CD4017BMS, CD4022BMS
Data Sheet
August 1998
File Number 3297
CMOS Counter/Dividers
CD4017BMS - Decade Counter with 10 Decoded Outputs
CD4022BMS - Octal Counter with 8 Decoded Outputs
CD4017BMS and CD4022BMS are 5-stage and 4-stage
Johnson counters having 10 and 8 decoded outputs, respec-
tively. Inputs include a CLOCK, a RESET, and a CLOCK INHIBIT
signal. Schmitt trigger action in the CLOCK input circuit provides
pulse shaping that allows unlimited clock input pulse rise and fall
times.
These counters are advanced one count at the positive clock sig-
nal transition if the CLOCK INHIBIT signal is low. Counter
advancement via the clock line is inhibited when the CLOCK
INHIBIT signal is high. A high RESET signal clears the counter to
its zero count. Use of the Johnson counter configuration permits
high speed operation, 2-input decode gating and spike-free
decoded outputs. Anti-lock gating is provided, thus assuring
proper counter sequence. The decoded output are normally low
and go high only at their respective decoded time slot. Each
decoded output remains high for one full clock cycle. A CARRY-
OUT signal completes one cycle every 10 clock input cycles in
the CD4017BMS or every 8 clock input cycles in the
CD4022BMS and is used to ripple-clock the succeeding device
in a multi-device counting chain.
The CD4017BMS and CD4022BMS series types are supplied in
these 16 lead outline packages
Features
• High Voltage Types (20V Rating)
• Fully Static Operation
• Medium-Speed Operation 10MHz (Typ) at VDD = 10V
• Standardized Symmetrical Output Characteristics
• 100% Tested for Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Meets All Requirements of JEDEC Tentative Standard
Number 13A, “Standard Specifications for Description
of ‘B’ Series CMOS Devices”
Applications
• Decade Counter/Decimal Decode Display (CD4017BMS)
• Binary Counter/Decoder
• Frequency Division
• Counter Control/Timers
• Divide-by-N Counting
• For Further Application Information, See ICAN-6166
“COS/MOS MSI Counter and Register Design and
Applications”
Pinouts
CD4017BMS
TOP VIEW
5 1
1 2
0 3
16 VDD
15 RESET
14 CLOCK
13 CLOCK INHIBIT
12 CARRY OUT
11 9
10 4
9 8
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
*CD4017B Only
*H4W †H4X
*H1F
†H1E
H6W
† CD4022B Only
Functional Diagrams
CD4017BMS
CLOCK
CLOCK INHIBIT
RESET
14
13
15
3
2
4
7
10
1
5
6
9
11
12
“0”
“1”
“2”
“3”
“4”
“5”
“6”
“7”
“8”
“9”
2 4
6 5
7 6
3 7
DECODED
DECIMAL
OUT
NC = NO
CONNECTION
VSS 8
VCC = 16
VSS = 8
CD4022BMS
TOP VIEW
1 1
0 2
16 VDD
15 RESET
14 CLOCK
13 CLOCK INHIBIT
12 CARRY OUT
11 4
10 7
9 NC
CARRY OUT
CD4022BMS
CLOCK
CLOCK INHIBIT
RESET
14
13
15
2
1
3
7
11
4
5
10
12
“0”
“1”
“2”
“3”
“4”
“5”
“6”
“7”
2 3
5 4
DECODED
OUT
6 5
NC 6
3 7
NC = NO
CONNECTION
VSS 8
VCC = 16
VSS = 8
CARRY OUT
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
CD4017BMS, CD4022BMS
Absolute Maximum Ratings
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . . -0.5V to +20V
(Voltage Referenced to VSS Terminals)
Input Voltage Range, All Inputs . . . . . . . . . . . . . -0.5V to VDD +0.5V
DC Input Current, Any One Input.
. . . . . . . . . . . . . . . . . . . . . . . .±10mA
Operating Temperature Range . . . . . . . . . . . . . . . -55
o
C to +125
o
C
Package Types D, F, K, H
Storage Temperature Range (TSTG). . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265
o
C
At Distance 1/16
±
1/32 Inch (1.59mm
±
0.79mm) from case for
10s Maximum
Reliability Information
Thermal Resistance. . . . . . . . . . . . . . . .
θ
ja
θ
jc
o
C/W
o
C/W
Ceramic DIP and FRIT Package . . . .
80
20
Flatpack Package . . . . . . . . . . . . . . . .
70
o
C/W
20
o
C/W
Maximum Package Power Dissipation (PD) at +125
o
C
For TA = -55
o
C to +100
o
C (Package Type D, F, K) . . . . . .500mW
For TA = +100
o
C to +125
o
C (Package Type D, F, K) . . . . . Derate
Linearity at 12mW/
o
C to 200mW
Device Dissipation per Output Transistor. . . . . . . . . . . . . . . .100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+175
o
C
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP A
SUBGROUPS
1
2
VDD = 18V, VIN = VDD or GND
Input Leakage Current
IIL
VIN = VDD or GND
VDD = 20
3
1
2
VDD = 18V
Input Leakage Current
IIH
VIN = VDD or GND
VDD = 20
3
1
2
VDD = 18V
Output Voltage
Output Voltage
Output Current (Sink)
Output Current (Sink)
Output Current (Sink)
Output Current (Source)
Output Current (Source)
Output Current (Source)
Output Current (Source)
N Threshold Voltage
P Threshold Voltage
Functional
VOL15
VOH15
IOL5
IOL10
IOL15
IOH5A
IOH5B
IOH10
IOH15
VNTH
VPTH
F
VDD = 15V, No Load
VDD = 15V, No Load (Note 3)
VDD = 5V, VOUT = 0.4V
VDD = 10V, VOUT = 0.5V
VDD = 15V, VOUT = 1.5V
VDD = 5V, VOUT = 4.6V
VDD = 5V, VOUT = 2.5V
VDD = 10V, VOUT = 9.5V
VDD = 15V, VOUT = 13.5V
VDD = 10V, ISS = -10µA
VSS = 0V, IDD = 10µA
VDD = 2.8V, VIN = VDD or GND
VDD = 20V, VIN = VDD or GND
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Input Voltage Low
(Note 2)
Input Voltage High
(Note 2)
Input Voltage Low
(Note 2)
Input Voltage High
(Note 2)
VIL
VIH
VIL
VIH
VDD = 5V, VOH > 4.5V, VOL < 0.5V
VDD = 5V, VOH > 4.5V, VOL < 0.5V
VDD = 15V, VOH > 13.5V,
VOL < 1.5V
VDD = 15V, VOH > 13.5V,
VOL < 1.5V
3
1, 2, 3
1, 2, 3
1
1
1
1
1
1
1
1
1
7
7
8A
8B
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
LIMITS
TEMPERATURE
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
-
3.5
-
11
1.5
-
4
-
V
V
V
V
MIN
-
-
-
-100
-1000
-100
-
-
-
-
14.95
0.53
1.4
3.5
-
-
-
-
-2.8
0.7
MAX
10
1000
10
-
-
-
100
1000
100
50
-
-
-
-
-0.53
-1.8
-1.4
-3.5
-0.7
2.8
UNITS
µA
µA
µA
nA
nA
nA
nA
nA
nA
mV
V
mA
mA
mA
mA
mA
mA
mA
V
V
V
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
(NOTE 1)
VDD = 20V, VIN = VDD or GND
VOH > VOL <
VDD/2 VDD/2
NOTES: 1. All voltages referenced to device GND, 100% testing being im-
plemented.
2. Go/No Go test with limits applied to inputs
3. For accuracy, voltage is measured differentially to VDD. Limit is
0.050V max.
2
CD4017BMS, CD4022BMS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP A
SUBGROUPS
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
LIMITS
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
-
-
-
-
-
-
-
-
2.5
1.85
MAX
650
878
600
810
530
716
200
270
-
-
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
PARAMETER
Propagation Delay
Clock to Decode Out
Propagation Delay
Clock to Carry Out
Propagation Delay
Reset to Out
Transition Time
SYMBOL
TPHL1
TPLH1
TPHL2
TPLH2
TPHL3
TPLH3
TTHL
TTLH
FCL
CONDITIONS
(Note 1, 2)
VDD = 5V, VIN = VDD or GND
Maximum Clock Input Fre-
quency
NOTES:
1. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
2. -55
o
C and +125
o
C limits guaranteed, 100% testing being implemented.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
VDD = 5V, VIN = VDD or GND
VDD = 10V, VIN = VDD or GND
VDD = 15V, VIN = VDD or GND
Output Voltage
Output Voltage
Output Voltage
Output Voltage
Output Current (Sink)
Output Current (Sink)
Output Current (Sink)
Output Current (Source)
Output Current (Source)
Output Current (Source)
Output Current (Source)
Input Voltage Low
Input Voltage High
VOL
VOL
VOH
VOH
IOL5
IOL10
IOL15
IOH5A
IOH5B
IOH10
IOH15
VIL
VIH
VDD = 5V, No Load
VDD = 10V, No Load
VDD = 5V, No Load
VDD = 10V, No Load
VDD = 5V, VOUT = 0.4V
VDD = 10V, VOUT = 0.5V
VDD = 15V, VOUT = 1.5V
VDD = 5V, VOUT = 4.6V
VDD = 5V, VOUT = 2.5V
VDD = 10V, VOUT = 9.5V
VDD =15V, VOUT = 13.5V
VDD = 10V, VOH > 9V, VOL < 1V
VDD = 10V, VOH > 9V, VOL < 1V
NOTES
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
TEMPERATURE
-55
o
C, +25
o
C
+125
o
C
-55
o
C, +25
o
C
+125
o
C
-55
o
C, +25
o
C
+125
o
C
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
+125
o
C
-55
o
C
+125
o
C
-55
o
C
+125
o
C
-55
o
C
+125
o
C
-55
o
C
+125
o
C
-55
o
C
+125
o
C
-55
o
C
+125
o
C
-55
o
C
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
MIN
-
-
-
-
-
-
-
-
4.95
9.95
0.36
0.64
0.9
1.6
2.4
4.2
-
-
-
-
-
-
-
-
-
7
MAX
5
150
10
300
10
600
50
50
-
-
-
-
-
-
-
-
-0.36
-0.64
-1.15
-2.0
-0.9
-1.6
-2.4
-4.2
3
-
UNITS
µA
µA
µA
µA
µA
µA
mV
mV
V
V
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
V
V
3
CD4017BMS, CD4022BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Propagation Delay Clock
to Decode Out
Propagation Delay Clock
to Carry Out
Propagation Delay Reset
to out
Transition Time
Maximum Clock Input Fre-
quency
Minimum Setup Time
Clock Inhibit to Clock
Setup
Minimum Reset Pulse
Width
SYMBOL
TPHL1
TPLH1
TPHL2
TPLH2
TPHL3
TPLH3
TTHL
TTLH
FCL
TS
CONDITIONS
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 5V
VDD = 10V
VDD = 15V
TW
VDD = 5V
VDD = 10V
VDD = 15V
Minimum Clock Pulse
Width
TW
VDD = 5V
VDD = 10V
VDD = 15V
Input Capacitance
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized on initial
design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
SYMBOL
IDD
VTN
∆VTN
VTP
∆VTP
F
CONDITIONS
VDD = 20V, VIN = VDD or GND
VDD = 10V, ISS = -10µA
VDD = 10V, ISS = -10µA
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL
TPLH
VDD = 5V
1, 2, 3, 4
+25
o
C
NOTES
1, 4
1, 4
1, 4
1, 4
1, 4
1
TEMPERATURE
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
-
-2.8
-
0.2
-
VOH >
VDD/2
-
MAX
25
-0.7
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25
o
C
Limit
UNITS
µA
V
V
V
V
V
CIN
Any Input
NOTES
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2
TEMPERATURE
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
-
-
-
-
-
-
-
-
5.0
5.5
-
-
-
-
-
-
-
-
-
-
MAX
270
170
250
160
230
170
100
80
-
-
230
100
70
260
110
60
200
90
60
7.5
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
pF
ns
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
3. See Table 2 for +25
o
C limit.
4. Read and Record
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25
O
C
PARAMETER
Supply Current - MSI-2
Output Current (Sink)
Output Current (Source)
SYMBOL
IDD
IOL5
IOH5A
±
1.0µA
±
20% x Pre-Test Reading
±
20% x Pre-Test Reading
DELTA LIMIT
4
CD4017BMS, CD4022BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
PDA (Note 1)
Interim Test 3 (Post Burn-In)
PDA (Note 1)
Final Test
Group A
Group B
Subgroup B-5
Subgroup B-6
Group D
MIL-STD-883
METHOD
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
Sample 5005
Sample 5005
Sample 5005
Sample 5005
GROUP A SUBGROUPS
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9, Deltas
1, 7, 9
1, 7, 9, Deltas
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 7, 9
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
Subgroups 1, 2, 3, 9, 10, 11
IDD, IOL5, IOH5A
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
5005
TEST
PRE-IRRAD
1, 7, 9
POST-IRRAD
Table 4
READ AND RECORD
PRE-IRRAD
1, 9
POST-IRRAD
Table 4
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
PART NUMBER CD4017BMS AND CD4002B
Static Burn-In 1
Note 1
Static Burn-In 2
Note 1
Dynamic Burn-
In Note 1
Irradiation
Note 2
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K
±
5%, VDD = 18V
±
0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
±
5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V
±
0.5V
1 - 7, 9 - 12
1 - 7, 9 - 12
-
1 - 7, 9 - 12
8, 13, 15
8, 14
8, 13, 15
8
VDD
14, 16
13, 15, 16
16
13 - 16
9V
±
-0.5V
-
-
1 - 7, 9 - 12
-
50kHz
-
-
14
-
25kHz
-
-
-
-
5
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