X7R Dielectric
General Specifications
X7R formulations are called “temperature stable” ceramics and
fall into EIA Class II materials. X7R is the most popular of these
intermediate dielectric constant materials. Its temperature
variation of capacitance is within ±15% from -55°C to +125°C.
This capacitance change is non-linear.
Capacitance for X7R varies under the influence of electrical
operating con-ditions such as voltage and frequency.
X7R dielectric chip usage covers the broad spectrum of
industrial applications where known changes in capacitance
due to applied voltages are acceptable.
PART NUMBER (see page 2 for complete part number explanation)
0805
Size
(L” x W”)
5
Voltage
4V = 4
6.3V = 6
10V = Z
16V = Y
25V = 3
50V = 5
100V = 1
200V = 2
500V = 7
C
Dielectric
X7R = C
103
Capacitance
Code (In pF)
2 Sig. Digits +
Number of Zeros
M
Capacitance
Tolerance
J = ± 5%*
K = ±10%
M = ± 20%
*≤1µF only,
contact factory for
additional values
A
Failure
Rate
A = Not
Applicable
T
Terminations
T = Plated Ni and Sn
7 = Gold Plated*
Z= FLEXITERM®**
*Optional termination
**See FLEXITERM®
X7R section
2
Packaging
2 = 7” Reel
4 = 13” Reel
Contact
Factory For
Multiples
A
Special
Code
A = Std.
Product
NOTE: Contact factory for availability of Termination and Tolerance Options for Specific Part Numbers.
Contact factory for non-specified capacitance values.
042718
19
19
X7R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
X7R Specification Limits
-55ºC to +125ºC
Within specified tolerance
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Contact Factory for DF by PN
100,000MΩ or 1000MΩ - µF,
whichever is less
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10µF, 05Vrm @ 120Hz
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Charge device with 250% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Deflection: 2mm
Test Time: 30 seconds
Insulation Resistance
Dielectric Strength
No breakdown or visual defects
Resistance to
Flexure
Stresses
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
No defects
≤ ±12%
Meets Initial Values (As Above)
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
Solderability
Appearance
Capacitance
Variation
Resistance to
Solder Heat
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Thermal
Shock
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Load Life
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load
Humidity
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Dip device in eutectic solder at 260ºC for 60seconds. Store
at room temperature for 24 ± 2hours before
measuring electrical properties.
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC for 1000 hours (+48,
-0)
If RV > 10V then Life Test voltage will be 2xRV but
there are exceptions (please contact AVX for further
details on exceptions)
Remove from test chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at room
temperature and humidity for
24 ± 2 hours before measuring.
20
051319
NXP MCU
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