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MT3S19R(TE85L)

Description
TRANSISTOR,BJT,NPN,6V V(BR)CEO,80MA I(C),SOT-23VAR
CategoryThe transistor   
File Size162KB,5 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Download Datasheet Parametric View All

MT3S19R(TE85L) Overview

TRANSISTOR,BJT,NPN,6V V(BR)CEO,80MA I(C),SOT-23VAR

MT3S19R(TE85L) Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerToshiba Semiconductor
package instruction,
Reach Compliance Codeunknown
Is SamacsysN
Maximum collector current (IC)0.08 A
ConfigurationSingle
Minimum DC current gain (hFE)100
Maximum operating temperature150 °C
Polarity/channel typeNPN
Maximum power dissipation(Abs)0.32 W
surface mountYES
Nominal transition frequency (fT)11500 MHz
Base Number Matches1
MT3S19R
TOSHIBA Transistor Silicon NPN Epitaxial Planar Type
MT3S19R
VHF-UHF Band Low-Noise, Low-Distortion Amplifier Applications
0.42
-0.05
3
+0.08
Unit: mm
FEATURES
High Gain:|S21e|
2
=13dB(Typ.) (@ f=1GHz)
1.8±0.1
0.05 M A
0.17
-0.07
+0.08
1
2
0.95
0.95
Marking
3
2.9±0.2
2.4±0.1
A
Low Noise Figure:NF=1.5dB(Typ.) (@ f=1GHz)
T6
1
2
1.
2.
3.
Base
Emitter
Collector
Absolute Maximum Ratings
(Ta = 25°C)
Characteristics
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector-current
Base-current
Collector power dissipation
Junction temperature
Storage temperature range
Symbol
V
CBO
V
CEO
V
EBO
I
C
I
B
P
C
(Note1)
T
j
T
stg
Rating
12
6
2
80
10
320
150
−55
to 150
Unit
V
V
V
mA
mA
mW
°C
°C
SOT23F
JEDEC
JEITA
TOSHIBA
Weight: 11 mg (typ.)
Note 1: The device is mounted on a FR4 board (20 mm x 25 mm x 1.55 mm (t))
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2010-08-18
0.8
+0.08
-0.05

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