PRELIMINARY SPECIFICATIONS
Model: FXU-LC53 SERIES
LVDS
5 x 3.2mm 3.3V Oscillator
Features
ULTRA Low Jitter
Low Cost
X
PRESS
Delivery
Frequency Resolution to six decimal places
Stabilities to ±
20
PPM
-20 to +70°C or -40 to +85°C operating temperatures
Tri-State Enable / Disable Feature
Industry Standard Package, Footprint & Pin-Out
Fully RoHS compliant
Gold over Nickel Termination Finish
Serial ID with Comprehensive Traceability
V
DD
Enable / Disable
Freq: 0.016 MHz to 1.5GHz
Rev. 1/14/2014
Applications
ANY application requiring a high
performance LVDS oscillator
SONET
Ethernet
Storage Area Network
Broadband Access
Microprocessors / DSP / FPGA
Industrial Controllers
Test and Measurement Equipment
X
PRESS
O
ASICs
GND
FOX
OUTPUT
For more information -- Click on the drawing
Contents
page
Description
The Fox X
PRESS
O-ULTRA Crystal Oscillator is a
breakthrough in configurable Frequency Control
Solutions. X
PRESS
O-ULTRA utilizes a family of
proprietary ASICs, designed and developed by Fox,
with a key focus on noise reduction technologies.
The 4
th
order Delta Sigma Modulator reduces noise to
the levels that are comparable to traditional Bulk
Quartz and SAW oscillators. The ASICs family has
the ability to select the output type and supply
voltage.
With the X
PRESS
O-ULTRA lead-time, low cost, low
noise, wide frequency range, excellent ambient
performance, X
PRESS
O-ULTRA is an excellent choice
over the conventional technologies.
Finished X
PRESS
O-ULTRA parts are 100% final
tested.
Model Selection & Part Number Guide
2
Electrical Characteristic
3
Absolute Maximums
3
Output Wave Characteristics
4
Phase Noise
5
Jitter
5
Pin Assignment
6
Recommended Circuit
6
Reflow
6
Mechanical Drawing and Pad Layout
7
Tape and Reel Specification
8
Label
8
Traceability – LOT Number & Serial Identification 9
Mechanical Test
10
11
Other X
PRESS
O Series Links
Fox Contact Information
11
Page 1 of 11
Fox Electronics 5570 Enterprise Parkway Fort Myers, Florida 33905 USA +1.239.693.0099 FAX +1.239.693.1554
EMEA Tel: +44 .1283.568153 | Canada +1.888.438.2369 | Japan Tel: +81.3.3374.2079 | Singapore Tel: +65.68447989
An Integrated Device Technology, Inc. company | ISO9001:2008 Certified |
www.foxonline.com
©2014 FOX ELECTRONICS
PRELIMINARY SPECIFICATIONS
FXU-LC53 Series
Phase Noise (typical measurement at 100 MHz)
Jitter is frequency dependent. Below are typical values at select frequencies.
LVDS Phase Jitter & Time Interval Error (TIE)
Frequency
100 MHz
125 MHz
156.25 MHz
Phase Jitter (pS)
(12kHz to 20MHz)
TIE (pS)
(sigma of jitter distribution)
0.284
0.310
0.332
2.15
2.14
2.85
Phase Jitter
is integrated from Agilent 5052A Signal Noise Analyzer; measured directly into 50 ohm input; V
DD
= 3.3V.
TIE
was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V
DD
= 3.3V.
Per
MJSQ
spec (Methodologies for Jitter and Signal Quality specifications)
LVDS Random & Deterministic Jitter Composition
Frequency
100 MHz
125 MHz
156.25 MHz
Random (Rj)
(pS RMS)
Deterministic (Dj)
(pS P-P)
Total Jitter (Tj)
(pS - (14 x Rj) + Dj)
23.7
20.0
25.6
1.2
1.0
1.25
6.3
5.8
7.7
Rj and Dj
, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per
MJSQ
spec (Methodologies for Jitter and Signal Quality specifications)
Page
5 of 11
© 2014 FOX ELECTRONICS | ISO9001:2008 Certified
An Integrated Device Technology, Inc. company
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