CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of
the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θ
JA
is measured with the component mounted on an evaluation PC board in free air.
TABLE 1. HMA5lO/883 DC ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Guaranteed and 100% Tested
GROUP A
SUBGROUPS
1, 2, 3
TEMPERATURE (
o
C)
-55
≤
T
A
≤
125
-55
≤
T
A
≤
125
-55
≤
T
A
≤
125
-55
≤
T
A
≤
125
-55
≤
T
A
≤
125
-55
≤
T
A
≤
125
-55
≤
T
A
≤
125
PARAMETER
Logical One Input
Voltage
Logical Zero Input
Voltage
Output HIGH Voltage
SYMBOL
V
lH
V
IL
V
OH
V
OL
I
I
I
O
I
CCSB
TEST CONDITIONS
V
CC
= 5.5V
V
CC
= 4.5V
I
OH
= -400µA
V
CC
= 4.5V (Note 2)
I
OL
= +4.0mA
V
CC
= 4.5V (Note 2)
V
lN
= V
CC
or GND
V
OUT
= V
CC
or GND,
V
CC
= 5.5V
V
IN
= V
CC
or GND,
V
CC
= 5.5V,
Outputs Open
f = 1.0MHz, V
IN
= V
CC
or GND V
CC
= 5.5V
(Note 3)
(Note 4)
MIN
2.2
MAX
-
UNITS
V
1, 2, 3
-
0.8
V
1, 2, 3
2.6
-
V
Output LOW Voltage
1, 2, 3
-
0.4
V
µA
µA
µA
Input Leakage Current
Output or I/O Leakage
Current
Standby Power Supply
Current
1, 2, 3
1, 2, 3
-10
-10
+10
+10
1, 2, 3
-
500
Operating Power Supply
Current
I
CCOP
1, 2, 3
-55
≤
T
A
≤
125
-
7.0
mA
Functional Test
NOTES:
FT
7, 8
-55
≤
T
A
≤
125
-
-
2. Interchanging of force and sense conditions is permitted.
3. Operating Supply Current a proportional to frequency, typical rating is 5mA/MHz.
4. Tested as follows: f = 1MHz, V
IH
(clock inputs) = 3.2V, V
lH
(all other inputs) = 2.6V, V
IL
= 0.4V, V
OH
≥
1.5V, and V
OL
≤
1.5V.
TABLE 2. HMA510/883 AC ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Guaranteed and 100% Tested
-55
PARAMETER
Multiply Accumu-
late Time
Input Setup Time
SYMBOL
t
MA
t
S
(NOTE 5)
CONDITIONS
GROUP A
SUBGROUPS
9, 10, 11
TEMPERATURE (
o
C)
-55
≤
T
A
≤
125
-55
≤
T
A
≤
125
-65
-75
MIN MAX MIN MAX MIN MAX UNITS
-
55
-
65
-
75
ns
9, 10, 11
20
-
25
-
25
-
ns
3-13
HMA510/883
TABLE 2. HMA510/883 AC ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)
Device Guaranteed and 100% Tested
-55
PARAMETER
Clock HIGH
Pulse Width
Clock LOW
Pulse Width
Output Delay
Three-State
Enable Time
NOTES:
5. AC Testing as follows: V
CC
= 4.5V and 5.5V. Input levels 0V and 3.0V (0V and 3.2V tor clock inputs). Timing reference levels = 1.5V,
Output load per test load circuit, with V
1
= 2.4V, R
1
= 500Ω and C
L
= 40pF.
6. Transition is measured at 1200mV from steady state voltage, Output loading per test load circuit, with V
[i=s]This post was last edited by jofficer on 2017-4-20 23:08[/i] [url=home.php?mod=space&uid=303079]@littleshrimp[/url] Which platform did the moderator test it on ([url=https://bbs.eeworld.com.cn/th...
It seems that the C compiler of F2812 does not distinguish between char and int and uses a 16-bit storage? ? Isn't this a waste?For example,const unsigned char gImage_background[1000] = {... }I alloca...
I am new to EVC and I have encountered a very strange problem (personally speaking). When I debug the DLL file I want to call on the simulator, the statements written with TRACE macro can be seen in t...
[img]http://images22.51.com/6000/tf_digital/87d285dd879de62385f561622f9df420.jpg[/img] The circuit is drawn by myself, and my personal analysis is as follows. I hope you can correct me if there are an...
Above is the PWM waveform diagram of my control output, where the first and third waveforms are H-bridge control waveforms, the second and fourth waveforms are the output waveforms controlled in conju...
Maximize instrument utilization and reduce
test times
Increasing the throughput of automated test systems can improve efficiency. Using off-the-shelf tools (COTS) such as multicore proc...[Details]
JTAG Technology Introduction
One disadvantage of shrinking technology is that the complexity of testing small devices increases dramatically. When the board area is large, the board is tested...[Details]
introduction
Controller Area Network (CAN) is a bus standard proposed by Bosch of Germany to solve the information communication between automotive electronic control units. With its excel...[Details]
Abstract: By controlling the supply voltage of the radio frequency (RF) power amplifier (PA) in a CDMA/WCDMA cellular phone, the PA efficiency can be improved, heat generation can be reduced, and t...[Details]
introduction
Image compression technology is becoming more and more important in modern life. With the improvement of data processing speed of DSP, a single-chip DSP can achieve good results...[Details]
Capacitive sensing user interfaces are emerging as a practical and innovative alternative to mechanical buttons in mobile phones. While capacitive sensors can be viewed as a drop-in replacement fo...[Details]
Abstract: This paper uses the S3C2410 chip GX development board with ARM920T core as the hardware platform and Windows CE operating system to design an embedded system touch screen interactive func...[Details]
Agilent Technologies Inc. has announced a new Unlicensed Mobile Access/Generic Access Network (UMA/GAN) test capability on 3GSM that is both extremely affordable and easy to use. The industry's fi...[Details]
The main factor causing cost variation in digital display devices today is the display screen. In the design phase, continuously promoting platform-based display design decisions can greatly reduce...[Details]
In today’s body control module (BCM) designs, knowledgeable engineers are moving away from electromechanical relays wherever possible. Their next step is to eliminate fuses. But is eliminating ...[Details]
After more than ten years of technological development and application market cultivation, biometric technology has been applied on a large scale in many application fields. As far as the Chinese m...[Details]
Use physical methods and electronic technology to automatically detect intrusions occurring in the monitored area, generate an alarm signal, and assist on-duty personnel in notifying them of the ar...[Details]
Femtocell base stations are required to meet stringent requirements in terms of interference, compatibility testing between mobile devices and networks (such as ad hoc networks, handovers), and mee...[Details]
As mobile phones and other portable devices have more functions, there are more potential input and output (I/O) channels for electrostatic discharge (ESD) voltage to enter, including keyboards, bu...[Details]
Facing the global financial tsunami, in order to stimulate the economy, the country will invest 2 trillion yuan in railways during the "Eleventh Five-Year Plan". The large-scale construction of rai...[Details]