Product Specification
PE3240
Product Description
Peregrine’s PE3240 is a high performance integer-N PLL
capable of frequency synthesis up to 2.2 GHz. The
superior phase noise performance of the PE3240 is ideal
for applications such as wireless local loop basestations,
LMDS systems and other demanding terrestrial systems.
The PE3240 features a 10/11 dual modulus prescaler,
counters and a phase comparator as shown in Figure 1.
Counter values are programmable through a three wire
serial interface.
The PE3240 is manufactured on Peregrine’s UltraCMOS™
process, a patented variation of silicon-on-insulator (SOI)
technology on a sapphire substrate, offering the
performance of GaAs with the economy and integration of
conventional CMOS.
2.2 GHz UltraCMOS™ Integer-N PLL
for Low Phase Noise Applications
Features
•
2.2 GHz operation
•
÷10/11 dual modulus prescaler
•
Internal phase detector
•
Serial programmable
•
Low power—15 mA at 3 V
•
Ultra-low phase noise
•
Available in 20-lead TSSOP
Figure 1. Block Diagram
F
in
F
in
Prescaler
10/11
Main
Counter
13
Sdata
Primary
20-bit
20
Latch
Secon-
dary
20-bit
Latch
20
20
Phase
Detector
PD_U
PD_D
6
f
r
6
R Counter
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©2006 Peregrine Semiconductor Corp. All rights reserved.
Page 1 of 12
PE3240
Product Specification
Figure 2. Pin Configuration (Top View)
V
DD
Enh
S_WR
Sdata
Sclk
GND
FSELS
E_WR
V
DD
1
2
3
4
5
6
7
8
9
20
19
18
17
16
15
14
13
12
11
Figure 3. Package Type
20-lead TSSOP
f
r
GND
PD_U
PD_D
V
DD
Dout
LD
Cext
GND
F
in
F
in
10
Table 1. Pin Descriptions
Pin No.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Pin Name
V
DD
Enh
S_WR
Sdata
Sclk
GND
FSELS
E_WR
V
DD
Fin
F
in
GND
Cext
LD
Dout
V
DD
Type
(Note 1)
Input
Input
Input
Input
Description
Power supply input. Input may range from 2.85 V to 3.15 V. Bypassing required.
Enhancement mode. When asserted low (“0”), enhancement register bits are functional. Internal 70 kΩ pull-
up resistor.
Serial load enable input. While S_WR is “low”, Sdata can be serially clocked. Primary register data are
transferred to the secondary register on S_WR rising edge.
Binary serial data input. Input data entered MSB first.
Serial clock input. Sdata is clocked serially into the 20-bit primary register (E_WR “low”) or the 8-bit
enhancement register (E_WR “high”) on the rising edge of Sclk.
Ground.
Input
Input
(Note 1)
Input
Input
Selects contents of primary register (FSELS=1) or secondary register (FSELS=0) for programming of internal
counters. Internal 70 kΩ pull-down resistor.
Enhancement register write enable. While E_WR is “high”, Sdata can be serially clocked into the
enhancement register on the rising edge of Sclk. Internal 70 kΩ pull-down resistor.
Same as pin 1.
Prescaler input from the VCO. Max frequency input is 2.2 GHz.
Prescaler complementary input. A bypass capacitor should be placed as close as possible to this pin and be
connected in series with a 50
Ω
resistor to the ground plane.
Ground.
Output
Output
Output
(Note 1)
Logical “NAND” of PD_U and PD_D terminated through an on chip, 2 kΩ series resistor. Connecting Cext to
an external capacitor will low pass filter the input to the inverting amplifier used for driving LD.
Lock detect is an open drain logical inversion of CEXT. When the loop is in lock, LD is high impedance,
otherwise LD is a logic low (“0”).
Data out function, Dout, enabled in enhancement mode.
Same as pin 1.
©2006 Peregrine Semiconductor Corp. All rights reserved.
Page 2 of 12
Document No. 70-0034-02
│
UltraCMOS™ RFIC Solutions
PE3240
Product Specification
Table 1. Pin Descriptions (continued)
Pin No.
17
18
19
20
Note 1:
Pin Name
PD_D
PD_U
GND
f
r
Type
Output
Output
PD_D pulses down when f
p
leads f
c
.
PD_U pulses down when f
c
leads f
p
.
Ground.
Input
Reference frequency input.
Description
V
DD
pins 1, 9, and 16 are connected by diodes and must be supplied with the same positive voltage level.
Table 2. Absolute Maximum Ratings
Symbol
V
DD
V
I
I
I
I
O
T
stg
Electrostatic Discharge (ESD) Precautions
Units
V
V
mA
mA
°C
Parameter/Conditions
Supply voltage
Voltage on any input
DC into any input
DC into any output
Storage temperature range
Min
-0.3
-0.3
-10
-10
-65
Max
4.0
V
DD
+
0.3
+10
+10
150
When handling this UltraCMOS™ device, observe
the same precautions that you would use with
other ESD-sensitive devices. Although this device
contains circuitry to protect it from damage due to
ESD, precautions should be taken to avoid
exceeding the specified rating in Table 4.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS™
devices are immune to latch-up.
Table 3. Operating Ratings
Symbol
V
DD
T
A
Parameter/Conditions
Supply voltage
Operating ambient
temperature range
Min
2.85
-40
Max
3.15
85
Units
V
°C
Table 4. ESD Ratings
Symbol
V
ESD
Note 1:
Parameter/Conditions
ESD voltage human body model
(Note 1)
Level
1000
Units
V
Periodically sampled, not 100% tested. Tested per
MIL-STD-883, M3015 C2
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Page 3 of 12
PE3240
Product Specification
Table 5. DC Characteristics:
V
DD
= 3.0 V, -40° C < T
A
< 85° C, unless otherwise specified
Symbol
I
DD
Parameter
Operational supply current;
Prescaler enabled
Conditions
V
DD
= 2.85 to 3.15 V
Min
Typ
15
Max
20
Units
mA
Digital Inputs: S_WR, Sdata, Sclk
V
IH
V
IL
I
IH
I
IL
High level input voltage
Low level input voltage
High level input current
Low level input current
V
DD
= 2.85 to 3.15 V
V
DD
= 2.85 to 3.15 V
V
IH
= V
DD
= 3.15 V
V
IL
= 0, V
DD
= 3.15 V
-1
0.7 x V
DD
0.3 x V
DD
+1
V
V
µA
µA
Digital inputs:
Enh
(contains a 70 kΩ pull-up resistor)
V
IH
V
IL
I
IH
I
IL
High level input voltage
Low level input voltage
High level input current
Low level input current
V
DD
= 2.85 to 3.15 V
V
DD
= 2.85 to 3.15 V
V
IH
= V
DD
= 3.15 V
V
IL
= 0, V
DD
= 3.15 V
-100
0.7 x V
DD
0.3 x V
DD
+1
V
V
µA
µA
Digital inputs: FSELS, E_WR (contains a 70 kΩ pull-down resistor)
V
IH
V
IL
I
IH
I
IL
High level input voltage
Low level input voltage
High level input current
Low level input current
V
DD
= 2.85 to 3.15 V
V
DD
= 2.85 to 3.15 V
V
IH
= V
DD
= 3.15 V
V
IL
= 0, V
DD
= 3.15 V
-1
0.7 x V
DD
0.3 x V
DD
+100
V
V
µA
µA
Reference Divider input: f
r
I
IHR
I
ILR
High level input current
Low level input current
V
IH
= V
DD
= 3.15 V
V
IL
= 0, V
DD
= 3.15 V
-100
+100
µA
µA
Counter and phase detector outputs: Dout, PD_D, PD_U
V
OLD
V
OHD
Output voltage LOW
Output voltage HIGH
I
out
= 6 mA
I
out
= -3 mA
V
DD
- 0.4
0.4
V
V
Lock detect outputs: (Cext, LD)
V
OLC
V
OHC
V
OLLD
Output voltage LOW, Cext
Output voltage HIGH, Cext
Output voltage LOW, LD
I
out
= 0.1 mA
I
out
= -0.1 mA
I
out
= 1 mA
V
DD
- 0.4
0.4
0.4
V
V
V
©2006 Peregrine Semiconductor Corp. All rights reserved.
Page 4 of 12
Document No. 70-0034-02
│
UltraCMOS™ RFIC Solutions
PE3240
Product Specification
Table 6. AC Characteristics:
V
DD
= 3.0 V, -40° C < T
A
< 85° C, unless otherwise specified
Symbol
Parameter
Conditions
Min
Max
Units
Control Interface and Latches (see Figures 6, 7)
f
Clk
t
ClkH
t
ClkL
t
DSU
t
DHLD
t
PW
t
CWR
t
CE
t
WRC
t
EC
Serial data clock frequency
Serial clock HIGH time
Serial clock LOW time
Sdata set-up time to Sclk rising edge
Sdata hold time after Sclk rising edge
S_WR pulse width
Sclk rising edge to S_WR rising edge
Sclk falling edge to E_WR transition
S_WR falling edge to Sclk rising edge
E_WR transition to Sclk rising edge
(Note 1)
30
30
10
10
30
30
30
30
30
10
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
Main Divider (Including Prescaler)
F
in
P
Fin
Operating frequency
Input level range
External AC coupling
200
-5
2200
5
MHz
dBm
Main Divider (Prescaler Bypassed)
F
in
P
Fin
Operating frequency
Input level range
External AC coupling
20
-5
220
5
MHz
dBm
Reference Divider
f
r
P
fr
Phase Detector
f
c
Comparison frequency
(Note 3)
20
MHz
Operating frequency
Reference input power (Note 2)
(Note 3)
Single ended input
-2
100
MHz
dBm
SSB Phase Noise (F
in
= 1.3 GHz, f
r
= 10 MHz, f
c
= 1.25 MHz, LBW = 70 kHz, V
DD
= 3.0 V, Temp = -40° C
)
100 Hz Offset
1 kHz Offset
Note 1:
Note 2:
Note 3:
-75
-85
dBc/Hz
dBc/Hz
fclk is verified during the functional pattern test. Serial programming sections of the functional pattern are clocked at 10 MHz to verify fclk
specification.
CMOS logic levels can be used to drive reference input if DC coupled. Voltage input needs to be a minimum of 0.5 Vp-p. For optimum
phase noise performance, the reference input falling edge rate should be faster than 80mV/ns.
Parameter is guaranteed through characterization only and is not tested.
Document No. 70-0034-02
│
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©2006 Peregrine Semiconductor Corp. All rights reserved.
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