MQ Series – Medical Grade MLCC
General Specifications
GENERAL DESCRIPTION
AVX offers a wide variety of medically qualified passive components.
Medical devices require the utmost reliability with respect to the
components incorporated into the designs. Advanced design
qualification requirements, in-process controls and requirements and
lot acceptance testing are implemented to ensure these components
will meet the superior reliability levels of a life supporting application.
AVX medical MLCC reliability documents provide an advanced level
of designing, manufacturing, testing and qualification that places AVX
as the top supplier and industry leader of medically qualified MLCCs.
AVX MQ series of medically qualified ceramic capacitors are available
in EIA case sizes ranging from 0402 to 2225, at typical voltage
ratings between 4 – 200 Vdc with various termination options
including Sn, SnPb solder, and Au.
APPLICATIONS
• Implantable cardioverter-defibrillator (ICD)
• Pacemakers
• Neuromodulation
FEATURES
• 0402 to 2225 case sizes
• Voltage range from 4v to 100v
• Capacitance up to 100μF
• Class I & II dielectric materials
• Tight tolerances on Class I dielectric materials
• Various terminations
• Customer specific requirements, screening, & testing
HOW TO ORDER
MQ02
Size
MQ02 = 0402
MQ03 = 0603
MQ05 = 0805
MQ06 = 1206
MQ10 = 1210
MQ12 = 1812
MQ13 = 1825
MQ14 = 2225
Z
Rated
Voltage
4 = 4V
6 = 6.3V
Z = 10V
Y = 16v
3 = 25V
5 = 50V
1 = 100V
A
Dielectric
Code
A = NP0 (C0G)
C = X7R
Z = X7S
D = X5R
100
Capacitance
Code (In pF)
(2 significant
digits + number
of zeros)
for values <10pF:
letter R denotes
decimal point.
Example:
68pF = 680
8.2pF = 8R2
J
Capacitance
Tolerance
B = ±0.1pF
C = ±0.25pF
D = ±0.5pF
F = ±1% (≥10pF)
G = ±2% (≥10pF)
J = ±5%
K = ±10%
M = ±20%
N = ±30%
G
Medical
Grade
T
Termination
Finish
T = Plated Ni & Sn
J = 60/40 Sn/Pb
B = 5% min Pb
Plated Solder
7 = Gold Plated
3
Packaging
1 = 7" Reel
2 = 7" Reel
(0402 only)
3 = 13" Reel
4 = 13" Reel
(0402 only)
6 = Waffle
A
Special
Code
A = Standard
Contact AVX
for others
050516
113
MQ Series – Medical Grade MLCC
NP0 (C0G) – General Specifications
TYPICAL ELECTRICAL CHARACTERISTICS
Temperature Coefficient
Capacitance vs. Frequency
Capacitance
Capacitance
%
Typical Capacitance Change
Envelope: 0
±
30 ppm/°C
+2
+1
0
-1
-2
+0.5
0
-0.5
%
-55 -35 -15 +5 +25 +45 +65 +85 +105 +125
1KHz
10 KHz
100 KHz
1 MHz
10 MHz
Temperature
°C
Frequency
Insulation Resistance (Ohm-Farads)
Insulation Resistance
Insulation Resistance
vs. Temperature
vs Temperature
10,000
Variation of Impedance with Cap Value
Impedance vs. Frequency
0805 - C0G (NP0)
10 pF vs. 100 pF vs. 1000 pF
p
p
p
100,000
10,000
Impedance,
1,000
1,000
100
10.0
10 pF
100
1.0
0.1
100 pF
1000 pF
1
10
100
1000
0
0
20
40
60
80
100
Frequency, MHz
Temperature
°C
Variation of Impedance with Chip Size
Impedance vs. Frequency
1000 pF - C0G (NP0)
10
1206
0805
1812
1210
1.0
Variation of Impedance with Ceramic Formulation
Impedance vs. Frequency
1000 pF - C0G (NP0) vs. X7R
0805
10.00
X7R
NPO
Impedance,
Impedance,
1.00
0.10
0.1
10
100
1000
0.01
10
100
1000
Frequency, MHz
Frequency, MHz
050516
115
MQ Series – Medical Grade MLCC
NP0 (C0G) – Specifications & Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Q
Insulation Resistance
Dielectric Strength
Appearance
Capacitance
Variation
Q
Insulation
Resistance
Solderability
Appearance
Capacitance
Variation
Q
Insulation
Resistance
Appearance
Capacitance
Variation
Thermal
Shock
Q
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Q
Insulation
Resistance
Dielectric
Strength
Appearance
Load
Humidity
Insulation
Resistance
NP0 Specification Limits
-55ºC to +125ºC
Within specified tolerance
<30 pF: Q≥ 400+20 x Cap Value
≥30 pF: Q≥ 1000
100,000MΩ or 1000MΩ - μF,
whichever is less
No breakdown or visual defects
No defects
±5% or ±.5 pF, whichever is greater
Meets Initial Values (As Above)
≥ Initial Value x 0.3
≥ 85% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
≤ ±2.5% or ±.25 pF, whichever is greater
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±3.0% or ±.0.3 pF, whichever is greater
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±3.0% or ± 0.3 pF, whichever is greater
≥ 30 pF:
≥10 pF, <30 pF:
<10 pF:
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
Load in test chamber set at 125°C ± 2°C
for 1000 hours (+48, -0)
with twice rated voltage applied.
Remove from test chamber and stabilize at room
temperature before measuring.
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
MIL-STD-202 / Method 210 / Condition J
(Reflow Mounting plus 1 Reflow Cycle
@ 235°C ± 5°C)
90 mm
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
1.0 kHz ± 10% for cap > 1000 pF
Voltage: 1.0Vrms ± .2V
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Charge device with 250% of rated voltage for
1-5 seconds, with charge and discharge
current limited to 50 mA (max)
Deflection: 2mm
Test Time: 30 seconds
1mm/sec
Resistance to
Flexure
Stresses
Dip device in eutectic solder at 245 ± 5ºC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Repeat for 5 cycles and measure after
24 hours at room temperature
Load Life
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≥ Initial Value x 0.3 (See Above)
Load in a test chamber set at 85°C ± 2°C/85% ± 5%
relative humidity for 1000 hours (+48, -0) with rated
voltage applied.
Remove from chamber and stabilize at room
temperature before measuring.
116
050516
Talking
京公网安备 11010802033920号
EEWORLD
