54ACQ245
•
54ACTQ245 Quiet Series Octal Bidirectional Transceiver with TRI-STATE
Inputs/Outputs
September 1998
54ACQ245
•
54ACTQ245
Quiet Series Octal Bidirectional Transceiver with
TRI-STATE
®
Inputs/Outputs
General Description
The ’ACQ/’ACTQ245 contains eight non-inverting bidirec-
tional buffers with TRI-STATE outputs and is intended for
bus-oriented applications. Current sinking capability is
24 mA at both the A and B ports. The Transmit/Receive (T/R)
input determines the direction of data flow through the bidi-
rectional transceiver. Transmit (active-HIGH) enables data
from A ports to B ports; Receive (active-LOW) enables data
from B ports to A ports. The Output Enable input, when
HIGH, disables both A and B ports by placing them in a HIGH
Z condition.
The ’ACQ/’ACTQ utilizes NSC Quiet Series technology to
guarantee quiet output switching and improve dynamic
threshold performance. FACT Quiet Series
™
features
GTO
™
output control and undershoot corrector in addition to
a split ground bus for superior performance.
Features
n
I
CC
and I
OZ
reduced by 50%
n
Guaranteed simultaneous switching noise level and
dynamic threshold performance
n
Improved latch-up immunity
n
TRI-STATE outputs drive bus lines or buffer memory
address registers
n
Outputs source/sink 24 mA
n
Faster prop delays than the standard ’ACT245
n
4 kV minimum ESD immunity (’ACQ)
n
Standard Military Drawing (SMD)
— ’ACTQ245: 5962-92187
— ’ACQ245: 5962-92177
Logic Symbols
IEEE/IEC
DS100237-1
DS100237-2
Pin
Names
OE
T/R
A
0
–A
7
B
0
–B
7
Output Enable Input
Description
Transmit/Receive Input
Side A TRI-STATE Inputs or TRI-STATE Outputs
Side B TRI-STATE Inputs or TRI-STATE Outputs
GTO
™
is a trademark of National Semiconductor Corporation.
TRI-STATE
®
is a registered trademark of National Semiconductor Corporation.
FACT
®
is a registered trademark of Fairchild Semiconductor Corporation.
FACT Quiet Series
™
is a trademark of Fairchild Semiconductor Corporation.
© 1998 National Semiconductor Corporation
DS100237
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Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
CC
)
DC Input Diode Current (I
IK
)
V
I
= −0.5V
V
I
= V
CC
+ 0.5V
DC Input Voltage (V
I
)
DC Output Diode Current (I
OK
)
V
O
= −0.5V
V
O
= V
CC
+ 0.5V
DC Output Voltage (V
O
)
DC Output Source
or Sink Current (I
O
)
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
)
Storage Temperature (T
STG
)
DC Latch-Up Source or
Sink Current
Junction Temperature (T
J
)
CDIP
−0.5V to +7.0V
−20 mA
+20 mA
−0.5V to V
CC
+ 0.5V
−20 mA
+20 mA
−0.5V to V
CC
+ 0.5V
Recommended Operating
Conditions
Supply Voltage (V
CC
)
’ACQ
’ACTQ
Input Voltage (V
I
)
Output Voltage (V
O
)
Operating Temperature (T
A
)
54ACQ/ACTQ
Minimum Input Edge Rate
∆V/∆t
’ACQ Devices
V
IN
from 30% to 70% of V
CC
V
CC
@
3.0V, 4.5V, 5.5V
Minimum Input Edge Rate
∆V/∆t
’ACTQ Devices
V
IN
from 0.8V to 2.0V
V
CC
@
4.5V, 5.5V
2.0V to 6.0V
4.5V to 5.5V
0V to V
CC
0V to V
CC
−55˚C to +125˚C
125 mV/ ns
±
50 mA
±
50 mA
−65˚C to +150˚C
125 mV/ns
±
300 mA
175˚C
Note 1:
Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT
®
circuits outside databook specifications.
DC Characteristics for ’ACQ Family Devices
Symbol
Parameter
V
CC
(V)
V
IH
Minimum High
Level Input
Voltage
V
IL
Maximum Low
Level Input
Voltage
V
OH
Minimum High
Level Output
Voltage
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
54ACQ
T
A
=
−55˚C to +125˚C
Guaranteed Limits
2.1
3.15
3.85
0.9
1.35
1.65
2.9
4.4
5.4
(Note 2)
V
IN
= V
IL
or V
IH
3.0
4.5
5.5
V
OL
Maximum Low
Level Output
Voltage
3.0
4.5
5.5
2.4
3.7
4.7
0.1
0.1
0.1
(Note 2)
V
IN
= V
IL
or V
IH
3.0
4.5
5.5
I
IN
Maximum Input
Leakage Current
5.5
0.50
0.50
0.50
V
µA
I
OL
12 mA
24 mA
24 mA
V
I
= V
CC
, GND
(Note 4)
V
V
I
OH
−12 mA
−24 mA
−24 mA
I
OUT
= 50 µA
V
I
OUT
= −50 µA
V
V
OUT
= 0.1V
or V
CC
− 0.1V
V
V
OUT
= 0.1V
or V
CC
− 0.1V
Units
Conditions
±
1.0
3
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DC Characteristics for ’ACQ Family Devices
Symbol
Parameter
V
CC
(V)
I
OLD
I
OHD
I
CC
I
OZT
(Note 3) Minimum
Dynamic Output
Current
Maximum Quiescent
Supply Current
Maximum I/O
Leakage Current
V
OLP
Quiet Output
Maximum Dynamic
V
OL
V
OLV
Quiet Output
Minimum Dynamic
V
OL
Note 2:
All outputs loaded; thresholds on input associated with output under test.
Note 3:
Maximum test duration 2.0 ms, one output loaded at a time.
(Continued)
54ACQ
T
A
=
−55˚C to +125˚C
Guaranteed Limits
50
−50
80.0
Units
Conditions
5.5
5.5
5.5
mA
mA
µA
V
OLD
= 1.65V Max
V
OHD
= 3.85V Min
V
IN
= V
CC
or GND (Note 4)
V
I
(OE) = V
IL
, V
IH
5.5
5.0
±
5.5
1.5
µA
V
V
I
= V
CC
, GND
V
O
= V
CC
, GND
(Note 5)
5.0
−1.2
V
(Note 5)
Note 4:
I
IN
and I
CC
@
3.0V are guaranteed to be less than or equal to the respective limit
@
5.5V V
CC
.
Note 5:
Max number of outputs defined as (n). Data Inputs are driven 0V to 5V; one output
@
GND.
DC Characteristics for ’ACTQ Family Devices
Symbol
Parameter
V
CC
(V)
V
IH
V
IL
V
OH
Minimum High Level
Input Voltage
Maximum Low Level
Input Voltage
Minimum High Level
Output Voltage
4.5
5.5
4.5
5.5
4.5
5.5
54ACTQ
T
A
=
−55˚C to +125˚C
Guaranteed Limits
2.0
2.0
0.8
0.8
4.4
5.4
(Note 6)
V
IN
= V
IL
or V
IH
4.5
5.5
V
OL
Maximum Low Level
Output Voltage
4.5
5.5
3.70
4.70
0.1
0.1
(Note 6)
V
IN
= V
IL
or V
IH
4.5
5.5
I
IN
I
OZT
Maximum Input
Leakage Current
Maximum TRI-STATE
Leakage Current
5.5
5.5
0.50
0.50
V
µA
µA
I
OL
24 mA
24 mA
V
I
= V
CC
, GND
V
I
= V
IL
, V
IH
V
O
= V
CC
, GND
V
V
I
OH
−24 mA
−24 mA
I
OUT
= 50 µA
V
V
V
V
OUT
= 0.1V
or V
CC
− 0.1V
V
OUT
= 0.1V
or V
CC
− 0.1V
I
OUT
= −50 µA
Units
Conditions
±
1.0
±
5.0
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4
DC Characteristics for ’ACTQ Family Devices
Symbol
Parameter
V
CC
(V)
I
CCT
I
OLD
I
OHD
I
CC
V
OLP
Maximum
I
CC
/Input
(Note 7) Minimum
Dynamic Output
Current
Maximum Quiescent
Supply Current
Quiet Output
Maximum Dynamic
V
OL
V
OLV
Quiet Output
Minimum Dynamic
V
OL
Note 6:
All outputs loaded; thresholds on input associated with output under test.
Note 7:
Maximum test duration 2.0 ms, one output loaded at a time.
(Continued)
54ACTQ
T
A
=
−55˚C to +125˚C
Guaranteed Limits
1.6
50
−50
80.0
1.65
Units
Conditions
5.5
5.5
5.5
5.5
5.0
mA
mA
mA
µA
V
V
I
= V
CC
− 2.1V
V
OLD
= 1.65V Max
V
OHD
= 3.85V Min
V
IN
= V
CC
or GND
(Note 8)
5.0
−1.2
V
(Note 8)
Note 8:
Max number of outputs defined as (n). n−1 Data Inputs are driven 0V to 3V; one output
@
GND.
AC Electrical Characteristics for ’ACQ Devices
V
CC
Symbol
Parameter
(V)
(Note 9)
Min
t
PHL
, t
PLH
t
PZL
, t
PZH
t
PHZ
, t
PLZ
Propagation Delay
Data to Output
Output Enable Time
Output Disable Time
3.0
4.5
3.0
4.5
3.0
4.5
Note 9:
Voltage Range 5.0 is 5.0V
±
0.5V
Voltage Range 3.3 is 3.3V
±
0.3V
54ACQ
T
A
= −55˚C
to +125˚C
C
L
= 50 pF
Max
11.5
10.0
13.0
10.0
13.0
10.0
ns
ns
ns
1.5
1.5
1.5
1.5
1.5
1.5
Units
Fig.
No.
5
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