PD- 92003A
HEXFET
®
Power MOSFET
l
l
l
l
l
l
IRFL014N
V
DSS
= 55V
R
DS(on)
= 0.16Ω
Surface Mount
Advanced Process Technology
Ultra Low On-Resistance
Dynamic dv/dt Rating
Fast Switching
Fully Avalanche Rated
D
G
S
I
D
= 1.9A
Description
Fifth Generation HEXFET
®
MOSFETs from International
Rectifier utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This benefit,
combined with the fast switching speed and ruggedized
device design that HEXFET
®
power MOSFETs are well
known for, provides the designer with an extremely efficient
and reliable device for use in a wide variety of applications.
The SOT-223 package is designed for surface-mount
using vapor phase, infrared, or wave soldering techniques.
Its unique package design allows for easy automatic pick-
and-place as with other SOT or SOIC packages but has
the added advantage of improved thermal performance
due to an enlarged tab for heatsinking. Power dissipation
of 1.0W is possible in a typical surface mount application.
SOT-223
Absolute Maximum Ratings
Parameter
I
D
@ T
A
= 25°C
I
D
@ T
A
= 25°C
I
D
@ T
A
= 70°C
I
DM
P
D
@T
A
= 25°C
P
D
@T
A
= 25°C
V
GS
E
AS
I
AR
E
AR
dv/dt
T
J,
T
STG
Continuous Drain Current, V
GS
@ 10V**
Continuous Drain Current, V
GS
@ 10V*
Continuous Drain Current, V
GS
@ 10V*
Pulsed Drain Current
Power Dissipation (PCB Mount)**
Power Dissipation (PCB Mount)*
Linear Derating Factor (PCB Mount)*
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy*
Peak Diode Recovery dv/dt
Junction and Storage Temperature Range
Max.
2.7
1.9
1.5
15
2.1
1.0
8.3
± 20
48
1.7
0.1
5.0
-55 to + 150
Units
A
W
W
mW/°C
V
mJ
A
mJ
V/ns
°C
Thermal Resistance
Parameter
R
θJA
R
θJA
Junction-to-Amb. (PCB Mount, steady state)*
Junction-to-Amb. (PCB Mount, steady state)**
Typ.
90
50
Max.
120
60
Units
°C/W
* When mounted on FR-4 board using minimum recommended footprint.
** When mounted on 1 inch square copper board, for comparison with other SMD devices.
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1
1/19/00
IRFL014N
Electrical Characteristics @ T
J
= 25°C (unless otherwise specified)
V
(BR)DSS
∆V
(BR)DSS
/∆T
J
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
C
iss
C
oss
C
rss
Parameter
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-Resistance
Gate Threshold Voltage
Forward Transconductance
Drain-to-Source Leakage Current
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain ("Miller") Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Min.
55
–––
–––
2.0
1.6
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
Typ.
–––
0.054
–––
–––
–––
–––
–––
–––
–––
7.0
1.2
3.3
6.6
7.1
12
3.3
190
72
33
Max. Units
Conditions
–––
V
V
GS
= 0V, I
D
= 250µA
––– V/°C Reference to 25°C, I
D
= 1mA
0.16
Ω
V
GS
= 10V, I
D
= 1.9A
4.0
V
V
DS
= V
GS
, I
D
= 250µA
–––
S
V
DS
= 25V, I
D
= 0.85A
1.0
V
DS
= 44V, V
GS
= 0V
µA
25
V
DS
= 44V, V
GS
= 0V, T
J
= 150°C
100
V
GS
= 20V
nA
-100
V
GS
= -20V
11
I
D
= 1.7A
1.8
nC
V
DS
= 44V
5.0
V
GS
= 10V, See Fig. 6 and 13
–––
V
DD
= 28V
–––
I
D
= 1.7A
ns
–––
R
G
= 6.0Ω
–––
R
D
= 16Ω, See Fig. 10
–––
V
GS
= 0V
–––
pF
V
DS
= 25V
–––
ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Reverse RecoveryCharge
Min. Typ. Max. Units
–––
–––
–––
–––
–––
–––
–––
–––
41
64
1.3
A
15
1.0
61
95
V
ns
nC
Conditions
MOSFET symbol
showing the
integral reverse
p-n junction diode.
T
J
= 25°C, I
S
= 1.7A, V
GS
= 0V
T
J
= 25°C, I
F
= 1.7A
di/dt = 100A/µs
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
I
SD
≤
1.7A, di/dt
≤
250A/µs, V
DD
≤
V
(BR)DSS
,
T
J
≤
150°C
V
DD
= 25V, starting T
J
= 25°C, L = 8.2mH
R
G
= 25Ω, I
AS
= 3.4A. (See Figure 12)
Pulse width
≤
300µs; duty cycle
≤
2%.
2
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IRFL014N
100
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
TOP
100
I , D rain-to-Source Current (A )
D
I , D rain-to-S ource C urrent (A )
D
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
TOP
10
10
1
1
4 .5V
4.5 V
20 µ s P U LS E W ID TH
T
C
= 2 5°C
0.1
1
10
100
0.1
A
0.1
0.1
1
20 µ s P U LS E W ID TH
T
J
= 1 50 °C
10
100
A
V D S , D rain-to-S ourc e V oltage (V )
V DS , D rain-to-S ource V oltage (V )
Fig 1.
Typical Output Characteristics
Fig 2.
Typical Output Characteristics
100
2.0
R
D S (on)
, Drain-to-S ource O n Resistance
(N orm alized)
I
D
= 1 .7A
I
D
, D ra in -to-S ourc e C urrent (A)
1.5
10
T
J
= 1 5 0 °C
T
J
= 25 °C
1
1.0
0.5
0.1
4
5
6
V
DS
= 25V
2 0 µ s P UL S E W ID TH
7
8
9
A
0.0
-60
-40
-20
0
20
40
60
80
V
G S
= 10 V
100 120
140 160
A
V
G S
, G ate-to -So urce Voltag e (V)
T
J
, Junction T em perature (°C )
Fig 3.
Typical Transfer Characteristics
Fig 4.
Normalized On-Resistance
Vs. Temperature
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IRFL014N
350
300
C , Capacitance (pF)
250
C
iss
C
oss
200
150
V
G S
, G ate-to-S ource V oltage (V )
V
GS
C
iss
C
rs s
C
o ss
=
=
=
=
0V ,
f = 1MHz
C
g s
+ C
g d
, C
d s
S H O R TE D
C
gd
C
ds
+ C
g d
20
I
D
= 1.7 A
V
D S
= 44 V
V
D S
= 28 V
V
D S
= 11 V
16
12
8
100
C
rss
4
50
0
1
10
100
A
0
0
2
4
FO R TE S T C IR C U IT
S E E FIG U R E 9
6
8
10
A
V
D S
, D rain-to-S ourc e V oltage (V )
Q
G
, T otal G ate C harge (nC )
Fig 5.
Typical Capacitance Vs.
Drain-to-Source Voltage
Fig 6.
Typical Gate Charge Vs.
Gate-to-Source Voltage
100
100
I
S D
, R everse Drain C urrent (A )
O P E R A T IO N IN T H IS A R E A L IM ITE D
B Y R
D S (o n)
10
I
D
, D rain Current (A )
10
100µ s
T
J
= 1 50 °C
T
J
= 25 °C
1
1m s
1
10m s
0.1
0.4
0.6
0.8
1.0
V
G S
= 0V
1.2
A
0.1
1
T
A
= 25 °C
T
J
= 15 0°C
S ing le P u lse
10
100
A
1.4
V
S D
, S ourc e-to-D rain V oltage (V )
V
D S
, D rain-to-S ource V oltage (V )
Fig 7.
Typical Source-Drain Diode
Forward Voltage
Fig 8.
Maximum Safe Operating Area
4
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IRFL014N
Q
G
V
DS
V
GS
R
D
10V
V
G
Q
GS
Q
GD
D.U.T.
+
R
G
-
V
DD
10V
Charge
Pulse Width
≤ 1
µs
Duty Factor
≤ 0.1 %
Fig 9a.
Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
Fig 10a.
Switching Time Test Circuit
V
DS
50KΩ
12V
.2µF
.3µF
90%
D.U.T.
V
GS
3mA
+
V
-
DS
10%
V
GS
t
d(on)
I
G
I
D
t
r
t
d(off)
t
f
Current Sampling Resistors
Fig 9b.
Gate Charge Test Circuit
1000
Fig 10b.
Switching Time Waveforms
T herm al R es pon se (Z
thJ A
)
100
D = 0.5 0
0.20
10
0.10
0 .05
0 .02
0 .01
1
N o te s :
1 . D u ty fa c to r D = t
P
D M
t
1
t2
SING L E P U LS E
(T H ER M A L R ES P O NS E)
0.1
0.00001
0.0001
0.001
0.01
0.1
1
1
/t
2
2 . P e a k T J = P D M x Z th J A + T A
A
1000
10
100
t
1
, Re ctan gular Pulse D u ration (se c)
Fig 11.
Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
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