T493C106K020BC datasheet, PDF - EEWORLD Datasheet

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T493C106K020BC: DescriptionTantalum Capacitors - Solid SMD; CategoryPassive components; File Size1MB，26 Pages; ManufacturerKEMET; Websitehttp://www.kemet.com

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T493C106K020BC Overview

Tantalum Capacitors - Solid SMD

T493C106K020BC Parametric

Parameter Name	Attribute value
Product Category	Tantalum Capacitors - Solid SMD
Manufacturer	KEMET

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Tantalum Surface Mount Capacitors – High Reliability

T493 Commercial Off-The-Shelf (COTS)

MnO

(CWR11 Style)

Overview

The KEMET T493 Series is designed for the Commercial

Off-The-Shelf (COTS) requirements of military and

aerospace applications. This series is a surface mount

product offering various lead-frame plating options,

Weibull grading options, surge current testing, F-Tech (an

improved anode manufacturing process) and Simulated

Breakdown Voltage (SBDV) screening options to improve

long term reliability. Standard, low, and ultra-low ESR

options are available. All lots of this series are conditioned

with MIL–PRF–55365 Group A testing. This series is also

approved for DLA Drawing 07016 (please see part number

list specific to this drawing).

KEMET’s F-Tech eliminates hidden defects in the dielectric

which continue to grow in the field, causing capacitor

failures. Based on the fundamental understanding of

degradation mechanisms in tantalum and niobium

capacitors, F-Tech incorporates multiple process

methodologies. Some minimize the oxygen and carbon

content in the anodes which become contaminants

and can lead to the crystallization of the anodic oxide

dielectric. This process methodology reduces the

contaminants, improving quality of the dielectric. An

additional technology provides a stronger mechanical

connection point between the tantalum lead wire and

tantalum anode, enhancing robustness and product

reliability. The benefit of F-Tech is illustrated by a 2,000

hour, 85°C, 1.32 X rated voltage accelerated life test.

F-Tech parts see no degradation while standard tantalum's

have 1.5 orders of magnitude degradation in leakage

current. F-Tech is currently available for the T493 Series

(select D and X case capacitance values in 25 V and

higher rated voltage). Please contact KEMET for details on

ordering other part types with these capabilities.

KEMET’s patented Simulated Breakdown Screening (SBDS)

is a nondestructive testing technique that simulates the

breakdown voltage (BDV) of a capacitor without damage to

its dielectric or to the general population of capacitors. This

screening identifies hidden defects in the dielectric, providing

the highest level of dielectric testing. SBDS is based on the

simulation of breakdown voltage (BDV), the ultimate test of

the dielectric in a capacitor.

Low BDV indicates defects in the dielectric, and therefore, a

higher probability of failure in the field. High BDV indicates

a stronger dielectric and high-reliability performance in the

field. This new screening method allows KEMET to identify

the breakdown voltage of each individual capacitor and

provide only the strongest capacitors from each lot.

SBDS is currently available on select part types in the T493

and T497 Series. Please contact KEMET for details on

ordering other part types with these capabilities.

KEMET offers these technologies per the following options:

• F-Tech only

• SBDS only

• Combination of both F-Tech and SBDS for the ultimate

protection

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One world. One KEMET

T2007_T493 • 7/25/2017

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