• TEMPERATURE COMPENSATED ZENER REFERENCE DIODES
• LEADLESS PACKAGE FOR SURFACE MOUNT
• 12.8 VOLT NOMINAL ZENER VOLTAGE + 5%
• LOW NOISE
• METALLURGICALLY BONDED
• DOUBLE PLUG CONSTRUCTION
MAXIMUM RATINGS
Operating Temperature: -65°C to +175°C
Storage Temperature: -65°C to +175°C
DC Power Dissipation: 500mW @ +50°C
Power Derating: 4 mW / °C above +50°C
CDLL4896
thru
CDLL4915A
REVERSE LEAKAGE CURRENT
l
R
= 15
µ
A @ 25°C & V
R
= 8Vdc
ELECTRICAL CHARACTERISTICS
@ 25°C, unless otherwise specified.
CDI
TYPE
NUMBER
(Note 3)
mA
CDLL4896
CDLL4896A
CDLL4897
CDLL4897A
CDLL4898
CDLL4898A
CDLL4899
CDLL4899A
CDLL4900
CDLL4900A
CDLL4901
CDLL4901A
CDLL4902
CDLL4902A
CDLL4903
CDLL4903A
CDLL4904
CDLL4904A
CDLL4905
CDLL4905A
CDLL4906
CDLL4906A
CDLL4907
CDLL4907A
CDLL4908
CDLL4908A
CDLL4909
CDLL4909A
CDLL4910
CDLL4910A
CDLL4911
CDLL4911A
CDLL4912
CDLL4912A
CDLL4913
CDLL4913A
CDLL4914
CDLL4914A
CDLL4915
CDLL4915A
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
4.0
4.0
4.0
4.0
4.0
4.0
4.0
4.0
7.5
7.5
7.5
7.5
7.5
7.5
7.5
7.5
VOLTAGE
TEMPERATURE
STABILITY
∆V
ZT
(Note 2)
mV
96
198
48
99
19
40
10
20
96
198
48
99
19
40
10
20
96
198
48
99
19
40
10
20
96
198
48
99
19
40
10
20
96
198
48
99
19
40
10
20
EFFECTIVE
TEMPERATURE
COEFFICIENT
MAXIMUM
DYNAMIC
IMPEDANCE
ZZT
(Note 1)
OHMS
400
400
400
400
400
400
400
400
200
200
200
200
200
200
200
200
100
100
100
100
100
100
100
100
50
50
50
50
50
50
50
50
25
25
25
25
25
25
25
25
MAXIMUM
NOISE
DENSITY
ND
TEST
CURRENT
l ZT
TEMPERATURE
RANGE
°C
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
+25 to +100
-55 to +100
%/°C
0.01
0.01
0.005
0.005
0.002
0.002
0.001
0.001
0.01
0.01
0.005
0.005
0.002
0.002
0.001
0.001
0.01
0.01
0.005
0.005
0.002
0.002
0.001
0.001
0.01
0.01
0.005
0.005
0.002
0.002
0.001
0.001
0.01
0.01
0.005
0.005
0.002
0.002
0.001
0.001
µ
V/
0.8
0.8
0.8
0.8
0.8
0.8
0.8
0.8
0.4
0.4
0.4
0.4
0.4
0.4
0.4
0.4
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.22
0.22
0.22
0.22
0.22
0.22
0.22
0.22
0.20
0.20
0.20
0.20
0.20
0.20
0.20
0.20
Hz
DIM
D
F
G
G1
S
MILLIMETERS
INCHES
MIN MAX MIN MAX
1.60
1.70 0.063 0.067
0.41
0.55 0.016 0.022
3.30
3.70 .130 .146
2.54 REF.
.100 REF.
0.03 MIN.
.001 MIN.
FIGURE 1
DESIGN DATA
CASE:
DO-213AA, Hermetically sealed
glass case. (MELF, SOD-80, LL34)
LEAD FINISH:
Tin / Lead
POLARITY:
Diode to be operated with
the banded (cathode) end positive.
MOUNTING POSITION:
Any.
MOUNTING SURFACE SELECTION:
The Axial Coefficient of Expansion
(COE) Of this Device is Approximately
+6PPM/°C. The COE of the Mounting
Surface System Should Be Selected To
Provide A Suitable Match With This
Device.
NOTE 1
NOTE 2
NOTE 3
Zener impedance is derived by superimposing on lZT A 60Hz rms a.c. current equal
to 10% of lZT.
The maximum allowable change observed over the entire temperature range, per
JEDEC standard No.5.
Zener voltage range equals 12.8 volts + 5%.
22 COREY STREET, MELROSE, MASSACHUSETTS 02176
PHONE (781) 665-1071
FAX (781) 665-7379
WEBSITE: http://www.cdi-diodes.com
E-mail: mail@cdi-diodes.com
CDLL4896
1000
500
ZENER IMPEDANCE Z
(OHMS)
ZT
200
100
50
20
10
5
2
1
thru
CDLL4915A
2
4
6
8
10
12
OPERATING CURRENT lZT (mA)
FIGURE 2
ZENER IMPEDANCE VS. OPERATING CURRENT
CHANGE IN TEMPERATURE COEFFICIENT ( %/°C)
CDLL4896 - CDLL4999
+.0015
+.0010
+.0005
0
-.0005
-.0010
-.0015
.2
.4
.6
.8
CDLL4900 - CDLL4903
CDLL4904 - CDLL4907
0.5
1.0
1.5
2.0
1.0
2.0
3.0
4.0
OPERATING CURRENT lZT (mA)
OPERATING CURRENT lZT (mA)
OPERATING CURRENT lZT (mA)
CDLL4908 - CDLL4911
CHANGE IN TEMPERATURE
COEFFICIENT ( %/°C)
+.0015
+.0010
+.0005
0
-.0005
-.0010
-.0015
2
3
4
5
6
OPERATING CURRENT lZT (mA)
CDLL4912 - CDLL4915
6
7
8
9
OPERATING CURRENT lZT (mA)
FIGURE 3
TYPICAL CHANGE OF TEMPERATURE COEFFICIENT
WITH CHANGE IN OPERATING CURRENT
MCU
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