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238A790-117T

Description
EEPROM, 32KX8, 100ns, Parallel, CMOS, CDFP28, 0.500 X 0.720 INCH, CERAMIC, DFP-28
Categorystorage    storage   
File Size278KB,12 Pages
ManufacturerBAE Systems
Download Datasheet Parametric Compare View All

238A790-117T Overview

EEPROM, 32KX8, 100ns, Parallel, CMOS, CDFP28, 0.500 X 0.720 INCH, CERAMIC, DFP-28

238A790-117T Parametric

Parameter NameAttribute value
Parts packaging codeDFP
package instructionDFP,
Contacts28
Reach Compliance Codeunknown
ECCN code3A001.A.2.C
Maximum access time100 ns
JESD-30 codeR-CDFP-F28
memory density262144 bit
Memory IC TypeEEPROM
memory width8
Number of functions1
Number of terminals28
word count32768 words
character code32000
Operating modeASYNCHRONOUS
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
organize32KX8
Package body materialCERAMIC, METAL-SEALED COFIRED
encapsulated codeDFP
Package shapeRECTANGULAR
Package formFLATPACK
Parallel/SerialPARALLEL
Programming voltage3 V
Certification statusNot Qualified
Maximum seat height2.8956 mm
Maximum supply voltage (Vsup)3.46 V
Minimum supply voltage (Vsup)3.14 V
Nominal supply voltage (Vsup)3.3 V
surface mountYES
technologyCMOS
Temperature levelMILITARY
Terminal formFLAT
Terminal pitch1.27 mm
Terminal locationDUAL
width12.7 mm
Base Number Matches1
32K x 8
Radiation Hardened Programmable
Read Only Memory (PROM) – 3.3V
Features
238A790
Product Description
Other
• Read/Write Cycle Times
≤100
ns (-55 °C to 125°C)
• SMD Number Pending
• Asynchronous Operation
• TTL Compatible I/O
• Single 3.3 V ±5% Power Supply
• Low Operating Power
• Packaging Options
• 28-Lead Flat Pack (0.500” x 0.720”)
Radiation
• Fabricated with Bulk CMOS 0.8 µm Process
• Total Dose Hardness through 2x10
5
rad(Si)
• Neutron Hardness through 1x10
12
N/cm
2
• SEU Immune (No Latches)
• Latchup Free
General Description
The 32K x 8 radiation hardened PROM is
pinout, function and package compatible with
commercial 28C256 series 32K x 8 EEPROMs,
such as SEEQ 28C256 and Atmel AT28C256.
The PROM is fabricated with BAE SYSTEMS’
QML-qualified radiation hardened technology,
and is designed for use in systems operating in
radiation environments.
The radiation hardened
Oxide-Nitride-Oxide (ONO) anti-fuse technology
features 0.8 micron, 5 V transistors in the data
path, and 1.0 micron, high voltage N and PFETs
in the programming path circuitry. The PROM
operates over the full military temperature
range, requires a single 3.3 V ± 5% power
supply, and is available with TTL compatible
I/O. Power consumption is typically 15
mW/MHz in operation and is less than 10
mW/MHz in the low power disabled mode. The
PROM operation is fully asynchronous, with an
associated typical access time of 100
nanoseconds. Synchronous operation is also
possible using CE as a clock.
BAE SYSTEMS’ enhanced bulk CMOS
technology is radiation hardened through the
use of advanced and proprietary design, layout,
and process hardening techniques.
BAE SYSTEMS • 9300 Wellington Road • Manassas, Virginia 20110-4122

238A790-117T Related Products

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Description EEPROM, 32KX8, 100ns, Parallel, CMOS, CDFP28, 0.500 X 0.720 INCH, CERAMIC, DFP-28 EEPROM, 32KX8, 100ns, Parallel, CMOS, CDFP28, 0.500 X 0.720 INCH, CERAMIC, DFP-28 EEPROM, 32KX8, 100ns, Parallel, CMOS, CDFP28, 0.500 X 0.720 INCH, CERAMIC, DFP-28 EEPROM, 32KX8, 100ns, Parallel, CMOS, CDFP28, 0.500 X 0.720 INCH, CERAMIC, DFP-28 EEPROM, 32KX8, 100ns, Parallel, CMOS, CDFP28, 0.500 X 0.720 INCH, CERAMIC, DFP-28
Parts packaging code DFP DFP DFP DFP DFP
package instruction DFP, DFP, DFP, DFP, DFP,
Contacts 28 28 28 28 28
Reach Compliance Code unknown unknown unknown unknown unknown
ECCN code 3A001.A.2.C 3A001.A.2.C 3A001.A.2.C 3A001.A.2.C 3A001.A.2.C
Maximum access time 100 ns 100 ns 100 ns 100 ns 100 ns
JESD-30 code R-CDFP-F28 R-CDFP-F28 R-CDFP-F28 R-CDFP-F28 R-CDFP-F28
memory density 262144 bit 262144 bit 262144 bit 262144 bit 262144 bit
Memory IC Type EEPROM EEPROM EEPROM EEPROM EEPROM
memory width 8 8 8 8 8
Number of functions 1 1 1 1 1
Number of terminals 28 28 28 28 28
word count 32768 words 32768 words 32768 words 32768 words 32768 words
character code 32000 32000 32000 32000 32000
Operating mode ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS
Maximum operating temperature 125 °C 125 °C 125 °C 125 °C 125 °C
Minimum operating temperature -55 °C -55 °C -55 °C -55 °C -55 °C
organize 32KX8 32KX8 32KX8 32KX8 32KX8
Package body material CERAMIC, METAL-SEALED COFIRED CERAMIC, METAL-SEALED COFIRED CERAMIC, METAL-SEALED COFIRED CERAMIC, METAL-SEALED COFIRED CERAMIC, METAL-SEALED COFIRED
encapsulated code DFP DFP DFP DFP DFP
Package shape RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR
Package form FLATPACK FLATPACK FLATPACK FLATPACK FLATPACK
Parallel/Serial PARALLEL PARALLEL PARALLEL PARALLEL PARALLEL
Programming voltage 3 V 3 V 3 V 3 V 3 V
Certification status Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified
Maximum seat height 2.8956 mm 2.8956 mm 2.8956 mm 2.8956 mm 2.8956 mm
Maximum supply voltage (Vsup) 3.46 V 3.46 V 3.46 V 3.46 V 3.46 V
Minimum supply voltage (Vsup) 3.14 V 3.14 V 3.14 V 3.14 V 3.14 V
Nominal supply voltage (Vsup) 3.3 V 3.3 V 3.3 V 3.3 V 3.3 V
surface mount YES YES YES YES YES
technology CMOS CMOS CMOS CMOS CMOS
Temperature level MILITARY MILITARY MILITARY MILITARY MILITARY
Terminal form FLAT FLAT FLAT FLAT FLAT
Terminal pitch 1.27 mm 1.27 mm 1.27 mm 1.27 mm 1.27 mm
Terminal location DUAL DUAL DUAL DUAL DUAL
width 12.7 mm 12.7 mm 12.7 mm 12.7 mm 12.7 mm
Base Number Matches 1 1 1 1 1
Filter level - MIL-PRF-38535 Class Q MIL-PRF-38535 Class Q MIL-PRF-38535 Class V -
total dose - 200k Rad(Si) V 200k Rad(Si) V 200k Rad(Si) V -
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