REVISIONS
LTR
DESCRIPTION
DATE
(YR-MO-DA)
APPROVED
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
15
16
17
18
REV
SHEET
PREPARED BY
Steve L. Duncan
19
20
21
1
2
3
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PMIC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
Michael Jones
APPROVED BY
Kendall A. Cottongim
MICROCIRCUIT, HYBRID, MEMORY, FLASH,
ERASABLE/PROGRAMMABLE READ ONLY MEMORY,
128K x 8-BIT
DRAWING APPROVAL DATE
96-12-09
SIZE
REVISION LEVEL
CAGE CODE
AMSC N/A
A
SHEET
67268
1
OF
21
5962-95538
DESC FORM 193
JUL 94
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
5962-E054-97
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class G
(lowest high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead finishes are
available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels
are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
-
95538
01
H
X
X
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
/
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the
MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA
device.
1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows:
Device type
01
02
Generic number
WF128K32-150HQ5A
WF128K32-120HQ5A
Circuit function
FLASH EPROM, 128K X 32-bit
FLASH EPROM, 128K X 32-bit
Access time
150 ns
120 ns
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as
follows:
Device class
D, E, G, H, or K
Device performance documentation
Certification and qualification to MIL-PRF-38534
1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter
X
Y
Descriptive designator
See figure 1
See figure 1
Terminals
66
68
Package style
Hex-in-line, single cavity, with standoffs
Ceramic, Quad Flatpack
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DESC FORM 193A
JUL 94
A
REVISION LEVEL
5962-95538
SHEET
2
1.3 Absolute maximum ratings. 1/
Supply voltage range (V
CC
) . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal voltage range (V
G
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power dissipation (P
D
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . .
Data retention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Endurance (write/erase cycles) . . . . . . . . . . . . . . . . . . . . . . . . .
1.4 Recommended operating conditions.
Supply voltage range (V
CC
) . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input low voltage range (V
IL
) . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input high voltage range (V
IH
) . . . . . . . . . . . . . . . . . . . . . . . . . .
Case operating temperature (T
C
) . . . . . . . . . . . . . . . . . . . . . . . .
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbook. The following specification, standards, and handbook form a part of
this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue
of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Methods and Procedures for Microelectronics.
MIL-STD-973 - Configuration Management.
MIL-STD-1835 - Microcircuit Case Outlines.
HANDBOOK
DEPARTMENT OF DEFENSE
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific
exemption has been obtained.
+4.5 V dc to +5.5 V dc
-0.5 V dc to +0.8 V dc
+2.0 V dc to V
CC
+0.3 V dc
-55
(
C to +125
(
C
-2.0 V dc to +7.0 V dc
-0.6 V dc to +6.25 V dc
1.1 W Max.
-65
(
C to +150
(
C
+300
(
C
10 years minimum
10,000 cycles minimum
1/
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DESC FORM 193A
JUL 94
A
REVISION LEVEL
5962-95538
SHEET
3
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.
Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).
Futhermore, the manufacturers may take exceptions or use alternate methods to the tests and inspections herein and not perform
them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the appilcable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3.
3.2.4 Logic diagram(s). The logic diagram(s) shall be as specified on figures 4, 5, 6, and 7.
3.2.5 Block diagram(s). The block diagram(s) shall be as specified on figures 8 and 9.
3.2.6 Output load circuit. The output load circuit shall be as specified on figure 10.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as
specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests
for each subgroup are defined in table I.
3.5 Programming procedure. The programming procedure shall be as specified by the manufacturer and shall be available upon
request.
3.6 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked as listed in QML-38534.
3.7 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for
each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if
any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made
available to the preparing activity (DSCC-VA) upon request.
3.8 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing.
The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets the
performance requirements of MIL-PRF-38534 and herein.
3.9 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
3.10 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This reprogrammability
test shall be done for the initial characterization and after any design process changes which may affect the reprogrammability of the
device. The methods and procedures may be vendor specific, but shall guarantee the number of program/erase cycles listed in
section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept under document control and shall
be made available upon request of the acquiring or preparing activity.
3.11 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall be
done for initial characterization and after any design process change which may affect data retention. The methods and
procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military
temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of the
acquiring or preparing activity.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DESC FORM 193A
JUL 94
A
REVISION LEVEL
5962-95538
SHEET
4
TABLE I. Electrical performance characteristics.
Symbol
Conditions 1/ 2/
-55
(
C
T
C
+125
(
C
unless otherwise specified
Group A
subgroups
Device
type
Min
Test
Limits
Max
Unit
DC parameters
Input leakage current
I
LI
Output leakage current
I
LO
V
CC
active current
I
CC
V
CC
standby current
I
SB
Input low level
V
IL
Input high level
V
IH
Output low voltage
V
OL
Output high voltage
V
OH
V
CC
= 5.5 Vdc, V
IN
= GND
to V
CC
V
CC
= 5.5 Vdc, V
IN
= GND
to V
CC
CS = V
IL
, f = 5 MHz
V
CC
= 5.5 Vdc
CS = V
IH
, f = 5 MHz
V
CC
= 5.5 Vdc
V
CC
= 4.5 V, I
OL
= 2.1 mA
V
CC
= 4.5 V, I
OH
= -400
)
A
1,2,3
1,2,3
1,2,3
1,2,3
1,2,3
1,2,3
1,2,3
1,2,3
All
All
All
All
All
All
All
All
2.0
2.4
10
10
200
1.5
0.8
0.45
)
A
)
A
mA
mA
V
V
V
V
Dynamic characteristics
OE capacitance
C
OE
C
WE
C
WE
V
IN
= 0 V, f = 1.0 MHz
T
A
= +25
(
C
V
IN
= 0 V, f = 1.0 MHz
T
A
= +25
(
C
Case outline X
WE
1-4
capacitance
WE capacitance
V
IN
= 0 V, f = 1.0 MHz
T
A
= +25
(
C
Case outline Y
4
4
4
All
All
All
50
20
50
pF
pF
pF
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DESC FORM 193A
JUL 94
A
REVISION LEVEL
5962-95538
SHEET
5
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