74ACQ574, 74ACTQ574 Quiet Series™ Octal D-Type Flip-Flop with 3-STATE Outputs
April 2007
74ACQ574, 74ACTQ574
Quiet Series™ Octal D-Type Flip-Flop with 3-STATE Outputs
Features
■
I
CC
and I
OZ
reduced by 50%
■
Guaranteed simultaneous switching noise level and
■
■
■
■
■
■
tm
General Description
The ACQ/ACTQ574 is a high-speed, low-power octal
D-type flip-flop with a buffered Common Clock (CP) and
a buffered common Output Enable (OE). The information
presented to the D inputs is stored in the flip-flops on the
LOW-to-HIGH clock (CP) transition.
ACQ/ACTQ574 utilizes FACT Quiet Series™ technology
to guarantee quiet output switching and improve
dynamic threshold performance. FACT Quiet Series fea-
tures GTO™ output control and undershoot corrector in
addition to a split ground bus for superior performance.
The ACQ/ACTQ574 is functionally identical to the
ACTQ374 but with different pin-out.
dynamic threshold performance
Guaranteed pin-to-pin skew AC performance
Inputs and outputs on opposite sides of the package
allowing easy interface with microprocessors
Functionally identical to the ACQ/ACTQ374
3-STATE outputs drive bus lines or buffer memory
address registers
Outputs source/sink 24mA
Faster prop delays than the standard AC/ACT574
Ordering Information
Order Number
74ACQ574SC
74ACQ574SJ
74ACTQ574SC
74ACTQ574SJ
Package
Number
M20B
M20D
M20B
M20D
Package Description
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300"
Wide Body
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300"
Wide Body
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Device also available in Tape and Reel. Specify by appending suffix “X” to the ordering number.
Connection Diagram
Pin Descriptions
Pin Names
D
0
–D
7
CP
OE
O
0
–O
7
Data Inputs
Clock Pulse Input
3-STATE Output Enable Input
3-STATE Outputs
Description
FACT™, Quiet Series™, FACT Quiet Series™, and GTO™ are trademarks of Fairchild Semiconductor Corporation.
©1990 Fairchild Semiconductor Corporation
74ACQ574, 74ACTQ574 Rev. 1.3
www.fairchildsemi.com
74ACQ574, 74ACTQ574 Quiet Series™ Octal D-Type Flip-Flop with 3-STATE Outputs
Logic Symbols
Functional Description
The ACQ/ACTQ574 consists of eight edge-triggered
flip-flops with individual D-type inputs and 3-STATE true
outputs. The buffered clock and buffered Output Enable
are common to all flip-flops. The eight flip-flops will store
the state of their individual D-type inputs that meet the
setup and hold time requirements on the LOW-to-HIGH
Clock (CP) transition. With the Output Enable (OE)
LOW, the contents of the eight flip-flops are available at
the outputs. When OE is HIGH, the outputs go to the
high impedance state. Operation of the OE input does
not affect the state of the flip-flops.
IEEE/IEC
Function Table
Inputs
OE CP
H
H
H
H
L
L
L
L
H
H
H
H
Internal
D
L
H
L
H
L
H
L
H
Outputs
O
N
Z
Z
Z
Z
L
H
NC
NC
Q
NC
NC
L
H
L
H
NC
NC
Function
Hold
Hold
Load
Load
Data Available
Data Available
No Change in
Data
No Change in
Data
H
=
HIGH Voltage Level
L
=
LOW Voltage Level
X
=
Immaterial
Z
=
High Impedance
=
LOW-to-HIGH Transition
NC
=
No Change
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to
estimate propagation delays.
Figure 1.
©1990 Fairchild Semiconductor Corporation
74ACQ574, 74ACTQ574 Rev. 1.3
www.fairchildsemi.com
2
74ACQ574, 74ACTQ574 Quiet Series™ Octal D-Type Flip-Flop with 3-STATE Outputs
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
V
CC
I
IK
Supply Voltage
DC Input Diode Current
V
I
=
–0.5V
V
I
=
V
CC
+ 0.5V
V
I
I
OK
DC Input Voltage
DC Output Diode Current
V
O
=
–0.5V
V
O
=
V
CC
+ 0.5V
V
O
I
O
DC Output Voltage
Parameter
Rating
–0.5V to +7.0V
–20mA
+20mA
–0.5V to V
CC
+ 0.5V
–20mA
+20mA
–0.5V to V
CC
+ 0.5V
±50mA
±50mA
–65°C to +150°C
±300mA
140°C
DC Output Source or Sink Current
I
CC
or I
GND
DC V
CC
or Ground Current per Output Pin
T
STG
Storage Temperature
DC Latch-Up Source or Sink Current
T
J
Junction Temperature
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol
V
CC
Supply Voltage
ACQ
ACTQ
V
I
V
O
T
A
∆
V /
∆
t
∆V
/
∆
t
Input Voltage
Output Voltage
Operating Temperature
Parameter
Rating
2.0V to 6.0V
4.5V to 5.5V
0V to V
CC
0V to V
CC
–40°C to +85°C
125mV/ns
125mV/ns
Minimum Input Edge Rate, ACQ Devices:
V
IN
from 30% to 70% of V
CC
, V
CC
@ 3.0V, 4.5V, 5.5V
Minimum Input Edge Rate, ACTQ Devices:
V
IN
from 0.8V to 2.0V, V
CC
@ 4.5V, 5.5V
©1990 Fairchild Semiconductor Corporation
74ACQ574, 74ACTQ574 Rev. 1.3
www.fairchildsemi.com
3
74ACQ574, 74ACTQ574 Quiet Series™ Octal D-Type Flip-Flop with 3-STATE Outputs
DC Electrical Characteristics for ACQ
T
A
=
+25°C T
A
=
–40°C to +85°C
Symbol
V
IH
Parameter
Minimum HIGH Level
Input Voltage
V
CC
(V)
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
Conditions
V
OUT
=
0.1V or
V
CC
– 0.1V
V
OUT
=
0.1V or
V
CC
– 0.1V
I
OUT
=
–50µA
Typ.
1.5
2.25
2.75
1.5
2.25
2.75
2.99
4.49
5.49
2.1
Guaranteed Limits
2.1
3.15
3.85
0.9
1.35
1.65
2.9
4.4
5.4
2.46
3.76
4.76
0.1
0.1
0.1
0.44
0.44
0.44
±1.0
75
–75
4.0
±0.25
40.0
±2.5
3.15
3.85
0.9
1.35
1.65
2.9
4.4
5.4
2.56
3.86
4.86
Units
V
V
IL
Maximum LOW Level
Input Voltage
V
V
OH
Minimum HIGH Level
Output Voltage
V
V
IN
=
V
IL
or V
IH
:
3.0
4.5
5.5
V
OL
Maximum LOW Level
Output Voltage
3.0
4.5
5.5
V
IN
=
V
IL
or V
IH
:
3.0
4.5
5.5
I
IN(3)
I
OLD
I
OHD
I
CC(3)
I
OZ
Maximum Input
Leakage Current
Minimum Dynamic
Output Current
(2)
Maximum Quiescent
Supply Current
Maximum 3-STATE
Leakage Current
Quiet Output Maximum
Dynamic V
OL
Quiet Output Minimum
Dynamic V
OL
Minimum HIGH Level
Dynamic Input Voltage
Maximum LOW Level
Dynamic Input Voltage
5.5
5.5
5.5
5.5
5.5
I
OL
=
12mA
I
OL
=
24mA
I
OL
=
24mA
(1)
V
I
=
V
CC
, GND
V
OLD
=
1.65V Max.
V
OHD
=
3.85V Min.
V
IN
=
V
CC
or GND
V
I
(OE)
=
V
IL
, V
IH
;
V
I
=
V
CC
, GND;
V
O
=
V
CC
, GND
Figures 1 & 2
(4)
Figures 1 & 2
(4)
(5)
I
OH
=
–12mA
I
OH
=
–24mA
I
OH
=
–24mA
(1)
I
OUT
=
50µA
0.002
0.001
0.001
0.1
0.1
0.1
0.36
0.36
0.36
±0.1
V
µA
mA
mA
µA
µA
V
OLP
V
OLV
V
IHD
V
ILD
5.0
5.0
5.0
5.0
1.1
–0.6
3.1
1.9
1.5
–1.2
3.5
1.5
V
V
V
V
(5)
Notes:
1. All outputs loaded; thresholds on input associated with output under test.
2. Maximum test duration 2.0ms, one output loaded at a time.
3. I
IN
and I
CC
@ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V V
CC
.
4. Max number of outputs defined as (n). Data inputs are driven 0V to 5V. One output @ GND.
5. Max number of data inputs (n) switching. (n–1) inputs switching 0V to 5V (ACQ). Input-under-test switching:
5V to threshold (V
ILD
), 0V to threshold (V
IHD
), f
=
1MHz.
©1990 Fairchild Semiconductor Corporation
74ACQ574, 74ACTQ574 Rev. 1.3
www.fairchildsemi.com
4
74ACQ574, 74ACTQ574 Quiet Series™ Octal D-Type Flip-Flop with 3-STATE Outputs
DC Electrical Characteristics for ACTQ
T
A
=
+25°C T
A
=
–40°C to +85°C
Symbol
V
IH
V
IL
V
OH
Parameter
Minimum HIGH Level
Input Voltage
Maximum LOW Level
Input Voltage
Minimum HIGH Level
Output Voltage
V
CC
(V)
4.5
5.5
4.5
5.5
4.5
5.5
Conditions
V
OUT
=
0.1V or
V
CC
– 0.1V
V
OUT
=
0.1V or
V
CC
– 0.1V
I
OUT
=
–50µA
V
IN
=
V
IL
or V
IH
:
Typ.
1.5
1.5
1.5
1.5
4.49
5.49
2.0
2.0
0.8
0.8
4.4
5.4
Guaranteed Limits
2.0
2.0
0.8
0.8
4.4
5.4
3.76
4.76
0.1
0.1
0.44
0.44
±1.0
±2.5
1.5
75
–75
4.0
40.0
Units
V
V
V
4.5
5.5
V
OL
Maximum LOW Level
Output Voltage
4.5
5.5
I
OH
=
–24mA
I
OH
=
–24mA
(6)
I
OUT
=
50µA
V
IN
=
V
IL
or V
IH
:
0.001
0.001
I
OL
=
24mA
I
OL
=
24mA
(6)
V
I
=
V
CC
, GND
V
I
=
V
IL
, V
IH
;
V
O
=
V
CC
, GND
V
I
=
V
CC
– 2.1V
V
OLD
=
1.65V Max.
V
OHD
=
3.85V Min.
V
IN
=
V
CC
or GND
Figures 1 & 2
(8)
Figures 1 & 2
(8)
(9)
3.86
4.86
0.1
0.1
0.36
0.36
±0.1
±0.25
0.6
V
V
4.5
5.5
I
IN
I
OZ
I
CCT
I
OLD
I
OHD
I
CC
V
OLP
V
OLV
V
IHD
V
ILD
Maximum Input
Leakage Current
Maximum 3-STATE
Leakage Current
Maximum I
CC
/Input
Minimum Dynamic
Output Current
(7)
Maximum Quiescent
Supply Current
Quiet Output Maximum
Dynamic V
OL
Quiet Output Minimum
Dynamic V
OL
Minimum HIGH Level
Dynamic Input Voltage
Maximum LOW Level
Dynamic Input Voltage
5.5
5.5
5.5
5.5
5.5
5.0
5.0
5.0
5.0
µA
µA
mA
mA
mA
µA
V
V
V
V
1.1
–0.6
1.9
1.2
1.5
–1.2
2.2
0.8
(9)
Notes:
6. All outputs loaded; thresholds on input associated with output under test.
7. Maximum test duration 2.0ms, one output loaded at a time.
8. Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND
9. Max number of data inputs (n) switching. (n–1) inputs switching 0V to 3V (ACTQ). Input-under-test switching:
3V to threshold (V
ILD
), 0V to threshold (V
IHD
), f
=
1MHz.
©1990 Fairchild Semiconductor Corporation
74ACQ574, 74ACTQ574 Rev. 1.3
www.fairchildsemi.com
5
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