AEDR-8400-140 and AEDR-8400-142
Reflective Surface Mount Optical Encoder
Reliability Data Sheet
Description
The following cumulative test results have been obtained
from testing performed at Avago Technologies Malaysia
in accordance with the latest revisions of JEDEC Standard.
Avago tests parts at the absolute maximum rated condi-
tions recommended for the device. The actual perfor-
mance you obtain from Avago parts depends on the
electrical and environmental characteristics of your appli-
cation but will probably be better than the performance
outlined in Table 1.
Failure Rate Prediction
The failure rate of semiconductor devices is determined
by the junction temperature of the device. The relation-
ship between ambient given by the following:
T
J
(°C) = T
A
(°C) +
q
JA
P
AVG
Where,
T
A
= ambient temperature in
°C
q
JA
= thermal resistance of junction-to-ambient in
°C/
Watt
P
AVG
= average power dissipated in Watt
The estimated MTTF and failure rate at temperatures
lower than the actual stress temperature can be deter-
mined by using an Arrhenius model for temperature
acceleration. Results of such calculations are shown in
the table below using an activation energy of 0.43eV
(reference MIL-HDBK-217).
Table 1. Life Tests
Demonstrated Performance
Point Typical Performance
Test Name
High Temperature
Operating Life
Stress Test
Conditions
V
CC
=3.0V, T
A
=85°C,
1500hours
Total Device
Hours
45,000
Units
Tested
30
Total
Failed
0
MTTF
49,180
Failure Rate
(% /1 K Hours)
2.03
Table 2.
Ambient
Temperature
(°C)
85
75
65
55
45
35
25
Junction
Temperature
(°C)
89.7
79.7
69.7
59.7
49.7
39.7
29.7
Point Typical Performance
[1]
in Time
MTTF
[1]
49,180
72,640
109,800
170,000
270,700
443,800
751,900
Failure Rate
(% / 1K Hours)
2.03
1.38
0.91
0.59
0.37
0.23
0.13
Performance in Time
[2]
(90% Confidence)
MTTF
[2]
19,520
28,840
43,580
67,500
107,400
176,200
298,500
Failure Rate
(% /1K Hours)
5.12
3.47
2.29
1.48
0.93
0.57
0.34
Notes:
1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero
failures, one failure is assumed for this calculation.
2. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence
interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is
commonly used in describing useful life failures.
3. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures
are failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors.
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
The point failure rate per year (8760 hours) at 55°C ambient temperature is:
(0.59% / 1K hours) x 0.25 X (8760 hours/year) = 1.29% per year
Similarly, 90% confidence level failure rate per year at 55°C:
(1.48% / 1K hours) X 0.25 X (8760 hours/year) = 3.24% per year
Table 3. Environmental Tests
Test Name
Temperature Cycle
Wet High Temperature Storage life
Test Conditions
-40°C to 85°C, 15min dwell time, 5 min transfer, 1000 cycles
T
A
=85°C, RH=85%, 1000 hours
Units Tested
30
30
Units Failed
0
0
Table 4. Electrical Tests
Test Name
ESD- Human Body Model
ESD- Machine Model
Reference
HBM-JESD22-A114D
MM-JESD22-A115-A
Test Conditions
Up to 4kV applied to all pins versus ground
Up to 300V applied to all pins versus ground
Units Tested
9
9
Units Failed
0
0
Table 5. Mechanical and Vibration shock
Test Name
Mechanical Shock
Vibration Shock
Test Conditions
15,20,30g 11ms,
5 successive shocks in each direction of 3 perpendicular axes of units
15,25,30g 20-2kHz, 10 cycles for ach g level.
Units Tested
15
15
Units Failed
Pass
Pass
For product information and a complete list of distributors, please go to our web site:
www.avagotech.com
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Limited in the United States and other countries.
Data subject to change. Copyright © 2007 Avago Technologies Limited. All rights reserved.
AV02-0370EN - April 27, 2007
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