Training

Location:Training / Tools/EDA / Very Large Scale Integrated Circuit Testing (VLSI Testing) / Introduction Test Economics

You can log in to your eeworld account to continue watching：
Introduction Test Economics
Login

Duration：33 minutes and 41 seconds
Date：2021/06/24

Uploader：桂花蒸

Introduction

keywords： test integrated circuit BIST

This course is offered by Prof. James Chien-Mo Li, Lab of Dependable Systems, National Taiwan University.
Lecture notes available on course website http://cc.ee.ntu.edu.tw/~cmli/VLSItes...
This course is based on the teaching materials of late Professor McCluskey, Stanford University

You Might Like

Recommended Posts

How to generate multiple pulses in one clock cycle in vhdl: I use vhdl to write a pulse signal to drive a stepper motor, but I can't figure out how to generate multiple pulses in one cycle. ----------------------------------------------------------------------; 刘123 FPGA/CPLD

How to choose between mobile phone and tablet: Regarding mobile phones and tablets, I have read a lot of Baidu posts and review posts on the Internet. I have analyzed the major brands from the perspectives of CPU, size, screen, battery, software,; led2015 Talking

[Old post in the section] If I see this kind of question, I usually just laugh.: I continue to scan old posts. I seem to have overworked yesterday's post. I haven't typed so many words in a long time. I scanned a lot of posts today, but I didn't find much to say. I don't know if I; 辛昕 Programming Basics

MCU IO port directly drives segment LCD display: The IO port of the microcontroller directly drives the segment LCD display, which is the kind that only displays numbers and symbols. The microcontroller does not drive the LCD. May I ask: 1. What are; 低调55 DIY/Open Source Hardware

I would like to ask how the wince system obtains system resources: How to get the CPU and memory usage of the system? What specific API should I use? Thank you.; saimingking Embedded System

Using dsp28335 to collect a 100k sine signal, low frequencies can be tested perfectly, but high frequencies cannot be tested: I have adjusted the ADC's constant frequency to the highest, and there is no frequency division, single channel acquisition, but the acquired data always has problems. Is there any expert who can give; 风华 Microcontroller MCU

Recommended Content

Hot VideosMore

Hot ArticlesMore

Circuit

可能感兴趣器件

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

About Us Customer Service Contact Information Datasheet Sitemap LatestNews

Room 1530, 15th Floor, Building B, No.18 Zhongguancun Street, Haidian District, Beijing, Postal Code: 100190 China Telephone: 008610 8235 0740

Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函

京公网安备 11010802033920号