Operating temperature range is as follows: –40 C to +85 C.
2
Datarates should be limited to adhere to edge of band requirements in accordance with ETSI 300-220
3
Frequency Deviation = (PFD Frequency Mod Deviation )/2
12
.
GFSK Frequency Deviation = (PFD Frequency 2
m)
/2
12
where
m
= Mod Control.
4
The output power is limited by the spurious requirements of ETSI at +55 C. The addition of an output filter (see Applications section) will allow increased output
levels to >10 dBm at both 433 MHz and 868 MHz
5
V
DD
= 3 V, PFD = 4 MHz, PA = 10 dBm
6
V
DD
= 3 V, Loop Filter BW = 100 kHz
7
V
DD
= 3 V, PFD = 4.42368 MHz, PA = 3 dBm
8
V
DD
= 3 V, Loop Filter BW = 100 kHz
9
These spurious levels are based on a maximum output power of +3 dBm for 868 MHz and +10 dBm for 433 MHz. It assumes a PFD frequency of <5 MHz.
Recommended PFD frequencies are 4.42368 MHz (22.1184/5) for 868 MHz, and 4 MHz for 433 MHz operation. Compliance for higher output powers will require
an external filter. See Applications section.
10
Not production tested. Based on characterization.
Specifications subject to change without notice.
REV. 0
–3–
ADF7011
TIMING CHARACTERISTICS
Parameter
t
1
t
2
t
3
t
4
t
5
t
6
Limit at
T
MIN
to T
MAX
(B Version)
10
10
25
25
10
20
(V
DD
= 3 V
10%; VGND = 0 V, T
A
= 25 C, unless otherwise noted.)
Unit
ns min
ns min
ns min
ns min
ns min
ns min
Test Conditions/Comments
DATA to CLOCK Setup Time
DATA to CLOCK Hold Time
CLOCK High Duration
CLOCK Low Duration
CLOCK to LE Setup Time
LE Pulsewidth
Guaranteed by design but not production tested.
Specifications subject to change without notice.
t
3
t
4
CLOCK
t
1
t
2
DATA
DB23 (MSB)
DB22
DB2
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
6
LE
t
5
Figure 1. Timing Diagram
ABSOLUTE MAXIMUM RATINGS
1, 2
(T
A
= 25°C, unless otherwise noted.)
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
This device is a high performance RF integrated circuit with an ESD rating of
<1 kV and is ESD sensitive. Proper precautions should be taken for handling and
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