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BSM35GD120DN2

Description
Insulated Gate Bipolar Transistor, 50A I(C), 1200V V(BR)CES, N-Channel
CategoryDiscrete semiconductor    The transistor   
File Size124KB,9 Pages
ManufacturerSIEMENS
Websitehttp://www.infineon.com/
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BSM35GD120DN2 Overview

Insulated Gate Bipolar Transistor, 50A I(C), 1200V V(BR)CES, N-Channel

BSM35GD120DN2 Parametric

Parameter NameAttribute value
package instructionFLANGE MOUNT, R-XUFM-T17
Reach Compliance Codeunknown
Shell connectionISOLATED
Maximum collector current (IC)50 A
Collector-emitter maximum voltage1200 V
ConfigurationBRIDGE, 6 ELEMENTS WITH BUILT-IN DIODE
Maximum landing time (tf)75 ns
Gate-emitter maximum voltage20 V
JESD-30 codeR-XUFM-T17
Number of components6
Number of terminals17
Maximum operating temperature150 °C
Package body materialUNSPECIFIED
Package shapeRECTANGULAR
Package formFLANGE MOUNT
Polarity/channel typeN-CHANNEL
Maximum power consumption environment1680 W
Certification statusNot Qualified
Maximum rise time (tr)120 ns
surface mountNO
Terminal formTHROUGH-HOLE
Terminal locationUPPER
Transistor component materialsSILICON
Maximum off time (toff)600 ns
Nominal off time (toff)400 ns
Maximum opening time (tons)120 ns
Nominal on time (ton)60 ns
VCEsat-Max3.2 V
Base Number Matches1
BSM 35 GD 120 DN2
IGBT Power Module
Preliminary data
• Power module
• 3-phase full-bridge
• Including fast free-wheel diodes
• Package with insulated metal base plate
Type
BSM 35 GD 120 DN2
BSM35GD120DN2E3224
Maximum Ratings
Parameter
Collector-emitter voltage
Collector-gate voltage
Symbol
Values
1200
1200
Unit
V
V
CE
I
C
Package
ECONOPACK 2
ECONOPACK 2K
Ordering Code
C67076-A2506-A67
C67070-A2506-A67
1200V 50A
1200V 50A
V
CE
V
CGR
V
GE
I
C
R
GE
= 20 kΩ
Gate-emitter voltage
DC collector current
± 20
A
50
35
T
C
= 25 °C
T
C
= 80 °C
Pulsed collector current,
t
p
= 1 ms
I
Cpuls
100
70
T
C
= 25 °C
T
C
= 80 °C
Power dissipation per IGBT
P
tot
280
W
+ 150
-55 ... + 150
0.44
0.8
2500
16
11
F
55 / 150 / 56
sec
Vac
mm
K/W
°C
T
C
= 25 °C
Chip temperature
Storage temperature
Thermal resistance, chip case
Diode thermal resistance, chip case
Insulation test voltage,
t
= 1min.
Creepage distance
Clearance
DIN humidity category, DIN 40 040
IEC climatic category, DIN IEC 68-1
T
j
T
stg
R
thJC
R
thJCD
V
is
-
-
-
-
Semiconductor Group
1
Jan-09-1997

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