Clamp-type test probes
Product description
Clamp-type test probes provide
the simple, rapid measurement of
voltages.
A variety of types and sizes
permit the measuring point to be
accessed and gripped without
difficulty.
The ergonomic design has been
optimised to facilitate handling to
the utmost extent.
The KLEPS 2700 permits a lead
to be tested without the insulation
being stripped.
The KLEPS 2800 is provided with
claw-type clamps with which large
IEC 60947-5-2
test specimens can be gripped.
It is also suitable for testing
currents. The classic KLEPS 30,
used in millions of applications
worldwide, serves as a versatile
voltage tap.
*
System
Article type
3.8
ø2
Technical
Data
Order no.
Colour
*
System
Article type
.64
ø 1.4
1.6
24
Technical
Data
Very thin
wires and
densely
packed
contact
points,
clamping
range
ø 2 mm
Order no.
Colour
973 972-100
q
973 972-101
q
Clamping
931 467-100
q
range max.
ø 2 mm,
931 467-101
q
contact
hook,
solder
contact
3.5
35
53.8
57.5
ø 11
KLEPS 2
2
3.8
ø2
MICRO-KLEPS
973 501-100
q
Clamping
range max.
973 501-101
q
ø 2 mm,
contact
hook
66
18
3.6
ø 7.5
.64
ø 2.3
2
24
ø 2mm Steckerstift
ø3
52
Very thin
wires and
densely
packed
contact
points,
clamping
range
ø 3.5 mm
973 592-100
q
973 592-101
q
3.5
35
ø 11
ø7
KLEPS 2-BU
4
77
14.5
KLEPS 3 ST
20 A
930 111-100
q
clamping
range max.
930 111-101
q
ø 2 mm
3.8
18
ø
0.
64
4
ø 4.5
3.4
.64
ø 2.3
2
128.5
ø3
52
Very thin
wires and
densely
packed
contact
points,
clamping
range
ø 3.5 mm
973 649-100
q
973 649-101
q
24
ø
4
ø7
KLEPS 10
39.5
KLEPS 4
4.3
ø 18
20 A
clamping
range
5.5 mm
972 309-100
q
972 309-101
q
4
4
ø 4.1
3.5
5.5
Clamping
range
ø 4 mm
930 113-100
q
930 113-101
q
Griffbereich
158
126
36.5
ø
4
KLEPS 2900
KLEPS 30
2
^
= 2 mm system /
39.5
*
System:
.64
= 0.64 mm system /
4
^
= 4 mm system /
^
= 4 mm safety system /
ø
4
8
41
100
^
= 4 mm sliding sleeve system
8
Measuring Highlights
Microcontroller MCU
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