Si534
Q
U A D
F
R E Q U E N C Y
C
R Y S TA L
O
S C I L L A T O R
(XO)
(10 M H
Z T O
1.4 G H
Z
)
Features
Available with any-rate output
frequencies from 10 MHz to 945 MHz
and select frequencies to 1.4 GHz
Four selectable output frequencies
3rd generation DSPLL
®
with superior
jitter performance
3x better frequency stability than
SAW-based oscillators
Internal fixed crystal frequency
ensures high reliability and low
aging
Available CMOS, LVPECL,
LVDS, and CML outputs
3.3, 2.5, and 1.8 V supply options
Industry-standard 5 x 7 mm
package and pinout
Pb-free/RoHS-compliant
Si5602
Ordering Information:
See page 7.
Applications
SONET/SDH
Networking
SD/HD video
Test and measurement
Clock and data recovery
FPGA/ASIC clock generation
Pin Assignments:
See page 6.
(Top View)
FS[1]
7
NC
OE
GND
1
2
3
8
FS[0]
6
5
4
V
DD
Description
The Si534 quad frequency XO utilizes Silicon Laboratories’ advanced
DSPLL
®
circuitry to provide a low jitter clock at high frequencies. The Si534
is available with any-rate output frequency from 10 to 945 MHz and select
frequencies to 1400 MHz. Unlike a traditional XO where a different crystal is
required for each output frequency, the Si534 uses one fixed crystal to
provide a wide range of output frequencies. This IC based approach allows
the crystal resonator to provide exceptional frequency stability and reliability.
In addition, DSPLL clock synthesis provides superior supply noise rejection,
simplifying the task of generating low jitter clocks in noisy environments
typically found in communication systems. The Si534 IC-based XO is factory
configurable for a wide variety of user specifications including frequency,
supply voltage, output format, and temperature stability. Specific
configurations are factory programmed at time of shipment, thereby
eliminating long lead times associated with custom oscillators.
CLK–
CLK+
(LVDS/LVPECL/CML)
FS[1]
7
NC
OE
GND
1
2
3
8
FS[0]
6
5
4
V
DD
Functional Block Diagram
V
DD
CLK– CLK+
NC
CLK
FS[1]
Fixed
Frequency
XO
Any-rate
10–1400 MHz
DSPLL
®
Clock
Synthesis
FS[0]
(CMOS)
OE
GND
Rev. 1.0 7/06
Copyright © 2006 by Silicon Laboratories
Si534
Si534
1. Electrical Specifications
Table 1. Recommended Operating Conditions
Parameter
Supply Voltage
1
Symbol
V
DD
Test Condition
3.3 V option
2.5 V option
1.8 V option
Supply Current
I
DD
Output enabled
LVPECL
CML
LVDS
CMOS
TriState mode
Output Enable (OE)
and Frequency Select FS[1:0]
2
Operating Temperature Range
3
T
A
V
IH
V
IL
Min
2.97
2.25
1.71
—
—
—
—
—
0.75 x V
DD
—
–40
Typ
3.3
2.5
1.8
111
99
90
81
60
—
—
—
Max
3.63
2.75
1.89
121
108
98
88
70
—
0.5
85
V
ºC
V
Units
mA
Notes:
1.
Selectable parameter specified by part number. See Section 3. "Ordering Information" on page 7 for further details.
2.
OE and FS[1:0] pins include a 17 kΩ pullup resistor to V
DD
. Pulling OE to ground causes outputs to tristate.
3.
If the device is powered up below –20 ºC and the ambient temperature rises by approximately 105 ºC during normal
operation, the device will perform a one-time recalibration. The output is squelched for approximately 2–3 ms during
this recalibration.
Table 2. CLK± Output Frequency Characteristics
Parameter
Nominal Frequency
1,2
Symbol
f
O
Test Condition
LVPECL/LVDS/CML
CMOS
Min
10
10
—
–20
–50
Typ
—
—
±1.5
—
—
—
—
—
Max
945
160
—
+20
+50
±10
10
20
Units
MHz
ppm
ppm
ppm
ms
ms
Initial Accuracy
Temperature Stability
1,3
Aging
Powerup Time
4
Settling Time After FS[1:0] Change
f
i
Measured at +25 °C at
time of shipping
∆f/f
O
f
a
t
OSC
t
FRQ
Both FS[1] and FS[0]
changing simultaneously
Frequency drift over pro-
jected 15 year life
—
—
—
Notes:
1.
See Section 3. "Ordering Information" on page 7 for further details.
2.
Specified at time of order by part number. Also available in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.
3.
Selectable parameter specified by part number.
4.
Time from powerup or tristate mode to f
O
.
2
Rev. 1.0
Si534
Table 3. CLK± Output Levels and Symmetry
Parameter
LVPECL Output Option
1
Symbol
V
O
V
OD
V
SE
Test Condition
mid-level
swing (diff)
swing (single-ended)
mid-level
swing (diff)
Min
V
DD
– 1.42
1.1
0.5
1.125
0.32
Typ
—
Max
V
DD
– 1.25
1.9
0.93
1.275
0.50
Units
V
V
PP
V
PP
V
V
PP
—
—
1.20
0.40
LVDS Output Option
2
V
O
V
OD
CML Output Option
2
CMOS Output Option
3
V
O
V
OD
V
OH
V
OL
mid-level
swing
(diff)
I
OH
= 32 mA
I
OL
= 32 mA
—
0.70
0.8 x V
DD
V
DD
– 0.75
0.95
—
—
—
1
—
—
1.20
V
DD
V
V
PP
V
—
—
—
45
0.4
350
—
55
Rise/Fall time (20/80%)
t
R,
t
F
LVPECL/LVDS/CML
CMOS with CL = 15 pF
ps
ns
%
Symmetry (duty cycle)
SYM
LVPECL:
LVDS:
CMOS:
V
DD
– 1.3 V (diff)
1.25 V (diff)
V
DD
/2
Notes:
1.
50
Ω
to V
DD
– 2.0 V.
2.
R
term
= 100
Ω
(differential).
3.
C
L
= 15 pF
Table 4. CLK± Output Phase Jitter
Parameter
Phase Jitter (RMS)*
for F
OUT
> 500 MHz
Symbol
Test Condition
12 kHz to 20 MHz (OC-48)
50 kHz to 80 MHz (OC-192)
LVPECL
CML
LVDS
Min
—
—
—
—
—
—
—
Typ
0.40
0.30
0.35
0.40
0.40
0.45
0.45
Max
0.50
0.40
0.47
0.49
0.50
0.50
0.52
Units
ps
ps
φ
J
Phase Jitter (RMS)*
for F
OUT
of 125 to 500 MHz
φ
J
12 kHz to 20 MHz (OC-48)
LVPECL
CML
LVDS
ps
*Note:
Differential Modes: LVPECL/LVDS/CML. Refer to AN256 for further information.
Rev. 1.0
3
Si534
Table 5. CLK± Output Period Jitter
Parameter
Period Jitter*
for F
OUT
< 160 MHz
Symbol
J
PER
Test Condition
RMS
Peak-to-Peak
Min
—
—
Typ
1
5
Max
—
—
Units
ps
*Note:
Any output mode, including CMOS, LVPECL, LVDS, CML. N = 1000 cycles. Refer to AN279 for further information.
Table 6. CLK± Output Phase Noise (Typical)
Configuration
Offset Frequency (f)
100 Hz
1 kHz
10 kHz
100 kHz
1 MHz
10 MHz
100 MHz
–110
–127
–134
–136
–143
–147
n/a
f
C
Output
81.25 MHz
LVDS
L
(f)
–100
–115
–119
–123
–135
–144
–147
–87
–102
–107
–111
–121
–135
–142
312.5 MHz
LVPECL
1066 MHz
LVPECL
Units
dBc/Hz
Table 7. Absolute Maximum Ratings
1
Parameter
Supply Voltage
Input Voltage (any input pin)
Storage Temperature
ESD Sensitivity (HBM, per JESD22-A114)
Soldering Temperature (Pb-free profile)
2
Soldering Temperature Time @ T
PEAK
(Pb-free profile)
2
Symbol
V
DD
V
I
T
S
ESD
T
PEAK
t
P
Rating
–0.5 to +3.8
–0.5 to V
DD
+ 0.3
–55 to +125
>2500
260
10
Units
Volts
Volts
ºC
Volts
ºC
seconds
Notes:
1.
Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional
operation or specification compliance is not implied at these conditions.
2.
Refer to Si5xx Packaging FAQ available for download at
www.silabs.com/VCXO
for further information, including
soldering profiles.
4
Rev. 1.0
Si534
Table 8. Environmental Compliance
The Si534 meets the following qualification test requirements.
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solvents
Conditions/ Test Method
MIL-STD-883F, Method 2002.3 B
MIL-STD-883F, Method 2007.3 A
MIL-STD-883F, Method 203.8
MIL-STD-883F, Method 1014.7
MIL-STD-883F, Method 2016
Rev. 1.0
5
Embedded System
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