U1898
U1898
N-Channel Switch
• This device is designed for low level analog switching, sample and
hold circuits and chopper stabalized amplifiers.
• Sourced from Process 51.
• See J111 for characteristics.
TO-92
1
1. Drain 2. Source 3. Gate
Absolute Maximum Ratings*
T
a
=25°C unless otherwise noted
Symbol
V
DG
V
GS
I
GF
T
J
, T
STG
Drain-Gate Voltage
Gate-Source Voltage
Forward Gate Current
Operating and Storage Junction Temperature Range
Parameter
Ratings
40
-40
50
-55 ~ 150
Units
V
V
mA
°C
* This ratings are limiting values above which the serviceability of any semiconductor device may be impaired.
NOTES:
1) These rating are based on a maximum junction temperature of 150 degrees C.
2) These are steady limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
Electrical Characteristics
T
a
=25°C unless otherwise noted
Symbol
Off Characteristics
V
(BR)GS
V
GS(off)
I
DGO
I
DSS
r
DS(on)
Small Signal Characteristics
r
ds(on)
C
iss
C
rss
t
on
t
off
Drain-Source On Resistance
Input Capacitance
Reverse Transfer Capacitance
Turn-On Time
Turn-Off Time
V
DS
= VGS = 0, f= 1.0 kHz
V
DS
= 20, V
GS
= 0, f = 1.0 MHz
V
GS
= - 20 V, f = 1.0 MHz
I
D(on)
= 6.0 mA
V
GS(off)
= 6.0 V
50
16
5.0
35
60
Ω
pF
pF
ns
ns
Parameter
Test Condition
I
G
= 1.0
µA,
V
DS
= 0
V
DS
= 20 V, I
D
= 1.0 nA
V
DG
= 20 V, I
S
= 0
V
DS
= 20 V, V
GS
= 0
I
D
= 1.0 mA, V
GS
= 0
15
50
Min.
-40
-2.0
-7.0
-200
Max.
Units
V
V
pA
mA
Ω
Gate-Source Breakdown Voltage
Gate-Source Cutoff Voltage
Drain-Gate Leakage Current
Zero-Gate Voltage Drain Current *
On Characteristics
Switching Characteristics
* Pulse Test: Pulse Width
≤
300
µs,
Duty Cycle
≤
2.0%
Thermal Characteristics
T
a
=25°C unless otherwise noted
Symbol
P
D
R
θJC
R
θJA
Parameter
Total Device Dissipation
Derate above 25°C
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient
Max.
625
5.0
125
357
Units
mW
mW/°C
°C/W
°C/W
©2004 Fairchild Semiconductor Corporation
Rev. A, April 2004
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Advance Information
Product Status
Formative or In
Design
First Production
Definition
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
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©2004 Fairchild Semiconductor Corporation
Rev. I10
Test/Measurement
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