ADVANCE
‡
1 MEG x 16
3V ENHANCED+ BOOT BLOCK FLASH MEMORY
FLASH MEMORY
FEATURES
• Thirty-nine erase blocks:
Eight 4K-word parameter blocks
Thirty-one 32K-word main memory blocks
• V
CC
, V
CC
Q and V
PP
voltages:
2.7V–3.3V V
CC
2.7V–3.3V V
CC
Q*
1.65V–3.3V and 12V V
PP
• Address access times:
90ns, 110ns at 2.7V–3.3V
• Low power consumption:
Standby and deep power-down mode < 1µA
(typical I
CC
)
Automatic power saving feature (APS mode)
• Enhanced WRITE/ERASE SUSPEND (1µs typical)
• 128-bit OTP area for security purposes
• Industry-standard command set compatibility
• Software/hardware block protection
MT28F160C3
Low Voltage, Extended Temperature
BALL ASSIGNMENT (Top View)
46-Ball FBGA
1
A
B
C
D
E
F
A13
2
A11
3
A8
4
V
PP
5
WP#
6
A19
7
A7
8
A4
A14
A10
WE#
RP#
A18
A17
A5
A2
A15
A12
A9
A6
A3
A1
A16
DQ14
DQ5
DQ11
DQ2
DQ8
CE#
A0
V
CC
Q
DQ15
DQ6
DQ12
DQ3
DQ9
DQ0
V
SS
V
SS
DQ7
DQ13
DQ4
V
CC
DQ10
DQ1
OE#
OPTIONS
• Timing
90ns access
110ns access
• Boot Block Starting Address
Top (FFFFFH)
Bottom (00000H)
• Package
46-ball FBGA (6 x 8 ball grid)
• Temperature Range
Commercial (0°C to +70°C)
Extended (-40°C to +85°C)
*Lower V
CC
Q ranges are available upon request.
Part Number Example:
NUMBER
-9
-11
T
B
FD
None
ET
(Ball Down)
NOTE:
See page 3 for Ball Description Table.
See last page for mechanical drawing.
MT28F160C3FD-11 TET
has an I/O supply of 2.7V (MIN). Programming in pro-
duction is accomplished by using high voltage which can
be supplied on a separate line.
The embedded WORD WRITE and BLOCK ERASE
functions are fully automated by an on-chip write state
machine (WSM), which simplifies these operations and
relieves the system processor of secondary tasks. The
WSM status can be monitored by an on-chip status reg-
ister to determine the progress of program/erase tasks.
The device is equipped with 128 bits of one time
programmable (OTP) area. The soft protection feature
for blocks will mark them as read-only by configuring soft
protection registers with command sequences.
Please refer to Micron’s Web site (www.micron.com/
flash)
for the latest data sheet.
GENERAL DESCRIPTION
The MT28F160C3 is a nonvolatile, electrically block-
erasable (flash), programmable, read-only memory con-
taining 16,777,216 bits organized as 1,048,576 words (16
bits).
The MT28F160C3 is manufactured on 0.22µm pro-
cess technology in a 48-ball FBGA package. The device
1 Meg x 16 3V Enhanced+ Boot Block Flash Memory
MT28F160C3_3.p65 – Rev. 3, Pub. 8/01
DEVICE MARKING
Due to the size of the package, Micron’s standard part
number is not printed on the top of each device. Instead,
an abbreviated device mark comprised of a five-digit
alphanumeric code is used. The abbreviated device marks
are cross referenced to Micron part numbers in Table 1.
1
©2001, Micron Technology, Inc.
‡
PRODUCTS
AND SPECIFICATIONS DISCUSSED HEREIN ARE FOR EVALUATION AND REFERENCE PURPOSES ONLY AND
ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE. PRODUCTS ARE ONLY WARRANTED BY MICRON TO MEET
MICRON’S PRODUCTION DATA SHEET SPECIFICATIONS.
ADVANCE
1 MEG x 16
3V ENHANCED+ BOOT BLOCK FLASH MEMORY
ARCHITECTURE
The MT28F160C3 flash contains eight 4K-word
parameter blocks and thirty-one 32K-word blocks.
Memory is organized by using a blocked architecture to
allow independent erasure of selected memory blocks.
Any address within a block address range selects that
block for the required READ, WRITE, or ERASE operation
(see Figures 1 and 2).
Table 1
Cross Reference for Abbreviated
Device Marks
1
PART NUMBER
MT28F160C3FD-9 BET
MT28F160C3FD-9 TET
MT28F160C3FD-11 BET
MT28F160C3FD-11 TET
PRODUCT
MARKING
FW610
FW611
FW612
FW613
SAMPLE
MARKING
FX610
FX611
FX612
FX613
NOTE:
1. The mechanical sample marking is FY610.
FUNCTIONAL BLOCK DIAGRAM
DQ0–DQ15
X DEC
Data Input
Buffer
Data
Register
RP#
CE#
WE#
OE#
Y/Z DEC
Bank
a
Blocks
Y/Z Gating/Sensing
ID
Reg.
CSM
Status
Reg.
WSM
Program/
Erase Change
Pump Voltage
Switch
Output
Multiplexer
DQ0–DQ15
Output
Buffer
I/O Logic
Data
Comparator
A0–A19
Address
Input
Buffer
APS
Control
Address
CNT WSM
Address
Multiplexer
Y/Z DEC
X DEC
Y/Z Gating/Sensing
Bank
b
Blocks
Address Latch
1 Meg x 16 3V Enhanced+ Boot Block Flash Memory
MT28F160C3_3.p65 – Rev. 3, Pub. 8/01
2
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2001, Micron Technology, Inc.
ADVANCE
1 MEG x 16
3V ENHANCED+ BOOT BLOCK FLASH MEMORY
BALL DESCRIPTIONS
46-BALL FBGA
NUMBERS
SYMBOL
3B
WE#
TYPE
Input
DESCRIPTION
Write Enable: Determines if a given cycle is a WRITE cycle. If WE# is
LOW, the cycle is either a WRITE to the command state machine (CSM)
or to the memory array.
Write Protect: Unlocks the soft-protected blocks when HIGH if V
PP
=
1.65V–3.3V or 12V and RP# = V
IH
for WRITE or ERASE. Does not affect
WRITE or ERASE operation on other blocks.
Chip Enable: Activates the device when LOW. When CE# is HIGH, the
device is disabled and goes into standby power mode.
Reset/Power-Down: When LOW, RP# clears the status register, sets the
write state machine (WSM) to the array read mode and places the
device in deep power-down mode. All inputs, including CE#, are “Don’t
Care,” and all outputs are High-Z. RP# must be held at V
IH
during all
other modes of operation.
Output Enable: Enables data output buffers when LOW. When OE# is
HIGH, the output buffers are disabled.
Address Inputs: These address inputs select a unique, 16-bit word out
of the 1,048,576 available.
5A
WP#
Input
7D
4B
CE#
RP#
Input
Input
8F
1A, 1B, 1C, 1D,
2A, 2B, 2C, 3A,
3C, 5B, 6A, 6B,
6C, 7A, 7B, 7C,
8A, 8B, 8C, 8D
OE#
A0-A19
Input
Input
2D, 2E, 2F, 3D, DQ0-DQ15
3E, 3F, 4D, 4E,
4F, 5D, 5E, 6D,
6E, 6F, 7E, 7F
4A
V
PP
Input/
Output
Data I/O: These data I/O are data output lines during any READ
operation or data input lines during a WRITE. Data I/O are used to
input commands to the CSM.
Write/Erase Supply Voltage: From a WRITE or ERASE CONFIRM until
completion of the operation, V
PP
must be 1.65V–3.3V or 12V. V
PP
=
“Don’t Care” during all other operations.
Power Supply: 2.7V–3.3V.
I/O Supply Voltage: 2.7V–3.3V.
Ground.
Supply
5F
1E
1F, 8E
V
CC
V
CC
Q
V
SS
Supply
Supply
Supply
1 Meg x 16 3V Enhanced+ Boot Block Flash Memory
MT28F160C3_3.p65 – Rev. 3, Pub. 8/01
3
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2001, Micron Technology, Inc.
ADVANCE
1 MEG x 16
3V ENHANCED+ BOOT BLOCK FLASH MEMORY
TRUTH TABLE
1
FUNCTION
Standby
RESET
READING
READ
Output Disable
WRITE/ERASE (EXCEPT SOFT PROTECTED BLOCKS)
2
ERASE SETUP
ERASE CONFIRM
3
WRITE SETUP
WRITE
4
READ ARRAY
5
WRITE/ERASE (SOFT-PROTECTED BLOCKS)
2
ERASE SETUP
ERASE CONFIRM
3
WRITE SETUP
WRITE
4
READ ARRAY
5
DEVICE IDENTIFICATION
6
Manufacturer
Device (top boot)
Device (bottom boot)
NOTE:
1.
2.
3.
4.
5.
6.
RP#
H
L
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
CE#
H
X
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
OE#
X
X
L
H
H
H
H
H
H
H
H
H
H
H
L
L
L
WE#
X
X
H
H
L
L
L
L
L
L
L
L
L
L
H
H
H
WP#
X
X
X
X
X
X
X
X
X
X
H
X
H
X
X
X
X
V
PP
X
X
X
X
X
V
PPH
X
V
PPH
X
X
V
PPH
X
V
PPH
X
X
X
X
A0
X
X
X
X
X
X
X
X
X
X
X
X
X
X
L
H
H
DQ0-DQ7 DQ8-DQ15
High-Z
High-Z
Data-Out
High-Z
20H
D0H
10H/40H
Data-In
FFH
20H
D0H
10H/40H
Data-In
FFH
2CH
92H
93H
High-Z
High-Z
Data-Out
High-Z
X
X
X
Data-In
X
X
X
X
Data-In
X
00H
44H
44H
L = V
IL
(LOW), H = V
IH
(HIGH), X = V
IL
or V
IH
(“Don’t Care”).
V
PPH1
= 1.65V–3.3V and V
PPH2
= 12V.
Operation must be preceded by ERASE SETUP command.
Operation must be preceded by WRITE SETUP command.
The READ ARRAY command must be issued before reading the array after writing or erasing.
See Table 3 for the IDENTIFY DEVICE command.
1 Meg x 16 3V Enhanced+ Boot Block Flash Memory
MT28F160C3_3.p65 – Rev. 3, Pub. 8/01
4
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2001, Micron Technology, Inc.
ADVANCE
1 MEG x 16
3V ENHANCED+ BOOT BLOCK FLASH MEMORY
Figure 1
Top Boot Block Memory Address Map
ADDRESS RANGE
FFFFFh
F8000h
F7FFFh
F0000h
EFFFFh
E8000h
E7FFFh
E0000h
DFFFFh
D8000h
D7FFFh
D0000h
CFFFFh
C8000h
C7FFFh
C0000h
BFFFFh
B8000h
B7FFFh
B0000h
AFFFFh
A8000h
A7FFFh
A0000h
9FFFFh
98000h
97FFFh
90000h
8FFFFh
88000h
87FFFh
80000h
7FFFFh
78000h
77FFFh
70000h
6FFFFh
68000h
67FFFh
60000h
5FFFFh
58000h
57FFFh
50000h
4FFFFh
48000h
47FFFh
40000h
3FFFFh
38000h
37FFFh
30000h
2FFFFh
28000h
27FFFh
20000h
1FFFFh
18000h
17FFFh
10000h
0FFFFh
08000h
07FFFh
00000h
8 x 4K-Word Blocks
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
32K-Word Block
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
4K-Word Block
Parameter
Blocks
4K-Word Block
4K-Word Block
4K-Word Block
4K-Word Block
4K-Word Block
4K-Word Block
4K-Word Block
FFFFFh
FF000h
FEFFFh
FE000h
FDFFFh
FD000h
FCFFFh
FC000h
FBFFFh
FB000h
FAFFFh
FA000h
F9FFFh
F9000h
F8FFFh
F8000h
1 Meg x 16 3V Enhanced+ Boot Block Flash Memory
MT28F160C3_3.p65 – Rev. 3, Pub. 8/01
5
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2001, Micron Technology, Inc.