USB 2.0 Application Software
USB2, SR-USB, DPO4USB, and MDO3USB Datasheet
High-speed USB 2.0
SuperSpeed USB 3.0 (trigger and analysis)
Product description
The Tektronix USB 2.0 compliance test application (Opt. USB2) and
selected Tektronix oscilloscopes provide one-button compliance testing for
USB 2.0 devices as specified by the USB-IF. The USB software automates
the compliance testing and allows engineers to perform the required tests
efficiently and reliably right on their bench.
The Tektronix MDO/MSO/DPO4000 Series oscilloscopes with the
DPO4USB Serial Application Module, MDO3000 Series oscilloscopes with
the MDO3USB Serial Application Module, and MSO/DPO5000,
DPO7000C, and DPO/DSA/MSO70000C/D/DX Series oscilloscopes with
the SR-USB application simplify analysis of USB 2.0 and 3.0 waveforms
when validating and debugging USB-based embedded systems by
providing trigger, decode, and search for low-speed, full-speed, high-speed,
and SuperSpeed USB buses. MDO3USB offers automated decode and
search for low-speed, full-speed, and high-speed USB buses, as well as
triggering on low-speed and full-speed buses. DPO4USB offers automated
trigger, decode, and search for low-speed, full-speed, and high-speed USB
buses, enabling fast and efficient validation and debug.
Tektronix provides comprehensive, integrated tool sets to serve the needs
of engineers designing USB-based embedded systems as well as those
validating the physical-layer compliance of USB 2.0 serial devices to the
USB 2.0 standards.
Key features
USB 2.0 Compliance Testing
Automated Compliance Testing for USB 2.0 Verification
Designed for use with MSO/DPO5000, DPO7000C,
and DPO/DSA/MSO70000C/D/DX Series Oscilloscopes
SR-USB USB Triggering and Analysis
Automated Trigger and Decode for USB 2.0 and 3.0
Designed for use with MSO/DPO5000, DPO7000C,
and DPO/DSA/MSO70000C/D/DX Series Oscilloscopes
DPO4USB USB 2.0 Triggering and Analysis
Automated Trigger, Decode, and Search for USB 2.0
Designed for use with MDO4000, MSO4000, and DPO4000 Series
Oscilloscopes
MDO3USB USB 2.0 Triggering and Analysis
Automated Trigger, Decode, and Search for USB 2.0
Designed for use with MDO3000 Series Oscilloscopes
Applications
Low-speed USB 2.0
Full-speed USB 2.0
www.tektronix.com 1
Datasheet
USB2 – Automated USB 2.0 Physical Layer
compliance testing
USB compliance testing has some unique measurement challenges:
Designers must quickly and accurately perform all compliance tests
recommended by the USB Implementers Forum, Inc. (USB-IF) before
they can use the “certified” USB-IF logo on their packaging
Characterization of these electrical signals includes mask testing and
parametric testing, for low-speed, full-speed, and high-speed hosts,
devices, and hubs
Signal speeds range from 1.5 Mb/s (low-speed) to 480 Mb/s (high-
speed)
The USB2 application software provides automated compliance testing for
USB 2.0 serial bus verification, including:
Fully compliant with USB-IF tests for USB 2.0 compliance testing
Automated eye diagram analysis verifies signal quality against
standard USB-IF eye masks or custom masks
Automated oscilloscope setups for various tests eliminate time-
consuming manual setups
Comprehensive test fixture enables quick setup and signal access for a
wide range of tests
High-speed tests: Signal Quality, Receiver Sensitivity, Chirp, Reset,
Reset from High Speed, Reset from Suspend, Resume, Suspend,
Packet Parameter, and Monotonicity tests
Automatic signal generator control for receiver sensitivity simplifies
testing
Online help fully documents test procedures
User-configurable measurement limits for tolerance testing
USB compliance test results
Measurement Select menu for the Signal Quality test suite
Quick Pass/Fail tests substantiated with results make the USB2 application
the preferred solution for USB 2.0 physical-layer validation. In-depth
analysis is possible with the statistical information about the tests
performed. The user-defined measurement limits and custom mask testing
also help to perform tolerance testing on a design.
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USB 2.0 Application Software -- USB2, SR-USB, DPO4USB, and MDO3USB
The USB-IF High-speed signal quality fixture set (USB2SIGQUAL) provides
the necessary SMA-based connection for performing Eye Diagram and
other signal quality measurements. The USB 2.0 / 3.0 Drop-Droop fixture
(USB2/3_DD) from USB-IF provides sufficient loads for testing voltage drop
and droop levels while testing Host or Hubs (downstream ports supplying
VBUS).
Custom Mask Selection for High Speed Signal Quality
TDSUSBF USB 2.0 test fixture set
USB2SIGQUAL High-speed Signal Quality test fixture set (available from USB-IF)
Custom Mask (red) with standard USB-IF mask (black) as reference
USB2 compliance test fixtures
The Tektronix TDSUSBF test fixture set provides a probing solution for the
Low- and Full-speed Signal Quality, Inrush Current, Drop and Droop,
Receiver Sensitivity, and Impedance Measurement test. The TDSUSBF
test fixture set is ordered separately.
USB-IF Droop-Drop fixture (available from USB-IF)
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Datasheet
SR-USB USB 2.0 and 3.0 triggering and
analysis
Debugging USB-based embedded systems designs provides some
complex measurement and analysis challenges:
Capturing specific USB addresses and data
Displaying the elements of the USB message in an understandable
format, in a variety of formats, for a wide variety of engineers and
technicians
Time-correlating USB messages with analog and digital signals in the
embedded system
Capture long time windows of USB traffic and then find specific events
within the acquired data
The optional SR-USB application software, installed in an MSO/DPO5000,
DPO7000C, or DPO/DSA/MSO70000C/D/DX Series oscilloscope, provides
a robust set of tools for debugging embedded systems with USB 2.0 and
3.0 serial buses, including:
Automated serial triggering and decode for low-speed, full-speed, and
high-speed USB 2.0 signals
Serial triggering and decode for SuperSpeed USB 3.0 signals (8b/10b)
Trigger on all the critical elements of a USB bus such as address, data,
etc.
Decode all the critical elements of each USB message. No more
counting 1s and 0s!
Search through long acquisitions using user-defined criteria to find
specific messages
Event table shows decoded serial bus activity in a tabular, time-
stamped format for quick summary of system activity
Triggering on a specific PID on a USB full-speed bus. A complete set of triggers,
including triggers for specific token (address) and data packet content, ensures you
quickly capture your event of interest.
USB serial triggering
Trigger on packet content such as sync, reset, suspend/resume, token
(address) packets with specific address and endpoint, specific data content,
handshake packets, special packets, and errors.
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USB 2.0 Application Software -- USB2, SR-USB, DPO4USB, and MDO3USB
USB serial decode
The SR-USB application provides a higher-level, combined view of the
individual signals that make up the USB bus, making it easy to identify
where packets begin and end and identify subpacket components such as
sync, PID, data, CRC, errors, etc.
USB 3.0 bus display showing multiple layers simultaneously
Color-coded decoded display of low-speed USB bus, showing Sync, PID, CRC, and Stop
components of the serial signal
Are you wasting time manually decoding the waveform? Tired of having to
visually inspect the waveform to count clocks, determine if each bit is a 1 or
a 0, combine bits into bytes, and determine the hex value? Let the
oscilloscope with the SR-USB application do it for you! Once you've set up
a USB bus, the MSO/DPO5000, DPO7000C, or DPO/DSA/MSO70000C/D/
DX Series will decode each packet on the bus, and display the value in
Hex, Binary, or ASCII in the bus waveform.
USB 2.0 Event table
In addition to seeing decoded packet data on the bus waveform itself, you
can view all captured packets in a tabular view much like you would see in
a software listing. Packets are time stamped and listed consecutively with
columns for each component (Time, PID, Address, Payload, and Errors).
High-speed USB decoded display, automatically displaying bus content in any of several
digital formats
USB decoded Event table showing all packet information with time-stamp information
www.tektronix.com 5
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