74F632QCQR datasheet, PDF - EEWORLD Datasheet

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74F632QCQR: DescriptionF/FAST SERIES, 32-BIT ERROR DETECT AND CORRECT CKT, PQCC52, PLASTIC, LCC-52; Categorylogic logic; File Size374KB，12 Pages; ManufacturerTexas Instruments; Websitehttp://www.ti.com.cn/

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74F632QCQR Overview

F/FAST SERIES, 32-BIT ERROR DETECT AND CORRECT CKT, PQCC52, PLASTIC, LCC-52

74F632QCQR Parametric

Parameter Name	Attribute value
Maker	Texas Instruments
package instruction	QCCJ,
Reach Compliance Code	unknown
Other features	BUILT IN DIAGNOSTICS
series	F/FAST
JESD-30 code	S-PQCC-J52
length	19.125 mm
Load capacitance (CL)	50 pF
Logic integrated circuit type	ERROR DETECTION AND CORRECTION CIRCUIT
Number of digits	32
Number of functions	1
Number of terminals	52
Maximum operating temperature	70 °C
Minimum operating temperature
Output characteristics	3-STATE
Package body material	PLASTIC/EPOXY
encapsulated code	QCCJ
Package shape	SQUARE
Package form	CHIP CARRIER
Maximum supply current (ICC)	340 mA
propagation delay (tpd)	28 ns
Certification status	Not Qualified
Maximum seat height	5.08 mm
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	YES
technology	TTL
Temperature level	COMMERCIAL
Terminal form	J BEND
Terminal pitch	1.27 mm
Terminal location	QUAD
width	19.125 mm
Base Number Matches	1

74F632QCQR Related Products

	74F632QCQR	54F632DMQB	54F632DM	74F632DCQR	74F632VCQR
Description	F/FAST SERIES, 32-BIT ERROR DETECT AND CORRECT CKT, PQCC52, PLASTIC, LCC-52	F/FAST SERIES, 32-BIT ERROR DETECT AND CORRECT CKT, CDIP52, SIDE BRAZED, CERAMIC, DIP-52	F/FAST SERIES, 32-BIT ERROR DETECT AND CORRECT CKT, CDIP52, SIDE BRAZED, CERAMIC, DIP-52	F/FAST SERIES, 32-BIT ERROR DETECT AND CORRECT CKT, CDIP52, SIDE BRAZED, CERAMIC, DIP-52	F/FAST SERIES, 32-BIT ERROR DETECT AND CORRECT CKT, PQCC68, PLASTIC, LCC-68
package instruction	QCCJ,	DIP, DIP52,.6	DIP, DIP52,.6	DIP,	QCCJ,
Reach Compliance Code	unknown	unknown	unknown	unknown	unknown
Other features	BUILT IN DIAGNOSTICS	BUILT IN DIAGNOSTICS	BUILT IN DIAGNOSTICS; BYTE CONTROL	BUILT IN DIAGNOSTICS	BUILT IN DIAGNOSTICS
series	F/FAST	F/FAST	F/FAST	F/FAST	F/FAST
JESD-30 code	S-PQCC-J52	R-CDIP-T52	R-CDIP-T52	R-CDIP-T52	S-PQCC-J68
Logic integrated circuit type	ERROR DETECTION AND CORRECTION CIRCUIT	ERROR DETECTION AND CORRECTION CIRCUIT	ERROR DETECTION AND CORRECTION CIRCUIT	ERROR DETECTION AND CORRECTION CIRCUIT	ERROR DETECTION AND CORRECTION CIRCUIT
Number of digits	32	32	32	32	32
Number of functions	1	1	1	1	1
Number of terminals	52	52	52	52	68
Maximum operating temperature	70 °C	125 °C	125 °C	70 °C	70 °C
Output characteristics	3-STATE	3-STATE	3-STATE	3-STATE	3-STATE
Package body material	PLASTIC/EPOXY	CERAMIC, METAL-SEALED COFIRED	CERAMIC, METAL-SEALED COFIRED	CERAMIC, METAL-SEALED COFIRED	PLASTIC/EPOXY
encapsulated code	QCCJ	DIP	DIP	DIP	QCCJ
Package shape	SQUARE	RECTANGULAR	RECTANGULAR	RECTANGULAR	SQUARE
Package form	CHIP CARRIER	IN-LINE	IN-LINE	IN-LINE	CHIP CARRIER
Maximum supply current (ICC)	340 mA	340 mA	340 mA	340 mA	340 mA
Certification status	Not Qualified	Not Qualified	Not Qualified	Not Qualified	Not Qualified
Maximum seat height	5.08 mm	5.08 mm	5.08 mm	5.08 mm	5.08 mm
Maximum supply voltage (Vsup)	5.5 V	5.5 V	5.5 V	5.5 V	5.5 V
Minimum supply voltage (Vsup)	4.5 V	4.5 V	4.5 V	4.5 V	4.5 V
Nominal supply voltage (Vsup)	5 V	5 V	5 V	5 V	5 V
surface mount	YES	NO	NO	NO	YES
technology	TTL	TTL	TTL	TTL	TTL
Temperature level	COMMERCIAL	MILITARY	MILITARY	COMMERCIAL	COMMERCIAL
Terminal form	J BEND	THROUGH-HOLE	THROUGH-HOLE	THROUGH-HOLE	J BEND
Terminal pitch	1.27 mm	2.54 mm	2.54 mm	2.54 mm	1.27 mm
Terminal location	QUAD	DUAL	DUAL	DUAL	QUAD
width	19.125 mm	15.24 mm	15.24 mm	15.24 mm	24.2316 mm
Maker	Texas Instruments	-	-	Texas Instruments	Texas Instruments
Load capacitance (CL)	50 pF	-	-	50 pF	50 pF
propagation delay (tpd)	28 ns	-	-	28 ns	28 ns
Base Number Matches	1	1	1	1	-

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