Ambient temperature under bias.............................................................................................................-40°C to +125°C
Storage temperature ...............................................................................................................................-65°C to +150°C
Voltage on V
DD
with respect to V
SS
.......................................................................................................... -0.3V to +5.5V
Voltage on all other pins with respect to V
SS
(except V
DD
)............................................................. -0.6V to (V
DD
+ 0.6V)
Total power dissipation.........................................................................................................................................700 mW
Maximum current out of V
SS
pin ...........................................................................................................................150 mA
Maximum current into V
DD
pin ..............................................................................................................................125 mA
Input clamp current, I
IK
(V
I
< 0 or V
I
> V
DD
).......................................................................................................... ±20 mA
Output clamp current, I
OK
(V
O
< 0 or V
O
> V
DD
)...................................................................................................±20 mA
Maximum output current sunk by any output pin ....................................................................................................25 mA
Maximum output current sourced by any output pin ...............................................................................................25 mA
ESD protection on all pins (HBM:MM) ..............................................................................................................4 kV:400V
† Notice:
Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at those or any other conditions above those indicated in the
operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may
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