Data Sheet
FEATURES
Tri-axial vibration sensing: ±70
g
range
Wide bandwidth: 14 kHz
Programmable digital filters, low-pass/band-pass options
Data capture function
3-channels, 1024 samples each, 72.9 kSPS sample rate
Capture modes for managing machine life
Manual: early baseline characterization/validation
Automatic: periodic check for midlife performance shifts
Event: end-of-life monitoring for critical conditions
Extended: triple the record length for a single axis
Digital temperature, power supply measurements
Programmable operation and control
Capture mode and sample rate
I/O: data ready, alarm, capture trigger, general-purpose
Four alarm settings with threshold limits
Digitally activated self-test
SPI-compatible serial interface
Serial number and device ID
Single-supply operation: 3.15 V to 3.6 V
Operating temperature range: −40°C to +125°C
15 mm × 15 mm × 15 mm package with flexible connector
Digital Tri-Axial Vibration Sensor
ADIS16223
GENERAL DESCRIPTION
The ADIS16223
iSensor®
is a tri-axial, digital vibration sensor
system that combines industry-leading
iMEMS®
sensing technology
with signal processing, data capture, and a convenient serial
peripheral interface (SPI). The SPI and data buffer structure
provide convenient access to wide bandwidth sensor data. The
22 kHz sensor resonance and 72.9 kSPS sample rate provide a
frequency response that is suitable for machine-health applications.
The programmable digital filter offers low-pass and band-pass
configuration options.
An internal clock drives the data sampling system during a data
capture event, which eliminates the need for an external clock
source. The data capture function has four different modes that
offer several capture trigger options to meet the needs of many
different applications.
The ADIS16223 also offers a digital temperature sensor, digital
power supply measurements, and peak output capture.
APPLICATIONS
B
TRIAXIAL
MEMS
SENSOR
TEMP
SENSOR
Vibration analysis
Shock detection and event capture
Condition monitoring
Machine health
Instrumentation, diagnostics
Safety, shutoff sensing
Security sensing, tamper detection
SO
DIO1 DIO2 RST
INPUT/
OUTPUT
SELF-TEST
ADC
CONTROLLER
CLOCK
FILTER
CAPTURE
BUFFER
FUNCTIONAL BLOCK DIAGRAM
VDD
POWER
MANAGEMENT
ALARMS
GND
O
LE
USER
CONTROL
REGISTERS
SPI
PORT
OUTPUT
DATA
REGISTERS
ADIS16223
Figure 1.
Rev. A
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license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
09098-001
TE
CS
SCLK
DIN
DOUT
The ADIS16223 is available in a 15 mm × 15 mm × 15 mm module
with a threaded hole for stud mounting with a 10-32 UNF screw.
The dual-row, 1 mm, 14-pin, flexible connector enables simple
user interface and installation. It has an extended operating
temperature range of −40°C to +125°C.
ADIS16223
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Specifications .................................................................. 4
Absolute Maximum Ratings ............................................................ 5
ESD Caution .................................................................................. 5
Pin Configuration and Function Descriptions ............................. 6
Theory of Operation ........................................................................ 7
Sensing Element ........................................................................... 7
Data Sampling and Processing ................................................... 7
User Interface ................................................................................ 7
Basic Operation................................................................................. 8
SPI Write Commands .................................................................. 8
Data Sheet
Event Mode ................................................................................. 12
Extended Mode........................................................................... 12
Power-Down Control ................................................................ 12
Automatic Flash Back-Up Control .......................................... 12
Capture Times............................................................................. 12
Alarms .............................................................................................. 13
System Tools .................................................................................... 14
Global Commands ..................................................................... 14
Self-Test ....................................................................................... 15
Device Identification.................................................................. 15
Flash Memory Management ..................................................... 15
Digital Signal Processing ............................................................... 16
Low-Pass Filter............................................................................ 16
Band-Pass Filter .......................................................................... 16
Offset Adjustment ...................................................................... 16
Getting Started ............................................................................ 17
Input/Output Functions ............................................................ 14
SPI Read Commands ................................................................... 8
Data Collection ........................................................................... 10
Reading Data from the Capture Buffer ................................... 10
Output Data Registers................................................................ 10
Capture/Alarm Configuration ...................................................... 11
Manual Mode .............................................................................. 11
Automatic Mode ......................................................................... 11
REVISION HISTORY
B
O
10/2017—Rev. 0 to Rev. A
Change to Alarm Indicator Section ............................................. 14
Change to Self-Test Section ........................................................... 15
Deleted Interface Board Section, Figure 17; Renumbered
Sequentially, and Figure 18............................................................ 17
Added Evaluation Tools Section ................................................... 17
Changes to Ordering Guide .......................................................... 18
SO
LE
Rev. A | Page 2 of 20
Applications Information .............................................................. 17
Evaluation Tools ......................................................................... 17
Ordering Guide .......................................................................... 18
Outline Dimensions ....................................................................... 18
6/2010—Revision 0: Initial Version
TE
Data Sheet
SPECIFICATIONS
T
A
= −40°C to +125°C, VDD = 3.3 V, unless otherwise noted.
Table 1.
Parameter
ACCELEROMETERS
Measurement Range
Sensitivity
Sensitivity Error
Nonlinearity
Cross Axis Sensitivity
Alignment Error
Offset Error
Offset Temperature Coefficient
Output Noise
Output Noise Density
Bandwidth
Test Conditions/Comments
T
A
= 25°C
T
A
= 25°C
T
A
= 25°C
With respect to full scale
With respect to package
T
A
= 25°C
Min
−70
4.768
±5
±0.2
2.6
1.5
−19.1
5
477
3.3
7.75
9.0
13
14.25
22
5243
Typ
ADIS16223
Max
+70
Unit
g
mg/LSB
%
%
%
Degree
g
mg/°C
mg rms
mg/√Hz
kHz
kHz
kHz
kHz
kHz
LSB
V
V
µA
µA
mA
pF
V
V
Cycles
Years
±2
Sensor Resonant Frequency
Self-Test Response
LOGIC INPUTS
1
Input High Voltage, V
INH
Input Low Voltage, V
INL
Logic 1 Input Current, I
INH
Logic 0 Input Current, I
INL
All Except RST
RST
Input Capacitance, C
IN
DIGITAL OUTPUTS
1
Output High Voltage, V
OH
Output Low Voltage, V
OL
FLASH MEMORY
Endurance
2
Data Retention
3
START-UP TIME
4
Initial Startup
Reset Recovery
5
Sleep Mode Recovery
CONVERSION RATE
Clock Accuracy
POWER SUPPLY
Power Supply Current
1
2
LE
Rev. A | Page 3 of 20
T
A
= 25°C, Register AVG_CNT = 0x0000
T
A
= 25°C, 10 Hz to 1 kHz
X/Y axes, ±5% flatness
X/Y axes, ±10% flatness
Z-axis, ±5% flatness
Z-axis, ±10% flatness
TE
3669
2.0
±0.2
−40
−1
10
2.4
10,000
20
179
54
2.5
72.9
3
3.3
43
230
3.15
+19.1
6815
SO
I
SOURCE
= 1.6 mA
I
SINK
= 1.6 mA
T
J
= 85°C
RST pulse low or Register GLOB_CMD[7] = 1
Register AVG_CNT = 0x0000
Operating voltage range, VDD
Capture mode, T
A
= 25°C
Sleep mode, T
A
= 25°C
V
IH
= 3.3 V
V
IL
= 0 V
0.8
±1
−60
0.4
B
3.6
52
ms
ms
ms
kSPS
%
V
mA
µA
The digital I/O signals are 5 V tolerant.
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
3
Retention lifetime equivalent at junction temperature (T
J
) = 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature. See
Figure 15.
4
The start-up times presented do not include the data capture time, which is dependent on the AVG_CNT register settings.
5
The RST pin must be held low for at least 15 ns.
O
ADIS16223
TIMING SPECIFICATIONS
T
A
= 25°C, VDD = 3.3 V, unless otherwise noted.
Table 2.
Parameter
f
SCLK
t
STALL
t
CS
t
DAV
t
DSU
t
DHD
t
SR
t
SF
t
DF
, t
DR
t
SFS
1
Data Sheet
Guaranteed by design, not tested.
Timing Diagrams
CS
t
CS
1
SCLK
2
3
LE
t
SR
t
SF
4
5
6
DB13
DB12
DB11
DB10
DB2
t
DAV
DOUT
MSB
DB14
SO
t
DSU
t
DHD
A6
A5
A4
A3
TE
5
t
SFS
16
15
DB1
LSB
A2
D2
D1
LSB
09098-003
Description
SCLK frequency
Stall period between data, between 16
th
and 17
th
SCLK
Chip select to SCLK edge
DOUT valid after SCLK edge
DIN setup time before SCLK rising edge
DIN hold time after SCLK rising edge
SCLK rise time
SCLK fall time
DOUT rise/fall times
CS high after SCLK edge
Min
1
0.01
15.4
48.8
24.4
48.8
Typ
Max
2.25
100
5
12.5
12.5
12.5
Unit
MHz
µs
ns
ns
ns
ns
ns
ns
ns
ns
DIN
R/W
Figure 2. SPI Timing and Sequence
B
t
STALL
CS
O
SCLK
Figure 3. DIN Bit Sequence
Rev. A | Page 4 of 20
09098-002
Data Sheet
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
Acceleration
Any Axis, Unpowered
Any Axis, Powered
VDD to GND
Digital Input Voltage to GND
Digital Output Voltage to GND
Analog Inputs to GND
Operating Temperature Range
Storage Temperature Range
Rating
2000
g
2000
g
−0.3 V to +6.0 V
−0.3 V to +5.3 V
−0.3 V to VDD + 0.3 V
−0.3 V to +3.6 V
−40°C to +125°C
−65°C to +150°C
ADIS16223
Table 4. Package Characteristics
Package Type
14-Lead Module
θ
JA
31°C/W
θ
JC
11°C/W
Device Weight
6.5 grams
ESD CAUTION
O
Rev. A | Page 5 of 20
B
SO
LE
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
TE