XE42 - 200 Series (HCACMOS), 5 V
High Reliability Hybrid Microcircuit Crystal Oscillators
Surface Mount “Formed Leads” Package
#4
#3
Features
•
•
•
•
•
•
•
•
Ruggedized 4 Point Crystal Mount
Tristate Output Option
Radiation Tolerant to 10K Rads
Low Profile Surface Mount, 0.165” Max. Height
100% Screening Options
Low Phase Noise
Hermetically Sealed, Ceramic Package
ECCN: EAR99
Marking
#1
.200 + .005
(5.08 + .13)
#2
.290 + .005
(7.4 + .13)
.055
( 1.4 )
Typ.
.165 Max
(4.19)
Applications
•
•
•
•
•
High Shock & Vibration Applications
Navigation Systems
Aerospace Instrumentation
Benign Space Applications
Gun Launched Munitions
.130
(3.3)
.018 + .003
(.46 + .08)
.350 + .005
(8.89 + .13)
.070
(1.78)
.050
(1.27)
Typ.
.008 + .001
(.20 + .03)
Dimensions: Inches (mm)
LEAD#
1
FUNCTION
E/D (Optional)
GND/CASE
OUTPUT
VDD
Package Specifications & Outline:
•
•
•
•
•
•
Package : Ceramic 90% AL
2
O
3
Seal: Hermetic – Resistance Welded
Weight: 0.5 Gms typical, 0.6 Gms Max.
o
Thermal Resistance, Junction to Case ( θ
JC
): 30 C / Watt
o
Solder Reflow, Temp./Time: 260 C, 10 Secs. Max.
Lead Material & Finish: Kovar, 50 to 80 μ inches gold
over 100 to 250 μ inches Nickel
Typical PCB
Layout
.345
(8.76)
2
3
4
.200
(5.08)
E/D ( Enable/Disable ) Input:
A “Low”
level at the input disables the Output
into a high impedance state.
E/D
Input has internal pull-up. It can
be left floating or connected to Vdd.
Hot Solder Tinning per MIL-PRF-55310 is optional at additional cost.
Contact Xsis Electronics
at xsis@xsis.com for any special requirements.
ORDERING INFORMATION
( Please build your part number from options below ) :
P/N EXAMPLE:
5.0 V HCACMOS, + 50 PPM over -55 C to +125 C,
XE42 - 243G - M - 24.000 MHz =
Tristate Output, 883B Screening and 24.000 MHz
o
o
XE42 ‒ 2
Model #
4
3
G
M
24.000 MHz
Output Frequency
Frequency Stability
Options
1 = + 0.1%
2 = + 500 PPM
3
4
5
6
7
=
=
=
=
=
+ 100 PPM
+ 50 PPM
+ 20 PPM *
+ 10 PPM *
+ 25 PPM *
100% Screening Options
Operating Temp. Range
Options
1
2
3
4
5
6
=
=
=
=
=
=
0 C
- 40
o
C
- 55
o
C
- 55
o
C
- 40
o
C
- 20
o
C
o
to + 70 C
to + 85
o
C
to +125
o
C
to +105
o
C
to + 95
o
C
to + 70
o
C
o
Tristate Options
G
= Tristate
Blank = No Tristate
M
= 883B Screening
H
= HI-REL Screening
Blank = No Screening
883B Screening
is same as
MIL-PRF-55310 Class B Screening
HI-REL Screening
is similar to
MIL-PRF-55310 Class S Screening
Rev 09 /15
* Frequency Stability Options 5, 6 & 7 are not
available for all operating temperature ranges.
Page 1 of 4
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
XE42 - 200 Series (HCACMOS), 5 V
High Reliability Hybrid Microcircuit Crystal Oscillators
Surface Mount “Formed Leads” Package
Electrical Specifications:
Parameter
Output Frequency Range
Frequency Accuracy at +25
o
C
Frequency Stability Vs Temperature
Operating Temperature Range
Supply Voltage (Vdd)
450 KHz
5 MHz
20 MHz
40 MHz
60 MHz
-
-
-
-
-
Specification Limits
450 KHz - 100 MHz
+ 15 PPM
See Ordering Information on Page 1
See Ordering Information on Page 1
+ 5 VDC + 10%
< 5 MHz
< 20 MHz
< 40 MHz
< 60 MHz
100 MHz
10 mA
20 mA
30 mA
40 mA
60 mA
Max.
Max.
Max.
Max.
Max.
Input Current (no Load )
Output Waveform
Square Wave, HC/ACMOS Compatible
< 40 MHz 55/45% Max.
> 40 MHz 60/40% Max.
0.9 Vdd Min.
0.1 Vdd Max.
10K // 15 pF
50 pF Max. for <50 MH
< 30 MHz 6 nS Max.
> 30 MHz 3 nS Max.
( 10% to 90% Output Levels)
E/D Input > 3.5V or Open : Normal Output
E/D Input < 0.8V: High Impedance
5 mS Max.
0.15 pS rms Typical
+ 4 PPM Max. for + 10% change in Supply Voltage
+ 3 PPM Max. first year, + 2 PPM Max. per year thereafter
+ 7 VDC
-65
o
C to +125
o
C
Output Duty Cycle
( at 50% Output Level )
Output High Level
Output Low Level
Output Load
Rise & Fall Times ( Typical Load )
Enable/Disable ( E/D)
Start-Up Time
Phase Jitter
( 10 KHz - 20 MHz Integ.)
Freq. Stability Vs Supply Voltage
Aging at 70
o
C
Absolute Maximum Applied Voltage
Storage Temperature
For special requirements, such as, tighter output symmetry, faster start-up time, PIND screening, etc.,
please contact Xsis Electronics at xsis@xsis.com or call us at 913-631-0448.
Rev 09 /15
Page 2 of 4
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
XE42 - 200 Series (HCACMOS), 5 V
High Reliability Hybrid Microcircuit Crystal Oscillators
Surface Mount “Formed Leads” Package
Packaging:
Standard packaging is in ESD protective enclosed tray. Tape & Reel ( See Page 5 ) is available at additional cost.
Thermal Characteristics:
Junction to case Thermal Constant ( θ
JC
): 30 C / Watt
o
Junction to Ambient ( Device floating in free air) Thermal Constant ( θ
JA
): 128 C / Watt
o
Hi-Rel Screening:
When HI-REL option is selected, Xsis Oscillators are subjected to 100% screening similar to Class “S” screening in accordance
with MIL-PRF-55310. Refer to www.xsis.com for additional details about HI-REL screening.
Typical Phase Noise (dbc/Hz):
Output Frequency
10 MHz
25 MHz
50 MHz
96 MHz
110 MHz
10 Hz
-109
-100
-89
-80
-75
100 Hz
-140
-127
-117
-107
-102
1 KHz
-157
-151
-148
-139
-130
10 KHz
-162
-158
-157
-151
-142
100 KHz
-163
-160
-159
-156
-149
1 MHz
-164
-162
-160
-158
-153
Environmental Specifications:
XE42-200 series oscillators are designed to meet or exceed the Environmental tests specified below. Customized screening
and environmental testing are also available to meet your special requirements.
Test
Vibration
Shock
Temperature Cycling
Thermal Shock
Seal ( Fine and Gross )
Burn-in
Frequency Aging
Altitude
Constant Acceleration
Moisture Resistance
Solderability
Resistance to Soldering Heat
Resistance to Solvents
Internal Water Vapor Content
ESD Classification
Moisture Sensitivity Level
Test Conditions
0.06” DA, 30 G peak, 10 - 2000 Hz, MIL-STD-202, Method 204, Cond. G
1500 G, 0.5 mS, half-Sine, MIL-STD-883, Method 2002, Cond. B
MIL-STD-883, Method 1010, Cond. C
MIL-STD-202, Method 107, Cond. B
MIL-STD-883, Method 1014 Cond. A & C
160 Hours, 125 C, Nominal Supply Voltage & Load
30 days at 70 C, + 1.5 PPM Max.
MIL-STD-202, Method 105, Cond. C
MIL-STD-883, Method 2001, 5000 G
MIL-STD-202, Method 106, Vibration Sub Cycle Omitted
MIL-STD-202, Method 208
MIL-STD-202, Method 210, Cond B. or C as applicable
MIL-STD-202, Method 215
MIL-STD-883, Method 1018
MIL-STD-883, Method 3015, Class 1C, HBM 1000 to 1999
J-STD-020, MSL=1
o
o
Rev 09 /15
Page 3 of 4
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
XE42 - 200 Series (HCACMOS), 5 V
High Reliability Hybrid Microcircuit Crystal Oscillators
Surface Mount “Formed Leads” Package
HCMOS Test Circuit
MA
4
3
HCMOS Output Waveform
OUTPUT
T
R
T
F
High Level
0.9 VDD
Power
Supply
DVM
C
DUT
1
2
15 pF
10 K
50% Level
GND
C = .01 OR .1 uF
E/D Input
0.1 VDD
Low Level
0 VDC
T
H
E/D ( Enable/Disable ) Input
has an internal pull-up
resistor. It can be left floating or connected to Vdd.
Symmetry =
T
T
H
T
x 100 %
Typical Freq. Stability Vs. Temperature
50
40
Tape & Reel Data for XE42 parts
FEEDING DIRECTION
XE42-243-M-10.000 MHz
0.3
1.75 + 0.1
2.0 + 0.1
4.0 + 0.1
Frequency Stability – PPM
30
20
10
0
-10
-20
-30
-40
-50
-60 -50 -40 -30 -20 -10
0
10 20
Ø1.5
11.5
XE42-L43-M
16M00000
Xsis 2515
9.60
24.0
4.7
10.30
Ø1.5
Ø13.0 + 0.5
16.0
26.0
Temperature
30 40 50 60 70 80
o
-
C
90 100 110 120 130
2.5
Typical Solder Reflow Profile
280
260
240
220
200
240 TO 250
O
C Typ.
Ramp Up 3
O
C/Sec. Max.
Ramp Down
6
O
C/Sec. Max.
183
O
C
60 to 150 Secs
120
O
Ø178 + 1
Temperature -
o
C
180
160
140
120
100
80
60
40
20
0
0 20 40 60 80 100 120 140 160 180 200 220 240 260 280 300 320 340 360 380 400 420
2.0
Dimensions are in mm.
60 to 120 Secs
Tape is EIA-481-A Compliant.
Time - Seconds
Rev 09 /15
Page 4 of 4
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
FPGA/CPLD
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