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5962H1220801KXC

Description
Single-Ended Multiplexer
CategoryAnalog mixed-signal IC    The signal circuit   
File Size309KB,6 Pages
ManufacturerCobham Semiconductor Solutions
Download Datasheet Parametric View All

5962H1220801KXC Overview

Single-Ended Multiplexer

5962H1220801KXC Parametric

Parameter NameAttribute value
Objectid1250477517
package instruction,
Reach Compliance Codeunknown
Analog Integrated Circuits - Other TypesSINGLE-ENDED MULTIPLEXER
Certification statusNot Qualified
total dose1M Rad(Si) V
Standard Products
Datasheet
RadHard-by-Design
RHD5928 Analog Multiplexer
8-Channel
www.aeroflex.com/RHDseries
March 4, 2014
FEATURES
Single power supply operation at 3.3V to 5V
Radiation performance
- Total dose:
> 1 Mrad(Si); Dose rate = 50 - 300 rads(Si)/s
- ELDRS Immune
- SEL Immune
> 100 MeV-cm
2
/mg
- Neutron Displacement Damage > 10
14
neutrons/cm
2
Full military temperature range
Rail to Rail operation
Low power consumption < 4.0mW
One address bus (A
0-2
), and one enable line
Designed for aerospace and high reliability space applications
Packaging – Hermetic ceramic SOIC
- 16-pin, .411"L x .293"W x .105"Ht
- Weight - 0.8 grams max
Aeroflex Plainview’s Radiation Hardness Assurance Plan is DLA Certified to MIL-PRF-38534, Appendix G.
GENERAL DESCRIPTION
Aeroflex’s RHD5928 is a radiation hardened, single supply, 8 Channel Multiplexer in a 16-pin SOIC
package. The RHD5928 design uses specific circuit topology and layout methods to mitigate total ionizing
dose effects and single event latchup. These characteristics make the RHD5928 especially suited for the
harsh environment encountered in Deep Space missions. It is guaranteed operational from -55°C to
+125°C. Available screened in accordance with MIL-PRF-38534 Class K, the RHD5928 is ideal for
demanding military and space applications.
ORGANIZATION AND APPLICATION
The RHD5928 is an 8 to 1 CMOS multiplexer. Channel selection is controlled by 3 bit binary addressing
and an active low enable. All inputs and outputs are diode protected.
The devices will not latch with SEU events to above 100 MeV-cm
2
/mg. Total dose degradation is minimal
to above 1 Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 10
14
neutrons per cm
2
range are readily tolerated. There is no sensitivity to low-dose rate (ELDRS) effects. SEU
effects are application dependent.
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