Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Symbol
V
CBO
V
CEO
V
EBO
I
C
Rating
−50
−50
−10
−100
Unit
V
V
V
mA
JEDEC
2-2J1E
Q2 (MOSFET) Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Drain-source voltage
Gate-source voltage
Drain current
Symbol
V
DS
V
GSS
I
D
Rating
20
10
50
Unit
V
V
mA
JEITA
TOSHIBA
Weight: 0.0068 g (typ.)
Marking
Q1, Q2 Common Ratings
(Ta = 25°C)
Characteristic
Power dissipation
Junction temperature
Storage temperature range
Symbol
P (Note 1)
T
j
T
stg
Rating
200
150
−55~150
Unit
mW
°C
°C
60
Note:
Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba
Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure rate,
etc).
Equivalent Circuit
(top view)
6
5
4
Q1
Q2
1
2
3
Note 1: Total rating
1
2007-11-01

Technical ResourceMore

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 884  591  1204  1818  2281  18  12  25  37  46 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号