Surface Mount Varistors
VE Series High Temperature 150°C
Overview
KEMET's VE series of high temperature, low voltage
varistors are designed to protect sensitive electronic
devices against high voltage surges in the low voltage
region. In addition to superior operating performance at
rated 150°C (AEC–Q200 compliance) they offer excellent
transient energy absorption due to improved energy volume
distribution and power dissipation.
Applications
Typical applications include transient over-voltage
protection in automotive assembly motors and controllers
as well as surge protection of non-automotive electronic
products exposed to over-heating, i.e., consumer,
telecommunication or industrial.
Load dump and jump start protection of 12 to 24 V
supply systems. Protection of integrated circuits and
other components at the circuit board level including the
suppression of inductive switching or other transient events
such as surge voltage. ESD protection for components
sensitive to IEC 1000–4–2, MILSTD 883C Method 3015.7
and other industry spec. Replacement of larger surface
mount TVS Zeners in many applications. Designed to
achieve electromagnetic compliance of end products and
provide on-board transient voltage protection of ICs and
transistors.
Benefits
• Surface mount form factor
• Operating ambient temperature of −55°C to +150°C
• Superior operating performance rated at 150°C
(AEC-Q200 compliance)
• Operating voltage range of 3 V to 170 V
• AC voltage range (Vrms) of 2 V to 130 V
• High resistance to cyclic temperature stress
• Low leakage currents after 1,000 hours rated at 150°C
• High energy absorption capability
• Available case sizes: 0603, 0805, 1206, 1210, 1812, 2220
• Short response time
• Broad range of current and energy handling capabilities
• Low clamping voltage – Uc
• Non-sensitive to mildly activated fluxes
• Barrier type end terminations solderable with Pb-free
solders according to JEDEC J–STD–020C and IEC
60068–2–58
• RoHS 2 2011/65/EC, REACH compliant
• AEC-Q200 qualified Grade 1
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© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
V0003_VE • 2/9/2017
1
SMD Varistors
VE Series – SMD 150°C Low Voltage High Temperature Varistors
Ordering Information
VE
Series
Varistor
SMD High
Temperature 150°C
Low Voltage
Multilayer Chip
0603
Chip
Size Code
0603 = 0603
0805 = 0805
1206 = 1206
1210 = 1210
1812 = 1812
2220 = 2220
M
Tolerances
K = ±10%
L = ±15%
M = ±20%
300
Rated Peak Single Pulse
Transient Current (A)
300 = 30
101 = 100
121 = 120
151 = 150
201 = 200
251 = 250
301 = 300
401 = 400
501 = 500
601 = 600
801 = 800
102 = 1,000
122 = 1,200
(First two digits represent
significant figures. Third digit
specifies number of zeros.)
R
Packaging/
Termination
R = Reel 180 mm/Ni Sn
Barrier Terminations
002
Maximum Continuous
Working Voltage
(Vrms AC)
002 = 2
004 = 4
006 = 6
008 = 8
011 = 11
014 = 14
017 = 17
020 = 20
025 = 25
030 = 30
035 = 35
040 = 40
050 = 50
060 = 60
075 = 75
095 = 95
115 = 115
130 = 130
Dimensions – Millimeters
0.5±0.25
W
t
L
Size Code
0603
0805
1206
1210
1812
2220
L
1.6±0.20
2.0±0.25
3.2±0.30
3.2±0.30
4.7±0.40
5.7±0.50
W
0.80±0.10
1.25±0.20
1.60±0.20
2.50±0.25
3.20±0.30
5.00±0.40
t
max
0.95
0.80
0.85
0.85
1.25
1.25
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
V0003_VE • 2/9/2017
2
SMD Varistors
VE Series – SMD 150°C Low Voltage High Temperature Varistors
Environmental Compliance
RoHS 2 2011/65/EC, REACH
Performance Characteristics
Continuous
Steady State Applied Voltage
DC Voltage Range (V
dc
)
AC Voltage Range (V
rms
)
Transient
Peak Single Pulse Surge Current, 8/20 µs Waveform (I
max
)
Single Pulse Surge Energy, 10/1000 µs Waveform (W
max
)
Operating Ambient Temperature
Storage Temperature Range
Threshold Voltage Temperature Coefficient
Response Time
Climatic Category
A
J
°C
°C
%/°C
ns
30 to 1200
0.1 to 12.2
−55 to +150
−55 to +150
< +0.05
<2
55/150/56
V
V
3 to 170
2 to 130
Units
Value
Qualifications
Reliability Parameter
AC/DC Bias Reliability
Pulse Current Capability
Test
AC/DC Life Test
I
max
8/20 µs
Tested According to
CECC 42200, Test 4.20 or IEC 1051–1, Test 4.20.
AEC–Q200 Test 8 – 1,000 hours at UCT
CECC 42200, Test C 2.1 or IEC 1051–1, Test 4.5.
10 pulses in the same direction at 2 pulses per minute
at maximum peak current for 10 pulses
CECC 42200, Test C 2.1 or IEC 1051–1, Test 4.5. 10
pulses in the same direction at 1 pulses every 2
minutes at maximum peak current for 10 pulses
ISO 7637, Test pulse 5, 10 pulses at rate 1 per minute
Increase of supply voltage to V ≥ V
jump
for 1 minute
Condition to be Satisfied
after Testing
|δ
Vn
(1 mA)| < 10 %
|δ
Vn
(1 mA)| < 10 %
no visible damage
|δ
Vn
(1 mA)| < 10 %
no visible damage
|δ
Vn
(1 mA)| < 15 %
no visible damage
|δ
Vn
(1 mA)| < 15 %
no visible damage
Pulse Energy Capability
WLD Capability
V
jump
Capability
W
max
10/1,000 µs
WLD x 10
V
jump
5 min
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
V0003_VE • 2/9/2017
3
SMD Varistors
VE Series – SMD 150°C Low Voltage High Temperature Varistors
Qualifications cont'd
Reliability Parameter
Test
Tested According to
CECC 42200, Test 4.16 or IEC 1051–1, Test 4.17.
a) Dry heat, 16 hours, UCT, Test Ba, IEC 68–2–2
b) Damp heat, cyclic, the first cycle: 55°C, 93 % RH,
24 hours, Test Db 68–2–4
c) Cold, LCT, 2 hours Test Aa IEC 68–2–1
d) Damp heat cyclic, remaining 5 cycles: 55°C, 93 %
RH, 24 hour/cycle, Test Bd, IEC 68–2–30
CECC 42200, Test 4.12, Test Na, IEC 68–2–14,
AEC–Q200 Test 16, 5 cycles UCT/LCT, 30 minutes
CECC 42200, Test 4.17, Test Ca, IEC 68–2–3,
AEC–Q200 Test 6, 56 days, 40°C, 93% RH. AEC–Q200
Test7: Bias, Rh, T all at 85.
IEC 68–2–2, Test Ba, AEC–Q200 Test 3,
1,000 hours at maximum storage temperature
CECC 42200, Test 4.10.1, Test Ta IEC 68–2–20
solder bath and reflow method
Solderability
Condition to be Satisfied
after Testing
Climatic Sequence
|δ
Vn
(1 mA)| < 10 %
Environmental and
Storage Reliability
Thermal Shock
Steady State Damp Heat
Storage Test
|δ
Vn
(1 mA)| < 10 %
no visible damage
|δ
Vn
(1 mA)| < 10 %
|δ
Vn
(1 mA)| < 5 %
Solderable at shipment
and after 2 year of storage,
criteria > 95% must be
covered by solder for reflow
meniscus
|δ
Vn
(1 mA)| < 5 %
no visual damage
|δ
Vn
(1 mA)| < 2 %
no visible damage
Resistance to Soldering
Heat
Terminal Strength
Board Flex
Mechanical Reliability
CECC 42200, Test 4.10.2, Test Tb, IEC 68–2–20 solder
bath and reflow method
JIS–C–6429, App. 1, 18N for 60 seconds – same for
AEC–Q200 Test 22
JIS–C–6429, App. 2, 2 mm minimum
AEC–Q200 test 21 – Board flex: 2 mm flex minimum
CECC 42200, Test 4.15, Test Fc, IEC 68–2–6, AEC–
Q200 Test 14.
Frequency range 10 to 55 Hz (AEC: 10 – 2,000 Hz)
Amplitude 0.75 m/s2 or 98 m/s2 (AEC: 5 g's for 20
minutes)
Total duration 6 hours (3x2h) (AEC: 12 cycles each of
3 directions)
Waveshape – half sine
CECC 42200, Test 4.14, Test Ea, IEC 68–2–27,
AEC–Q200 Test 13.
Acceleration = 490 m/s2 (AEC: MIL-STD–202–Method
213),
Pulse duration = 11 ms,
Waveshape – half sine; Number of shocks = 3x6
AEC–Q200 Test 30: Test pulses 1 to 3.
Also other pulses – freestyle.
Vibration
|δ
Vn
(1 mA)| < 10 %
no visible damage
Mechanical Shock
|δ
Vn
(1 mA)| < 10 %
no visible damage
Electrical Transient
Conduction
ISO–7637–1 Pulses
|δ
Vn
(1 mA)| < 10 %
no visible damage
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
V0003_VE • 2/9/2017
4
SMD Varistors
VE Series – SMD 150°C Low Voltage High Temperature Varistors
Reliability
In general, reliability is the ability of a component to perform and maintain its functions in routine circumstances, as well as
hostile or unexpected circumstances. The mean life of series components is a function of:
• Factor of Applied Voltage
• Ambient temperature
Mean life is closely related to Failure rate (formula).
Mean life (ML) is the arithmetic mean (average) time to failure of a component.
Failure rate is the frequency with which an engineered system or component fails, expressed for example in failures per
hour. Failure rate is usually time dependent, an intuitive corollary is that the rate changes over time versus the expected
life cycle of a system.
Failure rate formula – calculation
10
9
Λ=
[fit]
ML[h]
10
h
10
7
8
Mean Life on Arrhenius model
Years
1,000
100
FAV
0,7
0,8
0,9
1,0
Mean life (ML)
FAV – Factor of Applied Voltage
Vapl
Λ=
V
max
Vapl = applied voltage
V
max
= maximum operating voltage
10
6
10
5
10
4
10
3
120 100 80
60
40
10
1
°C
T
a
20
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
V0003_VE • 2/9/2017
5
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