. Data lines. Used as input or output lines depending on operation
WE.
When selected LOW, a WRITE is conducted. When selected HIGH, a READ is
conducted
CE.
When LOW, selects the chip. When HIGH, deselects the chip
OE.
Output Enable. Controls the direction of the I/O pins. When LOW, the I/O pins
behave as outputs. When deasserted HIGH, I/O pins are tristated, and act as input
data pins
GND.
Ground for the device
V
CC
. Power supply for the device
14
28
Ground
Power Supply
Note
1. Typical specifications are the mean values measured over a large sample size across normal production process variations and are taken at nominal conditions
(T
A
= 25 °C, V
CC
). Parameters are guaranteed by design and characterization, and not 100% tested.
Document Number: 001-06511 Rev. *E
Page 3 of 16
CY62256N
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage temperature ................................ –65
°C
to +150
°C
Ambient temperature with
power applied ........................................... –55
°C
to +125
°C
Supply voltage to ground potential
(pin 28 to pin 14)...........................................–0.5 V to +7.0 V
DC voltage applied to outputs
in high Z State
[2]
.................................. –0.5 V to V
CC
+ 0.5 V
DC input voltage
[2]
............................... –0.5 V to V
CC
+ 0.5 V
Output current into outputs (LOW) .............................. 20 mA
Static discharge voltage.......................................... > 2001 V
(per MIL-STD-883, method 3015)
Latch-up current .................................................... > 200 mA
Operating Range
Range
Commercial
Industrial
Automotive-A
Automotive-E
Ambient Temperature (T
A
)
[3]
0
°
C to +70
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–40
°
C to +125
°
C
V
CC
5 V
±
10%
5 V
±
10%
5 V
±
10%
5 V
±
10%
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
CC
Description
Output HIGH voltage
Output LOW voltage
Input HIGH voltage
Input LOW voltage
Input leakage current
V
CC
operating supply
current
GND
≤
V
I
≤
V
CC
V
CC
= Max,
I
OUT
= 0 mA,
f = f
MAX
= 1/t
RC
LL-Commercial
LL - Industrial
LL - Automotive-A
LL - Automotive-E
I
SB1
Automatic CE
power-down current—
TTL inputs
Max. V
CC
, CE
≥
V
IH
, LL-Commercial
V
IN
≥
V
IH
or V
IN
≤
V
IL
, LL - Industrial
f = f
MAX
LL - Automotive-A
LL - Automotive-E
I
SB2
Automatic CE
power-down current—
CMOS inputs
Max. V
CC
,
LL - Commercial
CE
≥
V
CC
−
0.3 V
LL - Industrial
V
IN
≥
V
CC
−
0.3 V, or
LL - Automotive-A
V
IN
≤
0.3 V, f = 0
LL - Automotive-E
Output leakage current GND
≤
V
O
≤
V
CC
, output disabled
Test Conditions
V
CC
= Min, I
OH
=
−1.0
mA
V
CC
= Min, I
OL
= 2.1 mA
–55
Min
2.4
–
2.2
–0.5
–0.5
–0.5
–
–
–
–
–
–
–
–
–
–
–
–
Typ
[4]
–
–
–
–
–
–
–
25
25
25
–
0.3
0.3
0.3
–
0.1
0.1
0.1
Max
–
0.4
V
CC
+
0.5 V
0.8
+0.5
+0.5
–
50
50
50
–
0.5
0.5
0.5
–
10
10
15
Min
2.4
–
2.2
–0.5
–0.5
–0.5
–
–
–
–
–
–
–
–
–
–
–
–
–70
Typ
[4]
–
–
–
–
–
–
25
25
25
–
0.3
0.3
0.3
–
0.1
0.1
0.1
–
Max
–
0.4
V
CC
+
0.5 V
0.8
+0.5
+0.5
50
50
50
–
0.5
0.5
0.5
–
5
10
10
–
Unit
V
V
V
V
μA
μA
mA
mA
mA
mA
mA
mA
mA
mA
μA
μA
μA
μA
Capacitance
Parameter
[5]
C
IN
C
OUT
Description
Input capacitance
Output capacitance
Test Conditions
T
A
= 25
°C,
f = 1 MHz, V
CC
= 5.0 V
Max
6
8
Unit
pF
pF
Notes
2. V
IL
(min) =
−
2.0 V for pulse durations of less than 20 ns.
3. T
A
is the “Instant-On” case temperature.
4. Typical specifications are the mean values measured over a large sample size across normal production process variations and are taken at nominal conditions
(T
A
= 25 °C, V
CC
). Parameters are guaranteed by design and characterization, and not 100% tested.
5. Tested initially and after any design or process changes that may affect these parameters.
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Microcontroller MCU
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