P R O B E S
A N D
P R O B E
A C C E S S O R I E S
D11000PS DIFFERENTIAL PROBE SYSTEM
The D11000PS extends the full signal acquisition performance of the SDA 11000 and
SDA 9000 to the probe tips. With 11 GHz system bandwidth, the probe enables direct
measurement of high-speed serial data streams up to 6.25 Gb/s. The D11000PS also
provides 11 GHz system bandwidth when used with the SDA 18000.
Choice of Interconnect Styles Without Compromising Performance
The D11000PS provides both direct Solder-In and cabled SMA interconnect lead
assemblies. Each interconnect lead comes with a dedicated probe amplifier module
that has calibration data optimized for the respective lead. This eliminates the
performance compromise of using a single calibration for multiple lead types. The
Solder-In lead provides the highest possible signal integrity with a high loading
impedance. The dual SMA interconnect leads provide a true differential 50
Ω
input.
This is a convenient alternative to direct cabling into the oscilloscope inputs, freeing
up the second channel for other signal input, and eliminating the need to set up
waveform math and match cable delays.
PROBES AND PROBE ACCESSORIES
Unsurpassed Waveform Accuracy
When used to acquire input signals for the SDA 11000, SDA 9000, or SDA 18000, the
D11000PS provides unprecedented waveform fidelity, even with signals at higher
serial data rates. The D11000PS utilizes third generation compensation calibration,
the most advanced in use today, to provide optimal system response.
Each individual probe is characterized with this system. Information on the probe’s
frequency and time domain responses are stored in non-volatile memory within
the probe amplifier module. This information is uploaded to the higher bandwidth
SDA’s when the probe is connected. The probe calibration data and the SDA
oscilloscope’s calibration data combine to generate new equalization filters for
the composite system. The resulting compensation system corrects for frequency
response deviations, as well as group delay correction and reflection cancellation.
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A C C E S S O R I E S
D11000PS DIFFERENTIAL PROBE SYSTEM
Reproducing accurate serial data eye patterns requires maintaining precise magnitude
and phase relationships between the fundamental and the odd harmonics. The advanced
calibration system used in the D11000PS assures the best eye pattern fidelity.
Superior Probe Loading Characteristics
Accurate frequency response is not enough to assure good waveform fidelity.
Excessive probe loading can cause waveform distortion. The D11000PS continues
the legacy of LeCroy high-performance probe design, placing special emphasis on
minimizing loading of the circuit under test.
The Solder-In lead and dedicated probe amplifier module have a high input resistance
at DC and low frequencies, allowing the probe to be used in circuits which cannot
drive the low resistance of a pure transmission line probe. The direct cabled SMA
inputs have 50
Ω
input impedance with low VSWR.
Ease of Use
Attention to fine details during the D11000PS design process has resulted in several
“ease of use” features. A common mode measure feature allows the user to measure
the average common mode component with a single click in the probe control menu.
AutoColor ID lights an indicator in the probe body, matching the color of the waveform
trace. When multiple channels are used, this feature instantly identifies which wave-
form corresponds to which probe.
Several connection accessories designed specifically for the D11000PS provide
convenient and secure mounting of the probe body and Solder-In tip to the test circuit.
DC blocking adapters extend the common mode range of the SMA cabled input for
use with higher common mode voltages such as Digital Video Interface (DVI). A finger
wrench allows tightening of SMA connectors on dense test fixtures.
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P R O B E S
A N D
P R O B E
A C C E S S O R I E S
D11000PS DIFFERENTIAL PROBE SYSTEM
Compatibility
The D11000PS is designed specifically for use with the SDA 11000, SDA 9000, or
SDA 18000. However, it does contain additional calibration data for use with all
of the lower bandwidth WaveMaster, SDA, and DDA 5005A Series oscilloscopes
and analyzers.
SPECIFICATIONS
Bandwidth, System, -3 dB
Rise Time, System
Rise Time, Probe only
Attenuation, Nominal
LF Attenuation Accuracy
Output Zero
Noise, System
Differential Mode Range
Common Mode Range
Input Resistance at DC,
(Solder-In lead)
Minimum Input Impedance,
(Solder-In lead, to 11 GHz)
Input Impedance, (SMA cable input)
Input VSWR,
(Typical, each lead to ground)
CMRR,
(Typical)
* Measured as a system with SDA 11000, SDA 9000 and SDA 18000.
† Can be extended by using DC Blocking Adapters.
11 GHz (Typical)*
< 50 ps (Typical)*
< 40 ps
÷3
2% (20–30 ˚C)
< 15 mV referred to input
5 mV rms (Typical)
1
±1 V
±4 V, Solder-In tip
±2 V, SMA cable input
†
40 kΩ differential
20 kΩ each side to ground
> 175
Ω
(Refer to graph)
50
Ω
< 1.5:1 DC–6 GHz
< 2.0:1 6 GHz–11 GHz
> 40 dB DC–1 GHz
> 30 dB 1 GHz–4 GHz
> 20 dB 4 GHz–11 GHz
PROBES AND PROBE ACCESSORIES
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D11000PS DIFFERENTIAL PROBE SYSTEM
D11000PS Includes:
Probe amplifier modules (2–1 each for SMA input and Solder-In lead), Solder-In lead
assembly (2), SMA interconnect lead, SMA input cables (matched pair), Probe body,
SMA DC blocking adapters (2), ground lead and clip, SMA finger wrench (2), tip
retaining clip kit for Solder-In lead, probe body mounting clamp set, FreeHand probe
stand, ESD dissipating wrist strap, SAC-01 soft accessory case with insert, small
accessory case, D11000PS Instruction Manual, certificate of traceable calibration.
ORDERING INFORMATION
Differential Probe System
Replacement Solder-In Tip Assembly
NIST Traceable Calibration with Test Data
(one module)
PRODUCT CODE
D11000PS
D11000SI
D11000PS-CCNIST
240
1-800-5-LeCroy
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EEWORLD
