This project is used to verify the solution verification board design of the Lichuang Mall current monitoring chip (U1) INA219AIDR-packaged SOIC-8_150mil and (U2) INA219AIDCNR-packaged SOT-23-8 . The module is compatible with two packaging forms, and the pins are all leaded out. The IIC address can be changed according to the connection between H1 and H0. By default, H1 and H0 are disconnected, and the address is 0x8A. The version 51 routine has been attached and can be transplanted to STM32.
The INA219 is a shunt and power monitor with I2C or SMBUS compatible interface. Operating from a single 3V to 5.5V supply, the device monitors shunt voltage drops and bus supply voltages from 0V to 26V. The number of conversions and filtering options are programmable. Programmable calibration values combined with internal multipliers allow direct reading of current values in amperes. Additional multiplication registers allow calculation of power in watts. 1 Features • Sensed bus voltage range: 0V to 26V • Reports current, voltage, and power • 16 programmable addresses • High accuracy: 0.5% (max) over temperature (INA219B) • Filtering options • Calibration register • Small Outline Transistor (SOT) 23-8 and Small Outline Integrated Circuit (SOIC)-8 packages
All reference designs on this site are sourced from major semiconductor manufacturers or collected online for learning and research. The copyright belongs to the semiconductor manufacturer or the original author. If you believe that the reference design of this site infringes upon your relevant rights and interests, please send us a rights notice. As a neutral platform service provider, we will take measures to delete the relevant content in accordance with relevant laws after receiving the relevant notice from the rights holder. Please send relevant notifications to email: bbs_service@eeworld.com.cn.
It is your responsibility to test the circuit yourself and determine its suitability for you. EEWorld will not be liable for direct, indirect, special, incidental, consequential or punitive damages arising from any cause or anything connected to any reference design used.
Supported by EEWorld Datasheet