MLCC Tin/Lead Termination “B”
X7R –
General Specifications
AVX Corporation will support those customers for commercial and military Multilayer Ceramic Capacitors with
a termination consisting of 5% minimum lead. This termination is indicated by the use of a “B” in the 12th
position of the AVX Catalog Part Number. This fulfills AVX’s commitment to providing a full range of products
to our customers. AVX has provided in the following pages a full range of values that we are currently offering
in this special “B” termination. Please contact the factory if you require additional information on our MLCC Tin/
Lead Termination “B” products.
PART NUMBER (SEE PAGE 4 FOR COMPLETE PART NUMBER EXPLANATION)
LD05
Size
LD03 - 0603
LD04 - 0504*
LD05 - 0805
LD06 - 1206
LD10 - 1210
LD12 - 1812
LD13 - 1825
LD14 - 2225
LD20 - 2220
5
Voltage
6.3V = 6
10V = Z
16V = Y
25V = 3
35V = D
50V = 5
100V = 1
200V = 2
500V = 7
C
Dielectric
X7R = C
101
Capacitance
Code (In pF)
2 Sig. Digits +
Number of
Zeros
J
Capacitance
Tolerance
B = ±.10 pF (<10pF)
C = ±.25 pF (<10pF)
D = ±.50 pF (<10pF)
F = ±1% (≥ 10 pF)
G = ±2% (≥ 10 pF)
J = ±5%
K = ±10%
M = ±20%
A
Failure
Rate
A = Not
Applicable
B
2
A
Special
Code
A = Std.
Product
Terminations
Packaging
B = 5% min lead
2 = 7" Reel
X = FLEXITERM
®
4 = 13" Reel
with 5% min
Contact Factory
lead**
**X7R only
For
Multiples*
*LD04 has the same CV ranges as LD03.
NOTE:
Contact factory for availability of Tolerance Options for Specific Part Numbers.
Contact factory for non-specified capacitance values.
See FLEXITERM
®
section for CV options
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
112916
47
MLCC Tin/Lead Termination “B”
X7R –
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
X7R Specification Limits
-55ºC to +125ºC
Within specified tolerance
≤ 10% for ≥ 50V DC rating
≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
100,000MΩ or 1000MΩ - μF,
whichever is less
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Charge device with 250% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated voltage
for 500V devices.
Deflection: 2mm
Test Time: 30 seconds
Measuring Conditions
Temperature Cycle Chamber
Insulation Resistance
Dielectric Strength
No breakdown or visual defects
Appearance
Resistance to
Flexure
Stresses
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Solderability
Appearance
Capacitance
Variation
Resistance to
Solder Heat
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Thermal Shock
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load Life
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load
Humidity
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
No defects
≤ ±12%
Meets Initial Values (As Above)
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0)
Remove from test chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±
5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at room
temperature and humidity for
24 ± 2 hours before measuring.
48
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
112916
Embedded System
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